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IBM04368CXLBC
IBM04188CXLBC
8Mb (256K x 36 & 512K x 18) SRAM
Features
• 256K x 36 or 512K x 18 organization
• CMOS technology
• Double-data-rate (DDR) and single-data-rate
(SDR) synchronous modes of operation
• Pipeline mode of operation
• Self-timed late write with full data coherency
• Single differential high-speed transceiver logic
(HSTL) clock with HSTL input and output levels
• 2.5V power supply, 1.5V V
DDQ
• Programmable impedance output driver
• Registered addresses, controls and data-ins
• Burst mode of operation
• Common I/O
• Asynchronous output enable
• Boundary scan using a limited set of JTAG
1149.1 functions
• 9 x 17 bump ball grid array package with SRAM
JEDEC standard pinout and boundary SCAN
order
Description
The IBM04368CXLBC and IBM04188CXLBC 8Mb
SRAMs are synchronous pipeline-mode, high-per-
formance CMOS static random-access memories
that have wide I/O and achieve 2ns cycle times. Sin-
gle differential CK clocks are used to initialize the
read/write operation, and all internal operations are
self-timed. At the rising edge of the CK clock,
addresses and controls are registered internally.
Data-outs are updated from output registers on the
next rising and falling edges of the CK clock, hence
the double data rate. Internal write buffers allow
write data to follow one cycle after addresses and
controls. The SRAM is operated with a single 2.5V
power supply and is compatible with HSTL I/O inter-
faces.
CXLBC_ds.fm.00
June 7, 2002
Page 1 of 24
IBM04368CXLBC
IBM04188CXLBC
8Mb (256K x 36 & 512K x 18) SRAM
x36 BGA Bump Layout (Top View)
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
V
SS
DQ23
V
SS
DQ24
V
SS
DQ25
V
SS
DQ26
V
SS
DQ27
V
SS
DQ28
V
SS
DQ29
V
SS
DQ30
V
SS
2
V
DDQ
DQ20
V
DDQ
DQ21
V
DDQ
CQ
V
DDQ
DQ22
V
DDQ
DQ31
V
DDQ
CQ
V
DDQ
DQ32
V
DDQ
DQ33
V
DDQ
3
SA13
SA14
SA15
NC
V
SS
DQ18
V
SS
DQ19
V
SS
DQ34
V
SS
DQ35
V
SS
NC
V
DD
SA16
TMS
4
SA11
V
SS
SA12
V
SS
V
DD
V
DD
V
SS
V
DD
V
DD
V
SS
LBO
V
DD
V
DD
V
SS
SA17
V
SS
TDI
5
ZQ
B1
G
V
DD
V
REF
V
DD
CK
CK
V
DD
B2
B3
V
DD
V
REF
V
DD
SA1
SA0
TCK
6
SA10
V
SS
SA9
V
SS
V
DD
V
DD
V
SS
V
DD
V
DD
V
SS
MODE
1
V
DD
V
DD
V
SS
SA2
V
SS
TDO
7
SA8
SA7
SA6
SA5
V
SS
DQ17
V
SS
DQ16
V
SS
DQ1
V
SS
DQ0
V
SS
SA4
V
DD
SA3
NC
2
8
V
DDQ
DQ15
V
DDQ
DQ14
V
DDQ
CQ
V
DDQ
DQ13
V
DDQ
DQ4
V
DDQ
CQ
V
DDQ
DQ3
V
DDQ
DQ2
V
DDQ
9
V
SS
DQ12
V
SS
DQ11
V
SS
DQ10
V
SS
DQ9
V
SS
DQ8
V
SS
DQ7
V
SS
DQ6
V
SS
DQ5
V
SS
1. The MODE pin must be connected to V
SS
or floated. The MODE pin has a very small pull down, less than 5µA current at
the V
DD
input.
2. ESD protection diodes reside on this NC bump.
x18 BGA Bump Layout (Top View)
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
V
SS
NC
V
SS
DQ11
V
SS
NC
V
SS
DQ12
V
SS
NC
V
SS
DQ13
V
SS
NC
V
SS
DQ14
V
SS
2
V
DDQ
DQ10
V
DDQ
NC
V
DDQ
CQ
V
DDQ
NC
V
DDQ
DQ15
V
DDQ
NC
V
DDQ
DQ16
V
DDQ
NC
V
DDQ
3
SA13
SA14
SA15
NC
V
SS
NC
V
SS
DQ9
V
SS
NC
V
SS
DQ17
V
SS
SA18
V
DD
SA16
TMS
4
SA11
V
SS
SA12
V
SS
V
DD
V
DD
V
SS
V
DD
V
DD
V
SS
LBO
V
DD
V
DD
V
SS
SA17
V
SS
TDI
5
ZQ
B1
G
V
DD
V
REF
V
DD
CK
CK
V
DD
B2
B3
V
DD
V
REF
V
DD
SA1
SA0
TCK
6
SA10
V
SS
SA9
V
SS
V
DD
V
DD
V
SS
V
DD
V
DD
V
SS
MODE
1
V
DD
V
DD
V
SS
SA2
V
SS
TDO
7
SA8
SA7
SA6
SA5
V
SS
DQ8
V
SS
NC
V
SS
DQ0
V
SS
NC
V
SS
SA4
V
DD
SA3
NC
2
8
V
DDQ
NC
V
DDQ
DQ7
V
DDQ
NC
V
DDQ
DQ6
V
DDQ
NC
V
DDQ
CQ
V
DDQ
NC
V
DDQ
DQ1
V
DDQ
9
V
SS
DQ5
V
SS
NC
V
SS
DQ4
V
SS
NC
V
SS
DQ3
V
SS
NC
V
SS
DQ2
V
SS
NC
V
SS
1. The MODE pin must be connected to V
SS
or floated. The MODE pin has a very small pull down, less than 5µA current at
the V
DD
input.
