903
High Speed Comparator
V
CC
1
IN+ 2
IN- 3
V
EE
4
+
8 V
DD
UT
7 O
ND
6 G
5 LATC
H
-
Memory
F
EATURES
:
• High-speed, low-power voltage comparator
•
R
AD
-P
AK
® radiation-hardened against
natural space radiation
• Total dose hardness: 100 krad (Si) typical;
dependent upon orbit
• 8ns typ propagation delay
• 18mW power consumption (typ at +5V)
• Separate analog and digital supplies
• Flexible analog supply: +5V to +10V or ±5V
• Input range includes negative supply rail
• TTL compatible outputs
• TTL compatible latch inputs
D
ESCRIPTION
:
Maxwell Technologies’ 903 high-speed, low-
power voltage comparator features differential
analog inputs and TTL logic outputs with
active internal pull-ups. The 903 can be pow-
ered from separate analog and digital power
supplies or from a single combined supple
voltage. The analog input common-mode
range includes the negative rail, allowing
ground sensing when powered from a single
supply. When powered from +5V, the 903 con-
sumes 18mW. The 903 is equipped with a TTL
compatible latch input. The comparator output
is latched when the latch input is driven low.
Capable of surviving space environments, the
903 is ideal for satellite, spacecraft, and space
probe missions. Maxwell Technologies’ pat-
ented
R
AD
-P
AK
® packaging technology incor-
porates radiation shielding in the microcircuit
package. It eliminates box shielding while pro-
viding lifetime in orbit or space mission. In
GEO orbit, RAD-PAK® provides greater than
100 krad(Si) radiation dose rate. This product
is available with screening up to Class S.
09.12.02 REV 1
All data sheets are subject to change without notice
1
(858)503-3000 Fax:(858)503-3301 www.maxwell.com
©2002 Maxwell Technologies
All rights reserved.
903
High-Speed Comparator
T
ABLE
1. P
INOUT
D
ESCRIPTION
P
IN
1
2
3
4
5
6
7
8
N
AME
V
CC
IN+
IN-
V
EE
LATCH
GND
OUT
V
DD
F
UNCTION
Positive Analog Supply
Positive input
Negative input
Negative analog supply and substrate
Latch input
Ground terminal
Output
Positive digital supply
T
ABLE
2. A
BSOLUTE
M
AXIMUM
R
ATINGS
P
ARAMETER
Analog Supply Voltage (V
CC
to V
EE
)
Digital Supply Voltage (V
DD
to GND)
Differential Input Voltage
Common-mode Input Voltage
Latch Input Voltage
Output Short-circuit Duration to GND
Output Short-circuit Duration to V
DD
Operating Temperature Ranges
Junction Temperature (Tj)
Storage Temperature Range
M
IN
--
--
V
EE
- 0.2
V
EE
- 0.2
-0.2
--
-55
-65
-65
M
AX
+12
+7
V
CC
+ 0.2
V
CC
+ 0.2
V
DD
+ 0.2
Indefinite
1
+125
+160
+150
min.
°C
°C
°C
U
NITS
V
V
V
V
V
Memory
T
ABLE
3. AC E
LECTRICAL
C
HARACTERISTICS
(V
CC
= +5V, V
EE
= -5V, L
ATCH
= L
OGIC
H
IGH
, T
A
= T
MIN TO
T
MAX
,
UNLESS OTHERWISE SPECIFIED
)
P
ARAMETER
Input-to-output High Response Time
S
YMBOL
tpd+
T
EST
C
ONDITIONS
VOD = 5mV,
CL = 15pF,
IO = 2mA
1
VOD = 5mV,
CL = 15pF,
IO = 2mA
1
09.12.02 REV 1
S
UB
G
ROUPS
9, 10, 11
M
IN
--
T
YP
10
M
AX
15
U
NITS
ns
Input-to-output Low Response Time
tpd-
9, 10, 11
--
10
15
ns
All data sheets are subject to change without notice
2
©2002 Maxwell TechnologiesAll
rights reserved.
