Technology Update
With the increasing demand for lighter weight and more
rugged filter connectors, ITT Electronic Components, has
advanced the state of the art in filter technology with the
new Cannon Chip-on-Flex (CoF) design.
Cannon’s Chip-on-Flex filter connector technology
provides a significant performance improvement in
thermal shock and vibration to the ceramic planar array
technology that is the current industry standard. The
current planar array design utilizes a ceramic block
capacitor with plated thru holes where feed thru contacts
are inserted and soldered into place. Internal stresses
associated with vibration, thermal expansion/contraction
can build at the solder joints and
Solder Joint
cause the ceramic material to crack
resulting in a filter failure. As a
consequence, costly thermal shock
screening and burn in procedures
are often used for quality
assurance.
Ceramic
Array
Rugged Design plus up to
15% Savings in Weight
Cannon’s new Chip-on-Flex filter connector has the additional
benefit of being the lightest weight design. The 38999-Style
Series III CoF offers up to a 15% savings in weight over the
ceramic planar array equivalent.
The new Chip-on-Flex connector
will protect critical circuits from
electrical interference providing
a “stray signal barrier”
upstream and away from
electronic devices without
affecting system function and
performance.
The Chip-on-Flex filter
connector provides all the
same benefits of filter
connector technologies.
Flex
Circuit
Chip Capacitor
ARINC 404 Type
New Chip-on-Flex Design
In the new Cannon Chip-on-Flex
design, the internal thermal shock
stresses have been virtually
38999-Style
eliminated. The fragile
Current Planar Array Design
ceramic planar array
capacitor block has been
replaced by a flex circuit where individual chip capacitors
are surface mounted on a pad adjacent to the feed thru
contact.
The result is a very robust filter connector with superior
mechanical performance and improved reliability.
1. Individual isolated pin filtering of high frequency
noise, shunted to ground via the connector shell.
The cut-in frequency of the filtering is selected by
the user from the performance attenuation curves.
2. Built-in ground plane barrier in the connector insert.
This eliminates EMI windows on the face of systems
where connectors enter or exit boxes.
3. Filtering at the face of system boxes eliminating
filtering on the PCB, freeing up board space, and
maintaining EMI integrity of the system by not
allowing unwanted signals to enter the box.
New Design/Development Flexibility and
Reduced Leadtimes
Cannon’s Chip-on-Flex filter design offers the system
designer new and complete flexibility in defining or
changing individual circuit requirements without the need
to retool the ceramic planar array. The Chip-on-Flex
design utilizes readily available flex circuits and devices
leading to reduced design / development cycle time and
overall production delivery.
1. Virtually no limitations on the variation in
capacitance/feed-thru/ground/diode choices that is
readily available to the customer. The exact same
flex circuit is used. Cannon installs the appropriate
device in each location as selected by the customer.
2. EMP protection can be simply added by substituting
a Zener diode in place of a chip capacitor.
Applications
The CoF filter connectors are ideal for high reliability military,
aerospace and industrial applications:
•
•
•
•
•
•
•
•
•
Integrated Avionics Systems
Communication and Navigation
Displays and Instrumentation
Data Processing Equipment
Electronic Warfare Systems
Radar and Sensors
Weapons Controls and Targeting Systems
Electronic Counter Measures
Satellites and Space Systems
Ordering Information
C
F
K
J
A
0
E
*
N
*
L
P
N
P
Product Prefix
38999-Style
Shell Size
Insert
Arrangement
Filter Type
C
- C filter
P
- Pi filter
F
- L filter
Polarization
N, A, B, C, D, E
38999-Style
Contact Type
P
- pin
S
- socket
PS
- adapter pin side @ receptacle end
SP
- adapter socket side @ receptacle end
Standard Capacitance Range
H
- 1100pF ±20%
T
- 4200pF ±20%
M
- 10,100pF ±20%
L
- 38,000pF ±20%
38999-Style Series
I-L
II
- blank
III
- A
IV
- B (receptacles only)
Shell Style
0
- Front Wall Mount Receptacle
2
- Front Box Mount Receptacle
3
- Rear Wall Mount Receptacle
5
- Rear Box Mount Receptacle
7
- Jam Nut Mount Receptacle
Termination
E
- pc tail, .250 extension, .25ø
6
- Plug - EMI Grounded
size 22, .035Ø size 20, .060ø
8
- In-line Adapter
size 16
C
- solder pot, .250 extension
(Note - styles 2, 3 and 5 for
S
- crimp piggy-back
Series I & II only)
W
- wire wrap, .400 extension,
.025 square size 22
* Shell size and
Insert Arrangements
38999-Style
Finish
N
- Electroless Nickel (prefered)
B
- Olive Drab Chromate over Cadmium over Nickel
R
- Zinc alloy over Ni (RoHS compliant)
Also available in accordance with applicable portions of
24308-Style,26482-Style, MIL-C-81659 & ARINC 600
Attenuation Curves
Cannon’s Chip-on-Flex filter connectors
are designed to
be comparable to
MIL-DTL-38999 Series III testing for
thermal shock, random vibration, humidity and high
altitude DMV. These connectors are ideal for high
reliability military aerospace and industrial applications.