2. ESD protection diodes reside on this NC bump.
CXLBC_ds.fm.00
June 7, 2002
Page 2 of 24
IBM04368CXLBC
IBM04188CXLBC
8Mb (256K x 36 & 512K x 18) SRAM
Pin Description
SA0–SA18
DQ0–DQ35
CQ,CQ
CK,CK
B1
B2
B3
Address Input (SA0–SA1 burst control starting
addresses)
Data I/O
Differential Echo Clocks
Differential Input Register Clocks
B1 = 0 initiates a Load operation
B2 = 0 initiates a Write operation
B3 = 0 Double Data Rate, B3 = 1 Single Data
Rate
Linear Burst Order, (LBO = 1, interleave
mode; LBO = 0, linear mode)
IEEE 1149.1 Test Inputs (LVTTL levels)
TDO
G
MODE
V
REF
V
DD
V
SS
V
DDQ
ZQ
NC
IEEE
1149.1 Test Output (LVTTL level)
Asynchronous Output Enable
Mode Pin, must be connected to V
SS
HSTL Input Reference Voltage
Power Supply (+ 2.5V)
Ground
Output Power Supply
LBO
TMS,TDI,TCK
Output Driver Impedance Control
No Connect
Ordering Information
Part Number
IBM04368CXLBC-25
IBM04368CXLBC-27
IBM04368CXLBC-30
IBM04188CXLBC-25
IBM04188CXLBC-27
IBM04188CXLBC-30
Organization
256K x 36
256K x 36
256K x 36
512K x 18
512K x 18
512K x 18
Cycle Time (ns)
2.5
2.7
3.0
2.5
2.7
3.0
Leads
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
9 x 17 BGA
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June 7, 2002
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IBM04368CXLBC
IBM04188CXLBC
8Mb (256K x 36 & 512K x 18) SRAM
Block Diagram (x36 Double-Data-Rate Mode)
SA0-SA17
A2-A17
Read Add
E Reg
Write
Add Reg
E
Decode
2:1 Mux
256Kx72
Array
36
36
36
36
A0,A1
CK,
CK
Load
Advance
E
Burst
Logic
Compare
A0’,A1’
A0’
Match
0
VSS
Output
REG
36
Output
REG
1
0
1
0
1
A0’
0
36
1
A0’
A0’
1
0
1
VDD
Output
REG
B1-B3
Control
Logic
Write
1
0
0
Output
REG
1
0
Write
Buffer
E
Write
Buffer
E
4
36
G
Output Enable
4
36
36
36
CQa,
CQa
CQb,
CQb
DQ0-DQ35
Page 4 of 24
CXLBC_ds.fm.00
June 7, 2002
IBM04368CXLBC
IBM04188CXLBC
8Mb (256K x 36 & 512K x 18) SRAM
SRAM Features
DDR and SDR Modes
Timing Diagram: Double-Data-Rate and Single-Data-Rate Modes
on page 6 shows input and output data
placements for both DDR and SDR modes. In DDR read mode, two sets of data-outs are generated from the
second rising and falling edges of the CK clock, assuming the first rising edge of the CK clock samples the
base address. The first of the two data-out sets (DOUT-A) is generated from the sampled base address
(Base-A). The second data-out set (DOUT-A’) is generated from the next burst order address, according to
the burst order definition. Similarly, a DDR write requires data-in placement on the second rising and falling
CK edges. In SDR read mode, only one set of data-outs is generated from the second rising CK edge. In SDR
write mode, one set of data-ins is sampled on the second rising CK edge. The user can switch from DDR to
SDR mode (or from SDR to DDR mode) during any LOAD (B1 = 0) operation.
Late Write
The late-write function allows write data to be registered one cycle after addresses and controls. This feature
eliminates one of two bus-turnaround cycles normally required when going from a read to a write operation.
Late write is accomplished by buffering write addresses and data. The SRAM array update occurs during the
third write cycle. Read-cycle addresses are monitored to determine if read data is to be supplied from the
SRAM array or the write buffer. Full data coherency is maintained for both DDR and SDR operations. As a
result, NOP (write buffer flush) operations are not required going from write cycles to read cycles.
Echo Clocks
Echo clocks CQ and CQ are generated from rising and falling edges of the CK clock, with access times repre-
sentative of the data-outs. Echo clocks keep running during write and NOP operations. Echo clock operation
is identical for both DDR and SDR operations. The close tracking of echo clocks and data-out timings allows
the echo clocks to be used as capture clocks for the data-outs by the receiving device.
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