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Design of parameter reading back system for inspection instrument of Shanghai EBIT device

  • 2013-09-22
  • 209.61KB
  • Points it Requires : 2

This paper introduces the design of the parameter readback system of the inspection instrument in Shanghai EBIT device based on LabVIEW. Compared with traditional detection methods, this system is not only user-friendly, but also easy to operate. It uses a computer to remotely control the Keithley 2000 digital multimeter to monitor the inspection instrument, collect and record data every 3 seconds, and intuitively reflect the results on the curve. When the collected data exceeds the range set by the user, it can sound and light alarm.

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