Signal Integrity Analysis Fundamentals Series 3 - CDR in Serial Data Testing

In today's GHz-rate serial data testing, eye diagram and jitter testing are the two most important test items. In eye diagram and jitter measurement, the test instrument must recover the reference clock from the signal to be tested and use the clock to synchronize and sample the data. Therefore, the method of recovering the clock will directly affect the eye diagram and jitter test results. Various serial data standards specify the parameters of the clock recovery circuit CDR in jitter measurement. Only by correctly setting the CDR parameters of the test instrument can the measurement results be consistent with the actual performance of the chip receiving end.
  
 Figure 1 below shows a system diagram of a serial data link. This architecture is used in serial links such as Fibre Channel, Gigabit Ethernet, and SDH. After the signal sent by the transmitter (TX) is transmitted to the receiver (RX) through the channel, the clock recovery circuit of the RX part of the transceiver chip recovers the clock from the serial data, and uses the recovered clock to synchronize the serial data for sampling. Due to various reasons, the serial data signal entering RX may have large jitter. Ideally (when the loop bandwidth of the phase-locked loop PLL is infinite), the clock output by the PLL of the clock recovery circuit is in phase with the input data signal of RX, that is, zero jitter. At this time, the discrimination circuit of RX (such as the D flip-flop in Figure 1) has the largest setup time and hold time margin. However, since the loop response of PLL is a low-pass filter characteristic, it can only eliminate the jitter in the low-frequency band of the serial data and cannot handle high-frequency jitter. Therefore, in reality, the eye diagram "seen" by the RX end of the transceiver chip has jitter.



   In Figure 1, the parameters of the PLL at the RX end are the determining factors affecting the eye diagram and jitter performance. PLL is a widely used electronic circuit that can be used to obtain a clock of a specific frequency, modulate and demodulate RF signals, and recover the clock of serial data.

  Figure 2 shows the system diagram of PLL, which includes three basic parts: phase detector, loop filter, and voltage controlled oscillator (VCO). Please refer to analog circuit books for the working principle of PLL.


 
 
    In the PLL at the receiving end, the frequency response of the loop consisting of the phase detector, loop filter and VCO is a low-pass filter characteristic. As shown in Figure 3 below, the frequency response of the clock recovery circuit at the receiving end is a low-pass filter, and its transfer function is HL. When the jitter change frequency of the serial data signal is low, that is, from DC to the cut-off frequency of the PLL, the PLL can track the data jump edge in time (that is, lock the phase), and the output clock is in phase with the input data (strictly speaking, the phase difference is a fixed constant), so the jitter is zero. When the jitter of the continuous edge changes too fast (that is, when there is high-frequency jitter), the PLL cannot track the edge change in time, so there is jitter in the output clock and data edges. Therefore, the CDR at the receiving end cannot filter out jitter higher than the cut-off frequency, and its jitter transfer function (Jitter Transfer Function for short JTF) has a high-pass filter characteristic. The CDR at the receiving end is also called the high-pass filter of TIE jitter. As shown in Figure 3, the jitter transfer function HH=1-HL.                Figure 3: Jitter transfer function    In addition to using the PLL shown in Figure 1 to recover the clock at the transceiver receiving end, another clock recovery method is to use a phase interpolator (PI). PI is used to recover the clock in both FBDIMM and PCI Express, but when using instrument testing, PLL can be used to model.   The instruments that test the eye diagram and jitter of high-speed serial data signals all use a clock recovery method based on a phase-locked loop. Among them, real-time oscilloscopes mainly use software PLL to recover the reference clock, and sampling oscilloscopes and bit error rate testers use hardware PLL to recover the clock. Real-time oscilloscopes are the most popular and widely used test instruments. This article only introduces the relationship between the software CDR of real-time oscilloscopes and eye diagram tests and jitter tests. [page]  As shown in Figure 4 below, this is a reference for the PLL settings in LeCroy's serial data analyzer. By default, FC Golden PLL is used. This PLL is a first-order phase-locked loop with a loop bandwidth equal to the bit rate divided by 1667. It was first defined in the MJSQ document of Fibre Channel.                 Figure 4: The software CDR setting interface of LeCroy's serial data analyzer  is shown below. Figure 5 shows the eye diagram measurement results of a 2.5Gbps signal measured by a LeCroy oscilloscope when the PLL bandwidth of the oscilloscope's serial data analysis software is set at 2MHz, 5MHz, 10MHz, and 20MHz. It can be seen that the higher the PLL bandwidth, the clearer the eye diagram and the smaller the jitter. The question is, what is the real eye diagram and jitter received by the transceiver RX end of the circuit to be tested? The answer is that the CDR parameters of the oscilloscope must be set to be exactly the same as the CDR parameters of the RX end of the circuit to be tested, so that the measurement results of the oscilloscope have reference value.          Figure 5: Eye diagrams of the same signal measured by the oscilloscope at different PLL settings      In Figures 4 and 5, both are first-order phase-locked loop CDRs. This type of PLL is used in many serial circuit standards, such as GBE, XAUI, SDH, CPRI, FC, SAS, etc. However, PCIe Gen2, SATA2, and Displayport use a second-order phase-locked loop CDR. Figure 6 shows the JTF comparison between the first-order PLL and the second-order PLL. The second-order PLL has a steeper roll-off factor of -40dB/decade (the roll-off factor of the first-order PLL is 20dB/decade). Assuming that the jitter of a 500kHz signal is 150ps (and 500kHz is within the frequency band of the oblique line), the jitter after passing through the first-order PLL is only 15ps, and after passing through the second-order PLL is only 1.5ps. It can be seen that for the jitter in the low-frequency band in Figure 6, the second-order PLL can reduce the jitter in this frequency band to a greater extent.      Figure 7 shows the eye diagram measurement results of a 2.5Gbps signal using the CDR using a first-order PLL or a second-order PLL. It can be seen that the eye diagram obtained using the second-order PLL is very clear and has less jitter. The second-order PLL can reduce low-frequency jitter to a greater extent and is usually used for serial data signals with spread spectrum clocking (SSC), such as SATA and PCIe on computer motherboards.          Figure 7: The eye diagram of the same signal measured by the oscilloscope at different PLL settings     is shown in Figure 8 below. In the LeCroy SDA, FC Golden, PCIe Gen1, PCIe Gen2, DVI, FBDIMM, USB3.0 and Custom PLL parameter settings are integrated. When measuring, select the appropriate CDR setting according to the type of signal to be tested. Figure 8: LeCroy oscilloscope integrates multiple PLL settings         In Custom custom phase-locked loop mode, you can choose 1st order PLL or 2nd order PLL. If it is a custom first-order PLL, the pole and zero frequencies need to be set. The cutoff frequency of the PLL is the pole frequency, and the zero frequency must be higher than the former, which determines the attenuation coefficient of the stop band; if it is a custom second-order PLL, the Natural Frequency (ωn) and Dampling factor (ζ) need to be set, as shown in the red mark in Figure 8. The transfer function of the loop response of the PLL is H(s) (the formula in yellow font in Figure 8), and the cutoff frequency can be calculated using the following formula:         In summary, correctly setting the CDR parameters of the oscilloscope is the key to measuring eye diagrams and jitter. Testers need to refer to the serial data specification or the instrument manufacturer's operating documentation to ensure the accuracy and effectiveness of the measurement.  References 

       







 




      

  

       



      

  


        


  





        



1, Fiber Channel – Method Jitter and Signal Quality Specification – MJSQ, T11.2/Project 1315-DT/Rev 14.1, June 5, 2005.
2, Mike Peng Li, "Jitter, Noise, and Signal Integrity at High-speed" .