This new filter technology is available in almost all series
of Cannon standard connectors:
DESIGNED TO BE COMPARABLE TO
THE FOLLOWING:
MIL-DTL-38999, Series I
MIL-DTL-38999, Series II
MIL-DTL-38999, Series III
MIL-DTL-38999, Series IV
MIL-C-26482, Series II
MIL-DTL-24308
MIL-C-81659 (ARINC 404)
ARINC 600
P/N LEAD-OFF
CoF C-filter Attenuation
CFKJL
CFKJ
CFKJA
CFKJB
CFPV
CFD
CFDPX
CFBKA
CoF Pi-filter Attenuation
38999-Style Filter Performance
Chip-on-Flex Filter Connectors are designed to be comparable to MIL-DTL-38999.
Test Description
Insulation Resistance
Paragraph
4.5.9
Requirements
Insulation resistance test is performed on unmated connectors per MIL-STD-1344, method 3003. The test
voltage is 100 Vdc minimum. Standard quality conformance testing is done, where all contacts are measured
to all other contacts and the shell at room temperature. The minimum requirement is 5,000 Megohms at room
temperature and 1,000 Megohms at 125
o
C.
Dielectric Withstanding Voltage (DWV) is performed on unmated connectors per MIL-STD-1344, method 3001.
Standard quality conformance testing is done, where all contacts are measured to all other contacts and the
shell at room temperature. Leakage current shall not exceed 100 microamps at the shown minimum test
voltages.
Contact Size
Test Voltage
22 with ‘M’, ‘T’ & ‘H’
range filters
500 Vdc
22 with ‘L’ range filters
300 Vdc
20, 16 & 12
500 Vdc
Dielectric Withstanding
Voltage (DWV)
4.5.10
Contact Retention
4.5.19
After preloading to 3 pounds maximum, the force is applied at approximately 1 pound per second and
maintained at full load for 5-10 seconds. There is no damage to contacts or inserts and filter attenuation
minimum values are met after testing. Filter contacts are non-removable.
Contact Size
Load in Pounds + / - 10%
22
10
20
15
16
25
12
25
Vibration
4.5.22
Wired, mated connectors are vibrated by mounting filter receptacles on the vibration fixture by normal means.
There are no pin-socket electrical discontinuities exceeding 1 microsecond with 100/500 milliamps of current
flowing during vibration testing. There is no disengagement of mated connectors, evidence of cracking,
breaking or loosening of parts. Filter attenuation minimum values are met after testing.
Series I and IV
a) MIL-STD-202, Method 204, Condition G (30g sine, 4 hrs in 3 axis)
b) MIL-STD-1344, Method 2005, Condition VI, Letter J (Random, 8 hrs in 2 axis)
c) MIL-STD-1344, Method 2005, 38999-Style Figure 25
(Random, 8 hrs in 2 axis, no weights)
MIL-STD-1344, M2005, Cond. VI, Ltr J (Random, 8 hrs in 2 axis)
a) MIL-STD-1344, Method 2005, Condition VI, Letter J
(Random, 8 hrs in 2 axis at high temp)
b) MIL-STD-1344, Method 2005, 38999-Style Figure 25
(Random, 8 hrs in 2 axis, no weights)
Series II
Series III
Mechanical Shock
4.5.23.1
Wired, mated connectors are subjected to 300g half sinusoidal shocks per MIL-STD-1344, method 2004,
condition D. Filter receptacles are mounted on the shock fixture by normal means. There are no pin-socket
electrical discontinuities exceeding 1 microsecond with 100/500 milliamps of current flowing during shock
testing. There is no disengagement of mated connectors, evidence of cracking, breaking or loosening of parts.
Filter attenuation minimum values are met after testing.
Unmated connectors are subjected to 25 cycles of temperature cycling per MIL-STD-1344, method 1003,
condition A except temperature extremes are -65/-68
o
C and +122/125
o
C. There is no damage detrimental to
the operation of the connectors. Filter attenuation minimum values are met after testing.
Unmated connectors are tested per MIL-STD-1344, method 3001 at the test voltages below. Only the
engaging face of receptacles are subjected to the high altitude (rear face is suitably protected). Leakage current
shall not exceed 100 microamps at the shown minimum test voltages.
Contact Size
50,000 feet
70,000 feet
100,000 feet
22 with ‘M’, ‘T’ & ‘H’
range filters
400
260
200
22 with ‘L’ range filter
240
150
125
20, 16 &12
400
260
200
Thermal Shock
4.5.4
High Altitude DWV
4.5.10.2
Filter connector characteristics under Coupling Torque, Durability, Corrosion, Shell-to-shell Conductivity, Contact Resistance, Insert Retention,
Temperature Exposure and Humidity testing are identical to those of non-filtered MIL specification versions. Standard Operating Parameters:
Maximum Operating Voltage – 200 Vdc or 120 Vac rms at 400 Hz
Contact RF current rating – 11 milliamps rms
Contact current rating (dc)
15 amps size 16
7.5 amps size 20
5 amps size 22
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