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GS8160F18DGT-7.5

Description
Static random access memory 1.8/2.5V 1M x 18 18M
Categorysemiconductor    Memory IC    Static random access memory   
File Size212KB,22 Pages
ManufacturerGSI Technology
Websitehttp://www.gsitechnology.com/
Environmental Compliance
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GS8160F18DGT-7.5 Overview

Static random access memory 1.8/2.5V 1M x 18 18M

GS8160F18DGT-7.5 Parametric

Parameter NameAttribute value
MakerGSI Technology
Product Categorystatic random access memory
storage18 Mbit
organize1 M x 18
interview time7.5 ns
Interface TypeParallel
Supply voltage - max.3.6 V
Supply voltage - min.2.3 V
Supply current—max.180 mA
Minimum operating temperature0 C
Maximum operating temperature+ 70 C
Installation styleSMD/SMT
Package/boxTQFP-100
EncapsulationTray
storage typeSDR
seriesGS8160F18DGT
typeFlow Through
Factory packaging quantity18
GS8160F18/32/36DGT-6.5/7.5
100-Pin TQFP
Commercial Temp
Industrial Temp
Features
• Flow Through mode operation
• Single Cycle Deselect (SCD) operation
• 2.5 V or 3.3 V +10%/–10% core power supply
• 2.5 V or 3.3 V I/O supply
• LBO pin for Linear or Interleaved Burst mode
• Internal input resistors on mode pins allow floating mode pins
• Byte Write (BW) and/or Global Write (GW) operation
• Internal self-timed write cycle
• Automatic power-down for portable applications
• RoHS-compliant 100-lead TQFP package available
1M x 18, 512K x 32, 512K x 36
18Mb Sync Burst SRAMs
6.5 ns – 7.5 ns
2.5 V or 3.3 V V
DD
2.5 V or 3.3 V I/O
positive-edge-triggered clock input (CK). Output enable (G)
and power down control (ZZ) are asynchronous inputs. Burst
cycles can be initiated with either ADSP or ADSC inputs. In
Burst mode, subsequent burst addresses are generated
internally and are controlled by ADV. The burst address
counter may be configured to count in either linear or
interleave order with the Linear Burst Order (LBO) input. The
Burst function need not be used. New addresses can be loaded
on every cycle with no degradation of chip performance.
Byte Write and Global Write
Byte write operation is performed by using Byte Write enable
(BW) input combined with one or more individual byte write
signals (Bx). In addition, Global Write (GW) is available for
writing all bytes at one time, regardless of the Byte Write
control inputs.
Sleep Mode
Low power (Sleep mode) is attained through the assertion
(High) of the ZZ signal, or by stopping the clock (CK).
Memory data is retained during Sleep mode.
Core and Interface Voltages
The GS8160F18/32/36DGT operates on a 3.3 V or 2.5 V
power supply. All input are 3.3 V and 2.5 V compatible.
Separate output power (V
DDQ
) pins are used to decouple
output noise from the internal circuits and are 3.3 V and 2.5 V
compatible.
Functional Description
Applications
The GS8160F18/32/36DGT is an 18,874,368-bit high
performance synchronous SRAM with a 2-bit burst address
counter. Although of a type originally developed for Level 2
Cache applications supporting high performance CPUs, the
device now finds application in synchronous SRAM
applications, ranging from DSP main store to networking chip
set support.
Controls
Addresses, data I/Os, chip enables (E1, E2, E3), address burst
control inputs (ADSP, ADSC, ADV), and write control inputs
(Bx, BW, GW) are synchronous and are controlled by a
Parameter Synopsis
t
KQ
tCycle
Curr
(x18)
Curr
(x32/x36)
-6.5
6.5
6.5
205
225
-7.5
7.5
7.5
190
205
Unit
ns
ns
mA
mA
Flow Through
2-1-1-1
Rev: 1.01 10/2013
1/22
© 2013, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.

GS8160F18DGT-7.5 Related Products

GS8160F18DGT-7.5 GS8160F36DGT-7.5 GS8160F36DGT-7.5I GS8160F18DGT-7.5I
Description Static random access memory 1.8/2.5V 1M x 18 18M SRAM 1.8/2.5V 512K x 36 18M SRAM 1.8/2.5V 512K x 36 18M Static random access memory 1.8/2.5V 1M x 18 18M
Maker GSI Technology GSI Technology GSI Technology GSI Technology
organize 1 M x 18 512KX36 512KX36 1 M x 18
Maximum operating temperature + 70 C 85 °C - + 85 C

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