MIL-M-38510/119A
AMENDMENT 2
26 APRIL 2000
SUPERSEDING
MIL-M-38510/119A
AMENDMENT 1
09 JAN 1995
MILITARY SPECIFICATION
Inactive for new design as of 13 July 1995
MICROCIRCUITS, LINEAR, LOW POWER, LOW NOISE, BI-FET
OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
This amendment forms a part of MIL-M-38510/119A, dated
07 August 1987, and is approved for use by all
Departments and Agencies of the Department of Defense.
PAGE 1
1.2.1, Add footnote for device type 06 as follows "Devices may be monolithic or they may consist of two separate
independent die."
PAGE 3
3.1 Detail specifications, delete in its entirety and substitute “3.1 Item requirements. The individual item
requirements shall be in accordance with MIL-M-38510, and as specified herein. The individual item requirements
for devices marked with the “Q” certification mark shall be in accordance with MIL-I-38535 and as specified herein
or as modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall
not effect the form, fit, or function as described herein.”
* 3.1, at the end of the paragraph add the following sentence:
“This slash sheet has been modified to allow the manufacturer to use the alternate die/fabrication requirements of
paragraph A.3.2.2 of MIL-PRF-38535 or other alternative approved by the Qualifying Activity.”
3.4, Electrical performance characteristics, delete in its entirety and substitute “For dual and quad packages, the
idle devices shall be connected as grounded followers or in the case of devices maintained in servo test loops, the
idle devices shall have their outputs forced to ground via the output control voltage.”
* Add the following paragraph 3.6.3 :
“3.6.3 Certification/compliance mark. The certification mark for device classes Q and V shall be “QML” or “Q” as
required in MIL-PRF-38535. For class Q product built in accordance with A.3.2.2 of MIL-PRF-38535 or other
alternative approved by the Qualifying Activity, the “QD” certification mark shall be used in place of the “QML” or “Q”
certification mark.
4.1, Sampling and inspection, delete in its entirety and substitute “4.1 Sampling and Inspection. Sampling and
inspection procedures shall be in accordance with MIL-M-38510 and methods 5004, 5005, and 5007, as applicable,
of MIL-STD-883, except as modified herein. For devices marked with the “Q” certification mark, sampling and
inspection procedures shall be in accordance with MIL-I-38535 or as modified in the device manufacturer’s Quality
Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described
herein.
PAGE 5
Table I, add new footnote “1/” to the conditions column.
Table I, Input offset current test, footnote “1/” will be renumbered as footnote “2/”.
Table I, Input bias current test, footnote “2/” will be renumbered as footnote “3/”.
Table I, Input bias current test, footnote “3/” will be renumbered as footnote “4/”.
Table I, Input voltage common mode rejection test, footnote “4/” will be renumbered as footnote “5/”.
Table I, Adjustment for input offset voltage test, footnote “5/” will be renumbered as footnote “6/”.
Table I, Output short circuit current (for positive output) test, footnote “6/” will be renumbered as footnote “7/”.
AMSC N/A
1 of 3
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
FSC 5962
MIL-M-38510/119A
AMENDMENT 2
PAGE 5
Table I, Input bias current test, delete in its entirety and substitute the follow :
“
Input bias current
3/ 4/
+I
IB
, -I
IB
V
CC
=
r
15 V,
V
CM
= +11 V,
t
d
25 ms
T
J
= +25
q
C
T
J
= +125
q
C
T
J
= +25
q
C
T
J
= +125
q
C
T
J
= +25
q
C
T
J
= +125
q
C
ALL
-200
1200
pA
ALL
ALL
-10
-200
70
+200
nA
pA
V
CC
=
r
15 V,
V
CM
= 0 V,
t
d
25 ms
ALL
ALL
-10
-400
50
200
nA
pA
V
CC
=
r
15 V,
V
CM
= -11 V,
t
d
25 ms
ALL
-10
50
nA
“.
PAGE 6
Table I, add new footnote “1/” to the condition column.
