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108-2072
3.
3.1.
REQUIREMENTS
Design and Construction
Product shall be of the design, construction and physical dimensions specified on the applicable
product drawing.
3.2.
Materials
Materials used in the construction of this product shall be as specified on the applicable product
drawing.
3.3.
Ratings
●
●
●
3.4.
Operating Voltage:
50 volts AC peak or DC
Current: 1 ampere at <30°C (single circuit, free air)
Temperature: -55 to 105°C
Performance and Test Description
Product is designed to meet the electrical, mechanical and environmental performance requirements
specified in Figure 1. Unless otherwise specified, all tests shall be performed at ambient environmental
conditions.
3.5.
Test Requirements and Procedures Summary
Test Description
Requirement
Meets requirements of product
drawing.
Meets visual requirements.
ELECTRICAL
Procedure
EIA-364-18.
Visual and dimensional (C of C)
inspection per product drawing.
EIA-364-18.
Visual inspection.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
voltage.
See Figure 3.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
voltage.
See Figure 4.
EIA-364-21.
Test between any adjacent pair of
signal contacts, or from any signal
contact to an adjacent ground pin
of mated specimens at 100 volts
DC.
Initial examination of product.
Final examination of product.
Low level contact resistance, circuit. 80 milliohms maximum initial.
5 milliohms maximum average
increase.
10 milliohms maximum individual
increase.
Low level contact resistance,
compliant pin.
1 milliohm maximum initial.
1 milliohm maximum change.
Insulation resistance.
1000 megohms minimum.
Figure 1 (continued)
Rev E
2 of 11
108-2072
Test Description
Withstanding voltage.
Requirement
Procedure
1 minute hold with no breakdown or EIA-364-20, Condition I.
flashover.
500 volts AC peak or DC at sea
level.
Test between any adjacent pair of
signal contacts, or from any signal
contact to an adjacent ground pin of
mated specimens.
30°C maximum temperature rise at EIA-364-70, Method 1.
1 ampere load, single circuit in free Stabilize at a single current level
air using thermography.
until 3 readings at 5 minute intervals
are within 1°C.
MECHANICAL
No discontinuities of 1 microsecond EIA-364-28, Test Condition II.
or longer duration.
Subject mated specimens to 10-
See Note.
500-10 Hz traversed in 15 minutes
with 1.5 mm [.06 in] maximum total
excursion. Two hours in each of 3
mutually perpendicular planes.
No discontinuities of 1 microsecond EIA-364-27, Method H.
or longer duration.
Subject mated specimens to 30 G's
See Note.
half-sine shock pulses of 11
milliseconds duration. Three shocks
in each direction applied along 3
mutually perpendicular planes, 18
total shocks.
See Note.
EIA-364-9.
Mate and unmate specimens for
200 cycles at a maximum rate of
500 cycles per hour.
EIA-364-13.
Measure force necessary to mate
specimens at a maximum rate of
12.7 mm [.5 in] per minute.
EIA-364-13.
Measure force necessary to unmate
specimens at a maximum rate of
12.7 mm [.5 in] per minute.
AMP Spec 109-41.
Measure force necessary to
correctly apply a connector
assembly to a printed circuit board
at a maximum rate of 12.7 mm [.5
in] per minute.
AMP Spec 109-30.
Measure force necessary to unseat
a single pin in a correctly applied
connector assembly from its printed
circuit board hole at a maximum
rate of 12.7 mm [.5 in] per minute.
Temperature rise vs current.
Vibration, sinusoidal.
Mechanical shock.
Durability.
Mating force.
0.75 N [2.7 ozf] maximum per
contact. Average for entire
connector.
0.15 N [.54 ozf] minimum per
contact. Average for entire
connector.
31 N [7 lbf] maximum per pin
average.
Unmating force.
Compliant pin insertion.
Compliant pin retention.
13.35 N [3 lbf] minimum.
Figure 1 (continued)
Rev E
3 of 11
108-2072
Test Description
Minute disturbance.
Requirement
See Note.
Procedure
Unmate and mate specimens a
distance of approximately 0.1 mm
[.004 in].
EIA-364-32, Test Condition VII.
Subject mated specimens to 5
cycles between -55 and 105°C.
EIA-364-31, Method III.
Subject mated specimens to 10
cycles (10 days) between 25 and
65°C at 80 to 100% RH.
EIA-364-17, Method A, Test
Condition 4, Test Time Condition C.
Subject mated specimens to 105°C
for 500 hours.
EIA-364-65, Class IIA (4 gas).
Subject mated and unmated
specimens to environmental Class
IIA for 20 days.
EIA-364-91.
Subject unmated specimens to dust
contamination for 1 hour.
ENVIRONMENTAL
Thermal shock.
See Note.
Humidity/temperature cycling.
See Note.
Temperature life.
See Note.
Mixed flowing gas.
See Note.
Dust contamination.
See Note.
NOTE
Shall meet visual requirements, show no physical damage, and meet requirements of additional tests
as specified in the Product Qualification and Requalification Test Sequence shown in Figure 2.
Figure 1 (end)
Rev E
4 of 11
108-2072
3.6.
Product Qualification and Requalification Test Sequence
A.
Tier 1 Product
Test Group (a)
Test or Examination
Initial examination of product
Low level contact resistance, circuit
Low level contact resistance, compliant pin (c)
Insulation resistance
Withstanding voltage
Temperature rise vs current
Vibration
Mechanical shock
Durability
Mating force
Unmating force
Compliant pin insertion
Compliant pin retention
Minute disturbance
Thermal shock
Humidity-temperature cycling
Temperature life
Mixed flowing gas
Dust contamination
Final examination of product
17
8
19
6
15
21
9
6(e),8(e),11(f),13(f)
10
11
18
18
14
20
15
2,12
8,11
6
2,17
5,16
8
9
4
13
12
3
4
4,18(d)
1
1
3,7,10,15
4,16
5,13
6,14
2
1
3,7,9,12
4,13
14
15
2
3
Test Sequence (b)
1
2,5,7,10
3,11
1
2,5,7,9,12,14,16,19
3,10,17
1
4
5
NOTE
(a)
(b)
(c)
(d)
(e)
(f)
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Compliant pin design requires special test printed circuit board for low level contact
resistance data collection. Separate, parallel test groups to be supplied where this data
is required.
Perform 100 cycles of durability before, and 100 cycles after mixed flowing gas testing.
Exposure interval of 5 days with specimens unmated.
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Analogue and Mixed Signal
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