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W28C0108FHT

Description
EEPROM
Categorystorage    storage   
File Size225KB,12 Pages
ManufacturerNorthrop Grumman Electronic Systems
Download Datasheet Parametric Compare View All

W28C0108FHT Overview

EEPROM

W28C0108FHT Parametric

Parameter NameAttribute value
MakerNorthrop Grumman Electronic Systems
package instruction,
Reach Compliance Codeunknown
Base Number Matches1
Advanced Information / Preliminary
W28C0108
Radiation Hardened 128K x 8 CMOS EEPROM
Northrop Grumman Corporation
January 2008
Features
Rad Hard nonvolatile 1Mbit (128K x 8) EEPROM
- >10,000 programming cycles
- 100 year retention @ +125°C
- <250 nsec read access time
- 100 msec programming time
- 3.3 Volt (Vdd) read operation
Radiation Hardened
- Total Dose up to 300 Krad (Si)
- Transient Logic Upset > 1E8 rads(Si)/sec
- Memory Data Loss > 1E12 rads(Si)/sec
- SEU During READ LETth = 94 Mev-cm
2
/mg
- SEU in Address/Data Latches,
LETth = 40 Mev-cm
2
/mg
- Permanent SEU damage (During Write Only),
Atomic Number
Kr
- No SEL or data loss to to LET> 94 Mev-cm
2
/mg
No Latchup
Full military operating temperature range,
screened to specific test methods for commercial,
Class B, or modified Hi Rel.
JEDEC pin compatible in center 32 pins
Supports these commercial features:
Introduction
The W28C0108
radiation hardened
nonvolatile
1Mbit (128K x 8) EEPROM is intended for use in
space and harsh radiation environments where
critical system data (Program Store, Start Up
Read Only Memory, etc.) cannot be compromised
during radiation exposure, or lost during power
outages.
Proven Technology
The W28C0108 is the next device in a family of
successful Northrop Grumman radiation hardened
EEPROM devices that already includes 64K and
256K EEPROM devices. The radiation hardened
robustness of the design (performed by Sandia
National Laboratories) and fabrication process is
flight proven with more than 10,000 radiation
hardened EEPROM devices previously delivered
to production systems. This product line offers the
only
solid-state reprogrammable nonvolatile
memory available today that is inherently
radiation hardened. No special shielding,
specialized packages, redundant devices, or
special power down is required to operate these
devices in severe radiation environments.
-
-
-
-
-
-
-
Self-Timed Programming
Combined Erase/Write
Auto Program Start
Programming Voltage Internally Generated (Low
Dose application only)
Asynchronous Addressing
128 Word Page
Data Polling
All devices screened for memory cycling (500
cycles) and memory retention (>10 years).
INHB
CCCP
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
D0
D1
D2
VSS
CLK
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
36 PIN
FLAT
PACK
36
CPE
35
VDD
34
A14
33
NC
32 WRB_X
31
A13
30
A8
29
A9
28
A11
27 OEB
26
A10
25
CEB
24
D7
23
D6
22
D5
21
D4
20
D3
19
VW
PINOUT
(Top View)
Caution: This device is sensitive to electrostatic discharge. Users should follow proper I.C. handling procedures.
1
©2007 Northrop Grumman Corporation

W28C0108FHT Related Products

W28C0108FHT W28C0108FH W28C0108FBT W28C0108FBP W28C0108FCP W28C0108FCT
Description EEPROM EEPROM EEPROM EEPROM EEPROM EEPROM
Maker Northrop Grumman Electronic Systems Northrop Grumman Electronic Systems Northrop Grumman Electronic Systems Northrop Grumman Electronic Systems Northrop Grumman Electronic Systems Northrop Grumman Electronic Systems
Reach Compliance Code unknown unknown unknown unknown unknown unknown
Base Number Matches 1 1 1 1 1 1
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