Table I, Output short circuit current (for negative output) test, footnote “6/” will be renumbered as footnote “7/”.
Table I, Open loop voltage gain (single ended) test, delete in its entirety and substitute the following :
“
Open loop
voltage gain
(single ended) 8/
A
VS(+)
V
OUT
= 0 V to 10 V,
R
L
= 10 k
:
T
A
= +25
q
C
01, 02,
03
5
V/mV
T
A
= -55
q
C,
+125
q
C
V
OUT
= 0 V to 10 V,
R
L
= 2 k
:
T
A
= +25
q
C
T
A
= -55
q
C,
+125
q
C
A
VS(-)
V
OUT
= -10 V to 0 V,
R
L
= 10 k
:
T
A
= +25
q
C
T
A
= -55
q
C,
+125
q
C
V
OUT
= -10 V to 0 V,
R
L
= 2 k
:
T
A
= +25
q
C
T
A
= -55
q
C,
+125
q
C
01, 02,
03
04, 05,
06
04, 05,
06
01, 02,
03
01, 02,
03
04, 05,
06
04, 05,
06
4
50
25
5
4
50
25
“.
Table I, Open loop voltage gain (single ended), A
VS
, test, footnote “7/” will be renumbered as footnote “8/”.
2
MIL-M-38510/119A
AMENDMENT 2
PAGE 7
Table I, add new footnote “1/” to the condition column.
Table I, Channel separation test, footnote “8/” will be renumbered as footnote “9/”.
Footnotes, Add new footnote as follows, “1/ For devices marked with the “Q” certification mark, the parameters
listed herein may be guaranteed if not tested to the limits specified in accordance with the manufacturer’s QM plan.
Footnote “1/” will be renumbered as footnote “2/”.
Footnote “2/” will be renumbered as footnote “3/”.
Footnote “3/” will be renumbered as footnote “4/”.
Footnote “4/” will be renumbered as footnote “5/”.
Footnote “5/” will be renumbered as footnote “6/”.
Footnote “6/” will be renumbered as footnote “7/”.
Footnote “7/” will be renumbered as footnote “8/”.
Footnote “8/” will be renumbered as footnote “9/”.
PAGE 9
Figure 1, device types 03 and 06, cases C and D, pin 11, delete “V-/GND” and substitute “V-“
PAGE 12
Figure 4, Test circuit for burn-in and steady state life tests, delete “Conditions @ T
A
= +125
q
C” and substitute
“Conditions @ T
A
t
+125
q
C”.
PAGE 18
Figure 9, Test circuit for settling time, delete note 4 in its entirety and substitute “4. Settling time t
s
, measured on
pin 5, is the interval during which the summing mode is not nulled to within
r
5 mV.”
PAGE 26
Footnote 1/, add the following sentence, “For devices marked with the “Q” certification mark, the parameters listed
herein may be guaranteed if not tested to the limits specified in accordance with the manufacturer’s QM plan.”
Footnote 7/, delete in its entirety and substitute “7/ For device types 02, 03, 05, and 06 maximum limit shown is for
1 operating amplifier only, this value is double for the dual device (I.e. 2 x 3.5 = 7 mA at 25
q
C and 125
q
C i.e. 2 x 4.0
= 8 mA at -55
q
C), quadruple for the quad devices.”
Note : The margins of this amendment are marked with asterisks to indicate where changes from the previous
amendment were made. This was done as a convenience only and the Government assumes no liability
whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to evaluate the
requirements of this document based on the entire content irrespective of the marginal notations and relationship to
the last previous amendment.
CONCLUDING MATERIAL
Custodians:
Army - CR
Navy - EC
Air Force – 11
DLA - CC
Review activities:
Army - AR, MI, SM
Navy – AS, CG, MC, OS, SH, TD
Air Force – 19, 99
Preparing activity:
DLA - CC
(Project 5962-1870)
Civil Agency Coordinating Activity:
NASA – NA
3
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