903
T
EST
High-Speed Comparator
T
ABLE
3. AC E
LECTRICAL
C
HARACTERISTICS
(V
CC
= +5V, V
EE
= -5V, L
ATCH
= L
OGIC
H
IGH
, T
A
= T
MIN TO
T
MAX
,
UNLESS OTHERWISE SPECIFIED
)
P
ARAMETER
Latch Disable to
Output High Delay
Latch Disable to
Output Low Delay
Minimum Setup Time
Minimum Hold Time
Minimum Latch
Disable Pulse Width
1. Guaranteed by design.
S
YMBOL
tpd+
tpd-
ts
th
tpw
C
ONDITIONS
2
S
UB
G
ROUPS
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
M
IN
T
YP
10
12
2
1
10
M
AX
U
NITS
ns
ns
ns
ns
ns
2
2
2
2
2. Owing to the difficult and critical nature of switching measurements involving the latch, these parameters cannot
be tested in a production environment. Typical specifications listed are taken from measurements using a high-
speed test fixture.
Memory
T
ABLE
4. DC E
LECTRICAL
C
HARACTERISTICS
(V
CC
= +5V, V
EE
= -5V, L
ATCH
= L
OGIC
H
IGH
, T
A
= T
MIN TO
T
MAX
U
NLESS
O
THERWISE
S
PECIFIED
)
P
ARAMETER
Input Offset Voltage
Input Bias Current
Input Offset Current
Input Voltage Range
Common-mode Rejection Ratio
S
YMBO
L
T
EST
C
ONDITIONS
V
CM
= 0V,
V
O
= 1.4V
I
IN+
or I
IN-
V
CM
= 0V,
V
O
= 1.4V
1
S
UBGROUP
S
M
IN
--
--
--
V
EE
-
0.1
--
T
YP
2
6
200
--
120
M
AX
6
15
800
V
CC
-
2.25
500
U
NITS
mV
µA
nA
V
µV/V
V
OS
I
B
I
OS
V
CM
CMRR
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
-5V < V
CM
<
+2.75,
V
O
= 1.4V,
2
2
Power-supply Rejection Ratio
Output High Voltage
Output Low Voltage
Latch Input Voltage High
Latch Input Voltage Low
Latch Input Current High
Latch Input Current Low
PSRR
V
OH
V
OL
V
LH
V
LL
I
LH
I
LL
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
--
2.4
--
--
0.8
--
--
150
3.5
0.3
1.4
1.4
1
1
500
--
0.4
2.0
--
20
20
µV/V
V
V
V
V
µA
µA
V
IN
> 250mV,
I
SRC
= 1mA
V
IN
> 250mV,
I
SINK
= 8mA
V
LH
= 3.0V
V
LL
= 0.3V
09.12.02 REV 1
1, 2, 3
1, 2, 3
All data sheets are subject to change without notice
3
©2002 Maxwell TechnologiesAll
rights reserved.
903
S
YMBO
L
High-Speed Comparator
T
ABLE
4. DC E
LECTRICAL
C
HARACTERISTICS
(V
CC
= +5V, V
EE
= -5V, L
ATCH
= L
OGIC
H
IGH
, T
A
= T
MIN TO
T
MAX
U
NLESS
O
THERWISE
S
PECIFIED
)
P
ARAMETER
Positive Analog Supply Current
Negative Analog Supply Current
Digital Supply Current
Power Dissipation
T
EST
C
ONDITIONS
S
UBGROUP
S
M
IN
--
--
--
--
T
YP
2.5
2
1
18
M
AX
6
5
2.5
28
U
NITS
mA
mA
mA
mW
I
CC
I
EE
I
DD
P
D
V
CC
= V
DD
= +5V,
V
EE
= 0V
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1. The input common-mode voltage or either input signal voltage should not be allowed to go negative by
more than 0.2V below V
EE
. The upper end of the common-mode voltage range is typically V
CC
-0.2V, but
either or both inputs can go to a maximum of V
CC
+0.2V without damage.
2. Tested for +4.75V<V
CC
<+5.25V, and -5.25V<V
EE
<-4.75V with V
DD
= +5V, although permissible analog
power-supply range is +4.75V<V
CC
<+10.5V for single-supply operation with V
EE
grounded.
Memory
09.12.02 REV 1
All data sheets are subject to change without notice
4
©2002 Maxwell TechnologiesAll
rights reserved.
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