EEWORLDEEWORLDEEWORLD

Part Number

Search
 PDF

MS1-B-12-622-2-1CA-A-C

Description
Thermal Magnetic Circuit Breaker
CategoryCircuit protection    Circuit protection   
File Size1MB,5 Pages
ManufacturerCarling Technologies
Download Datasheet Parametric View All

MS1-B-12-622-2-1CA-A-C Overview

Thermal Magnetic Circuit Breaker

MS1-B-12-622-2-1CA-A-C Parametric

Parameter NameAttribute value
MakerCarling Technologies
Reach Compliance Codecompliant
Circuit protection typeTHERMAL MAGNETIC
Manufacturer's serial numberMS
Implementation of Distributed Data Acquisition and Control System Based on Single Chip Microcomputer Communication Network
This paper introduces the distributed data acquisition and control system realized by single chip microcomputer serial communication network. The basic structure and working principle of the system ar...
zzzzer16 MCU
RTL8382M/RTL8380M Industrial-grade managed embedded full Gigabit switch core module
RTL8382M/RTL8380M Industrial-grade managed embedded full Gigabit switch core moduleGigabit switches are widely used in many fields. However, the actual number of network ports is uncertain. If it is d...
natertech Industrial Control Electronics
MicroPython pinout and getting help, pyboard from entry to mastery
[color=rgb(51, 51, 51)][backcolor=transparent][font=Tahoma,"Microsoft Yahei","Simsun"][color=#008000] [/color][/font][/backcolor][/color] [color=rgb(51, 51, 51)][backcolor=transparent][font=Tahoma,"Mi...
陈韶华 MicroPython Open Source section
ISM303DAC three-axis acceleration + three-axis magnetometer sensor package and code
Data sheet:Code:Package:Official evaluation board gerber file:...
littleshrimp MEMS sensors
IC card swiping technology under the screen
Recently I have seen some products that can swipe cards directly on the top of the screen. Aren't the bottoms of normal 5/7 inch screens made of metal? How can they swipe IC cards? Please give me some...
ye2 RF/Wirelessly
iLink technology tests and verifies high-speed buses
iLink technology tests and verifies high-speed buses Abstract : This paper introduces a new high-speed bus test and verification method . Through the iLink toolkit, integrated logic analyzer and digit...
feifei Test/Measurement

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2024 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号