QT226L9S-100.000MHZ datasheet, PDF

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QT226L9S-100.000MHZ: DescriptionLVCMOS Output Clock Oscillator,; CategoryPassive components oscillator; File Size2MB，37 Pages; ManufacturerQ-TECH Corporation; Environmental Compliance

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QT226L9S-100.000MHZ Overview

LVCMOS Output Clock Oscillator,

QT226L9S-100.000MHZ Parametric

Parameter Name	Attribute value
Is it Rohs certified?	conform to
Objectid	7062456790
Reach Compliance Code	compliant
Frequency Adjustment - Mechanical	NO
frequency stability	50%
JESD-609 code	e4
Installation features	SURFACE MOUNT
Nominal operating frequency	100 MHz
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
Oscillator type	LVCMOS
physical size	20.07mm x 14.99mm x 4.06mm
Maximum supply voltage	3.63 V
Minimum supply voltage	2.97 V
Nominal supply voltage	3.3 V
surface mount	YES
Terminal surface	Gold (Au) - with Nickel (Ni) barrier

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CLASS B+ PRODUCTS

Q-TECH

CORPORATION

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

1.8 to 5.0Vdc - 15kHz to 250MHz

Features

• Made in the USA - ECCN: EAR99

• DFARS 252-225-7014 Compliant Electronic Component Exemption

• Broad frequency range from 15kHz to 250MHz (for higher

frequencies please consult the factory)

• Rugged 4-point mount (SMD ceramic) or 3 point mount (others)

shock resistant

• Small packages and footprints offering 5x7mm SMT and leaded

with 4-point crystal mount

• 100kRad (Si) tolerant

• ACMOS, LVCMOS, TTL, LVDS, LVPECL

• Tristate Output option (-D) except for LVDS and LVPECL

(standard)

• Hermetically sealed package

• Fundamental and 3rd Overtone design

• Swept Quartz Crystal or Cultured Quartz Crystal

• Low phase noise and jitter

• Q-Tech does not use pure lead or pure tin in its products

• Custom screening and QCI available with MCM part number

• MIL-PRF-55310/9, /16, /21, /26, /27, /28, /30, /33, /34, /35, /36, /37,

/38, /39, /40 equivalent

Ordering Information

Lead Finish:

T = Standard

(*)

S = Solder Dip

(**)

(Sample part number)

Q T 18 8A C D10S -10 0.0 0 0M H z

Q T 1 88 AC D 10 S - 100.000MHz

Output Frequency

Screening Option:

Per MIL-PRF-38534, Class K (modified)

Per MIL-PRF-55310, Level S

Per MIL-PRF-55310, Level S (modified)

Per MIL-PRF-55310, Level B (modified)

Per NASA EEE-INST-002, Level 1

Engineering Model

Materials Level

1 = 100kRad Tolerant Die, Swept Quartz Crystal

2 = 100kRad Tolerant Die, Cultured Quartz Crystal

3 = Class B Die, Swept Quartz Crystal

Package:

See Pages 5-6, 28-31

Logic & Supply Voltage:

(All B+ Packages)

Note: If breadboard model is desired, refer to normal QT products or

consult with Q-Tech.

ACMOS (****)

HCMOS

TTL

LVCMOS

5.0V

3.3V

2.5V

1.8V

(QT122, QT128, QT125, QT127, QT129, QT130,

QT180, QT185, QT186, QT187,

QT193 & QT194 Only)

LVDS

LVPECL

Gold Plated: 50μ ~ 80μ inches typ.

Hot Solder Dip Sn60/Pb40 per MIL-PRF 55310 is optional for an additional cost

Tristate Option:

See Note (*****)

Frequency stability vs. temperature codes may not be available in all frequencies.

For 5x7mm products, Code 19 is only available for

≤32MHz

and Code 9 is only

Blank = No Tristate

available for

≤100MHz.

D = Tristate

(****) HCMOS & TTL compatible

(*****) (D) code for tristate is not required for LW, NW, LP and NP logic types. This

enable/disable function is included by default.

For Non-Standard requirements, contact Q-Tech Corporation at Sales@Q-Tech.com

3.3V

2.5V

3.3V

2.5V

Frequency vs. Temperature Code (***):

± 65ppm at -55ºC to +125ºC

± 50ppm at -55ºC to +105ºC

± 75ppm at -55ºC to +125ºC

± 50ppm at -55ºC to +125ºC (***)

± 100ppm at -55ºC to +125ºC

± 50ppm at -40ºC to +85ºC

± 100ppm at -40ºC to +85ºC

± 25ppm at -40ºC to +85ºC

(Contact Q-Tech for availability)

± 100ppm at -55ºC to +105ºC

± 15ppm at 23ºC ± 1ºC (***)

19 =

± 50ppm at -55ºC to +125ºC reference to F at 23ºC

(*)

(**)

(***)

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-te ch.com

QPDS-0001 (Revision V, August 2020)

1 of 37

CLASS B+ PRODUCTS

Q-TECH

CORPORATION

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

1.8 to 5.0Vdc - 15kHz to 250MHz

GENERAL SPECIFICATION

1.1

1.2

2.1

SCOPE

Scope. This specification establishes the general quality and reliability requirements for a family of hybrid, hermetically sealed

square wave, B+ crystal oscillators.

Part Number. The part number shall be as specified in the detail specification.

APPLICABLE DOCUMENTS

Specifications and Standards. Unless otherwise specified, the following documents shall be applicable to this specification to

the extent specified herein.

