Abstract: When the EMP field strength of a microcomputer system irradiated by EMP reaches a certain value, overvoltage or overcurrent will be generated in the device interface circuit, causing interference or damage to the device. This paper designs a typical microcomputer parallel interface single-chip circuit experimental model, introduces the measurement method of the electromagnetic pulse coupling voltage and coupling current of the interface circuit, and analyzes the measured data to obtain the electromagnetic pulse field strength value that this type of typical interface circuit is subjected to transient interference and permanent damage. Keywords: electromagnetic pulse microcomputer interface circuit coupling
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