High and low temperature tests of electronic equipment are one of the bases for finalizing the production of electronic equipment. In practical applications, simple high and low temperature tests cannot fully reflect the adaptability of electronic equipment to ambient temperature, so the adaptability test of the entire ambient temperature must be carried out. Based on the problems encountered in the ambient temperature test of electronic equipment, this paper proposes a method for ambient temperature testing of electronic equipment. This method is also applicable to the maintenance of electronic equipment. Keywords: electronic equipment ambient temperature, working temperature, failure temperature
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