SPECIFICATIONS

MIL-PRF-55310 Crystal Oscillators, General Specification For

MIL-PRF-38534 Hybrid Microcircuits, General Specification For

EEE-INST-002

STANDARDS

MIL-STD-202

MIL-STD-883

2.2

Test Methods for Electronic and Electrical Component Parts

Test Methods and Procedures for Microelectronics

Instructions for EEE Parts Sections, Screenings, Qualifications and Ratings

Conflicting Requirements. In the event of conflict between requirements of this specification and other requirements of the

applicable detail drawing, the precedence in which requirements shall govern, in descending order, is as follows:

a) Applicable Customer purchase order.

b) Applicable Customer detail drawing.

c) This specification.

d) Other specifications or standards referenced in 2.1 herein.

2.3

Customer Purchase Order Special Requirements. Additional special requirements shall be specified in the applicable Customer

purchase order when additional requirements or modifications specified herein are needed for compliance to special program

or product line requirements

REQUIREMENTS

Item Requirements. The individual item requirements shall be as specified herein and the detail specification.

Case Outline. The case outline shall be as specified in the detail specification. (See pages 28 to 31)

Terminal Connections. The terminal connections shall be as shown on page 32.

Lead Material and Finish. Lead material and finish shall be as shown on page 33.

Hot Solder Dip. Terminals can be solder dipped Sn60/Pb40 per MIL-PRF-55310 at additional cost. Prefix designated with an

“S”. See sample part number in the “Ordering Information” table.

Solderability. Leads shall meet the requirements of MIL-PRF-55310/38534 when tested.

Maximum Ratings. Unless otherwise specified, the maximum ratings shall as specified in the detail specification.

Electrical Performance Requirements. The electrical performance requirements shall be as specified herein and the applicable

detail specification.

Design and Construction. The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the

oscillators shall meet the design and construction requirements of MIL-PRF-55310.

3.1

3.2

3.2.1

3.2.2

3.2.3

3.2.4

3.3

3.4

3.5

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-te ch.com

QPDS-0001 (Revision V, August 2020)

2 of 37

CLASS B+ PRODUCTS

Q-TECH

CORPORATION

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

1.8 to 5.0Vdc - 15kHz to 250MHz

GENERAL SPECIFICATION (Cont’d)

3.5.1

3.5.2

3.5.3

3.5.4

3.5.5

3.5.6

3.5.7

3.5.8

Construction Technology. The device shall be constructed as a class 2-Type 1 hybrid oscillator of MIL-PRF-55310.

Workmanship. The device workmanship shall meet the requirements of MIL-PRF-55310.

Element Derating. All active and passive elements shall be derated in accordance with the applicable hybrid microcircuit

element requirements of MIL-STD-975. Elements shall not operate in excess of derated values.

Active Elements. The active component shall be derived from lots that meet the Element Evaluation requirements of

MIL-PRF-38534, Class K (for QT100 and QT200), 100kRad (Si) tolerant, and MIL-PRF-55310, Level B (QT300).

Quartz Crystal. Unless otherwise specified by the detail specification, the quartz crystal material for the QT100 and QT300

shall be swept synthetic, grade 2.2 millions or better and cultured quartz crystal for QT200.

Passive Elements. Element Evaluation shall be as a minimum in accordance with MIL-PRF-55310, Level S for QT100 and

Level B for QT200 And QT300.

Crystal Mounting. The crystal element shall be three-point minimum mounted in such a manner as to assure adequate crystal

performance when the oscillator is subjected to the environmental conditions specified herein.

Maximum Allowable Leak Rate. The maximum allowable leakage rate shall be as specified by MIL-STD-883, method 1014

based on the internal cavity volume. The hermetic seal (fine and gross leak) tests shall be in accordance with MIL-STD-883,

Method 1014, with Leak Rate 5x10

-8

atm-cm

/s Helium gas unless otherwise specified.

Weight. The maximum weight of the crystal oscillator shall be defined on page 33.

Delta Criteria. The crystal oscillator shall meet the parameter delta criteria post burn-in called out in the detail specification.

The change in the parameter (delta) shall be calculated between the initial measurement and the present (interim or final)

measurement.

Marking. Each unit shall be permanently marked with the manufacturer's name or symbol, part number, frequency, lot date

code number, and serial number. The unit shall be marked with the outline of an equilateral triangle near pin 1 to show that it

contains devices which are sensitive to electrostatic discharge.

Traceability. Material, element and process traceability requirements shall be as specified by MIL-PRF-55310.

Rework Provisions. Rework shall be in accordance with the provisions of MIL-PRF-55310.

QUALITY ASSURANCE PROVISIONS

Responsibility for Inspection. Unless otherwise specified in the contract or purchase order, the supplier shall be responsible for

the performance of all inspection requirements as specified. Customer reserves the right to perform any of the inspections set

forth in the specification where such inspections are deemed necessary to assure supplies and services conform to prescribed

requirements, and to return any product failing to meet the specified requirements.

Screening. Hybrid crystal oscillators shall have been subjected to and successfully passed all the screening tests as applicable

in Tables I, II, III, IV, V, VI.

Nondestructive Bondpull. 100% Non-destructive bondpull applicable to screening S, A, C, N.

Percent Defective Allowable (PDA). The percent defective allowable shall be 2% (Screening Option S, A, C) or 5% (Screening

Option N) 10% (Screening Option B) or one device, whichever is greater. PDA accountability shall be based on failures occurring

during the second half of burn-in only. PDA shall be applicable to the +25 ºC static parameters as specified in the delta criteria.

Quality Conformance Inspection (QCI). Shall be as outlined in the QCI section for each screening option here-in. All records

shall be traceable to the lot number and unit serial number. Samples used for Group A that pass all tests may be delivered on

contract prior to QCI completion.

3.5.9

3.5.10

3.5.11

3.5.12

3.5.13

4.1

4.2

4.2.1

4.2.2

4.3

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-te ch.com

QPDS-0001 (Revision V, August 2020)

3 of 37

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