Semiconductor diode parameter symbols and their meanings
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CT--- Barrier Capacitance Cj--- junction (inter-electrode) capacitance, which indicates the total capacitance of the germanium detector diode under the specified bias voltage at both ends of the diode. Cjv--- Bias junction capacitance Co--- Zero bias capacitor Cjo--- zero bias junction capacitance Cjo/Cjn--- Junction capacitance change Cs--- Case capacitance or package capacitance Ct--- Total capacitance CTV--- voltage temperature coefficient. The ratio of the relative change of the stable voltage to the absolute change of the ambient temperature under the test current. CTC--- Capacitance Temperature Coefficient Cvn--- Nominal capacitance IF--- Forward DC current (forward test current). The current passing through the interelectrode of a germanium detector diode under a specified forward voltage VF ; the maximum operating current (average value) allowed to continuously pass through a silicon rectifier tube or silicon stack in a sinusoidal half-wave under specified conditions of use; the maximum forward DC current allowed to pass through a silicon switching diode at rated power; the current given when measuring the forward electrical parameters of a voltage regulator diode IF ( AV ) --- Forward average current IFM ( IM ) --- Forward peak current (maximum forward current). The maximum forward pulse current allowed to pass through the diode at rated power. Limiting current of light-emitting diodes. IH--- constant current, maintaining current. Ii--- light emitting diode starting current IFRM--- Forward repetitive peak current IFSM--- Forward non-repetitive peak current (surge current) Io--- rectified current. The working current passing through a specific circuit under specified frequency and specified voltage conditions. IF(ov)--- Forward overload current IL--- Photocurrent or current-stabilizing diode limiting current ID--- Dark Current IB2--- Base modulation current in unijunction transistor IEM--- Emitter peak current IEB10--- Reverse current between emitter and first base in double base unijunction transistor IEB20--- Emitter-to-Emitter Current in a Dual-Base Unijunction Transistor ICM--- Maximum output average current IFMP--- Forward Current Pulse IP--- peak current IV--- Valley Current IGT--- thyristor control electrode trigger current IGD--- Thyristor control pole does not trigger current IGFM--- Control electrode forward peak current IR ( AV ) --- Reverse average current IR ( In ) --- Reverse DC current (reverse leakage current). When measuring reverse characteristics, the given reverse current; the current passing through the silicon stack when a reverse voltage of a specified value is applied in a half-sine wave resistive load circuit; the current passing through the two ends of the silicon switching diode when a reverse working voltage VR is applied; the leakage current generated by the Zener diode under reverse voltage; the leakage current of the rectifier tube under the highest reverse working voltage of the half-sine wave. IRM--- Reverse peak current IRR--- Thyristor reverse repetitive average current IDR--- Thyristor off-state average repetitive current IRRM--- Reverse repetitive peak current IRSM--- Reverse non-repetitive peak current (reverse surge current) Irp--- Reverse recovery current Iz--- Stable voltage and current (reverse test current). When testing reverse electrical parameters, the given reverse current Izk--- Zener diode knee current IOM--- Maximum forward (rectified) current. Under specified conditions, the maximum instantaneous forward current that can be sustained; the maximum operating current that is allowed to continuously pass through the germanium detector diode in a half-wave sine rectifier circuit with a resistive load IZSM--- Zener diode surge current IZM--- Maximum voltage regulator current. The current that the voltage regulator diode is allowed to pass under the maximum power dissipation iF--- Total instantaneous forward current iR--- total instantaneous reverse current ir--- reverse recovery current Iop--- operating current Is--- stabilized current of the stabilizing diode f--- frequency n--- capacitance change index; capacitance ratio Q--- Quality Factor δ vz--- Zener voltage drift di/dt--- Critical rate of rise of on-state current dv/dt--- Critical rate of rise of on-state voltage PB--- Pulse burnout power PFT ( AV ) --- Forward conduction average power dissipation PFTM--- Forward peak power dissipation PFT--- Forward conduction total instantaneous power dissipation Pd--- dissipated power PG--- gate average power PGM--- Peak Gate Power PC--- control electrode average power or collector dissipation power Pi--- Input power PK--- Maximum switching power PM--- rated power. The maximum power that a silicon diode can withstand when the junction temperature is not higher than 150 degrees PMP--- Maximum leakage pulse power PMS--- Maximum pulse power Po--- output power PR--- Reverse surge power Ptot--- Total dissipated power Pomax--- maximum output power Psc--- continuous output power PSM--- Non-repetitive surge power PZM--- Maximum dissipated power. Under given operating conditions, the maximum power that the Zener diode is allowed to withstand RF ( r ) --- Forward differential resistance. When the current increases with the voltage exponentially during forward conduction, it shows obvious nonlinear characteristics. Under a certain forward voltage, the voltage increases by a small amount △ V , and the forward current increases by △ I accordingly . Then △ V/ △ I is called differential resistance. RBB--- base resistance of double base transistor RE--- RF resistor RL--- load resistance Rs (rs) ---- series resistance Rth---- Thermal resistance R(th)ja---- Thermal resistance from junction to ambient Rz(ru)--- dynamic resistance R(th)jc--- Thermal resistance from junction to case r δ --- Attenuation resistance r(th)--- transient resistance Ta--- ambient temperature Tc--- shell temperature td--- delay time tf--- fall time tfr--- Forward recovery time tg--- circuit commutation shut-off time tgt--- gate control gate opening time Tj--- junction temperature Tjm--- maximum junction temperature ton--- Opening time toff--- off time tr--- Rise time trr--- reverse recovery time ts--- storage time tstg--- Storage temperature of temperature compensation diode a--- temperature coefficient λ p--- peak wavelength of luminescence △ λ --- Spectral half width η --- voltage division ratio or efficiency of a single junction transistor VB--- Reverse peak breakdown voltage Vc--- rectified input voltage VB2B1--- base voltage VBE10--- Reverse voltage between emitter and first base VEB--- saturation voltage drop VFM--- Maximum forward voltage drop (forward peak voltage) VF--- Forward voltage drop (forward DC voltage) △ VF--- Forward voltage drop difference VDRM --- Off-state repetitive peak voltage VGT--- gate trigger voltage VGD--- gate non-trigger voltage VGFM--- gate forward peak voltage VGRM--- gate reverse peak voltage VF ( AV ) --- Average forward voltage Vo--- AC input voltage VOM--- Maximum output average voltage Vop--- operating voltage Vn--- center voltage Vp--- peak voltage VR--- Reverse working voltage (reverse DC voltage) VRM--- Reverse peak voltage (maximum test voltage) V ( BR ) --- Breakdown voltage Vth--- Valve voltage (threshold voltage) VRRM--- Reverse repetitive peak voltage (reverse surge voltage) VRWM--- Reverse working peak voltage V v--- valley voltage Vz--- stable voltage △ Vz--- voltage increment in the voltage regulation range Vs--- pass voltage (signal voltage) or current-stabilizing voltage of the current-stabilizing tube av--- voltage temperature coefficient Vk--- knee voltage (current stabilizing diode) VL --- Limiting voltage
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