Flagship Micro's FC4150 family passes AEC-Q100 automotive certification standards

Suzhou QiXin Micro Semiconductor Co., Ltd. announced that several products of its self-developed 32-bit automotive MCU FC4150 family have passed the AEC-Q100 Grade 1 automotive verification standard.

As QiXinMicro's first automotive-grade product series, the FC4150 family was jointly developed by the company's automotive product experts and international Tier 1 manufacturers based on the AEC-Q100 standard. The test program was collaboratively developed by the original factory test engineering and design teams. By cooperating with professional third-party authoritative testing organizations, a full set of AEC-Q100 automotive-grade reliability test verifications were completed, and a complete and detailed test data report was provided. This indicates that the performance and reliability of QiXin Micro's automotive-grade MCUs meet international automotive chip standards, ensuring product consistency, reliability and safety to meet the needs of the automotive electronics industry.

AEC-Q100 Grade 1 reliability verification report

About AEC-Q100

AEC-Q100 is a quality standard developed by the Automotive Electronics Council (AEC) to ensure the reliability and safety of automotive electronic parts and to ensure that chips can withstand the extreme temperature, humidity, vibration and aging tests of automotive application environments. The AEC-Q100 standard is mainly used to prevent various situations or potential failure states that may occur in products, and guide component suppliers to use chips that meet specifications during the development process. AEC-Q100 strictly confirms the quality and reliability of each chip case and confirms the product data sheet proposed by the manufacturer. Whether the functions such as the purpose of use and functional description meet the initial requirements, and whether the functions and performance are consistent after continuous use.

Flagchip performs at a higher standard than AEC-Q100

QiXin Micro strictly controls the quality of the entire process from design and manufacturing to packaging and testing to ensure high reliability and consistency:

Automotive-grade IP design, enhanced aging margin

· Internationally advanced eFlash automotive technology

Automotive-grade packaging BOM and process

Strict zero-defect testing process

Full-process IATF16949 certified factory

6 Sigma quality control

QiXinMicro has made a series of stricter verifications for the FC4150 family products based on the AEC-Q100(H) standard and in line with the needs of international Tier 1 customers:

All AEC-Q100(H) projects are performed by CNAS-certified laboratories within the scope of authorized services

The number of experimental samples exceeds 3,000 pcs, and each sample has a unique tracking code and a one-to-one correspondence with the test record, which facilitates data analysis and tracking

The company's powerful semiconductor data analysis tools and professional data processing team implement zero-defect methods such as SPAT/DPAT, SBA and GDBC to meet automotive regulations

Environmental and life aging projects are twice as long as the standard, ensuring a service life of more than 15 years

HTOL uses dual acceleration factors of voltage and temperature to implement dynamic vector aging tests on analog, digital and storage circuits, and keeps continuous monitoring records to ensure effectiveness

· Perform 100K erase/write cycles on the entire embedded FLASH array and 1008 hours of data retention testing at 150°C to ensure data retention for more than 15 years

In addition to the radiated emission required by AEC-Q100(H), IC EMC test items also include radiated anti-interference, conducted emission, and DPI direct current injection tests, all of which meet the requirements of strategic customers.

All project reading points are tested by three-temperature ATE electrical performance parameters, and the test temperature reaches Tj 150℃, so as to achieve electrical performance parameter distribution and degradation analysis before and after the reliability test of the whole project

FC4150 Family Product Introduction

The FC4150 product series is a high-performance automotive-grade MCU based on the Cortex-M4F core, supports ASIL-B functional safety level, and has passed the AEC-Q100 test certification, which is Grade 1. The FC4150 product series is suitable for automotive BCM, BCM+, BMS, lighting, motor control, HVAC, TPMS and T-BOX applications. Currently, the FC4150 product series of Qixin Micro has been mass-produced and shipped. For more information, please contact Qixin Micro sales and agents.

FC4150F2M Block Diagram

FC4150 product family feature list

About Flagship Semiconductor

Suzhou Qixin Micro Semiconductor Co., Ltd. was established in October 2020. It builds high-performance and high-reliability system-on-chips for different automotive application scenarios based on ARM Cortex M4, M7 and other series architectures, and develops high-end controller chips for smart cars. By adopting self-developed IP, multi-core lock-step and other technologies and the Six Sigma analog circuit design process for automotive chips, a full range of product families covering safety standards ISO26262 ASIL-B to ASIL-D are designed. The company's products meet the automotive AEC-Q100, functional safety standard ISO26262 and various automotive reliability tests, and can be widely used in body, automotive instrumentation, safety, power, battery management and other fields.