With the development of modern electronic testing technology, microelectronics technology, and computer technology, automatic test systems are also developing in line with the needs of complex electronic equipment. General automatic test systems are the inevitable direction of the future development of automatic test systems. This paper briefly introduces the development of automatic test systems. By analyzing the characteristics of general automatic test systems, the concepts of \"architecture layer\", \"syntax layer\" and \"semantic layer\" general automatic test systems are proposed. The key technologies and application directions of the next generation of general automatic test systems are discussed, which points out the direction for the research of general automatic test systems.
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