WS57C51C
HIGH SPEED 16K
x
8 CMOS PROM/RPROM
KEY FEATURES
•
Very Fast Access Time
—
35 ns
•
Pin Compatible with Am27S51
and N82HS1281
•
Immune to Latch-Up
—
Up to 200 mA
•
Low Power Consumption
•
Fast Programming
•
ESD Protection Exceeds 2000 V
GENERAL DESCRIPTION
The WS57C51C is a High Performance 128K UV Erasable Electrically Re-Programmable Read Only Memory
(RPROM). It is manufactured in an advanced CMOS technology which enables it to operate at Bipolar PROM
speeds while consuming only 25% of the power required by its Bipolar counterparts.
A further advantage of the WS57C51C over Bipolar PROM devices is the fact that it utilizes a proven EPROM
technology. This enables the entire memory array to be tested for switching characteristics and functionality after
assembly. Unlike devices which cannot be erased, every WS5751C in a windowed package is 100% tested with
worst case test patterns both before and after assembly.
The WS57C51C provides a low power alternative to those designs which are committed to a Bipolar PROM
footprint. It is a direct drop-in replacement for a Bipolar PROM of the same architecture (16K x 8). No software,
hardware or layout changes need be performed.
BLOCK DIAGRAM
EPROM ARRAY
PIN CONFIGURATION
TOP VIEW
Chip Carrier
A
6
A
7
A
8
A
9
V
CC
A
10
A
11
A
9
A
8
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
O
0
O
1
O
2
GND
8
A6 - A13
ROW
ADDRESSES
ROW
DECODER
CERDIP
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V
CC
A10
A11
A12
A13
CS1/VPP
CS2
CS3
CS4
O
7
O
6
O
5
O
4
O
3
131,072 BITS
6
A0 - A5
COLUMN
ADDRESSES
COLUMN
DECODER
SENSE
AMPLIFIERS
CS1/ V
PP
CS2
CS3
CS4
8
A
5
A
4
A
3
A
2
A
1
A
0
NC
O
0
O
1
4 3 2
32 31 30
1
5
29
6
28
7
27
8
26
9
25
10
24
11
23
12
22
13
21
14 15 16 17 18 19 20
O
2
NC
GND
A
12
A
13
CS1/V
PP
CS2
CS3
CS4
NC
O
7
O
6
O
3
NC O
4
O
5
OUTPUTS
PRODUCT SELECTION GUIDE
PARAMETER
Address Access Time (Max)
CS to Output Valid Time (Max)
57C51C-35
35 ns
20 ns
57C51C-45
45 ns
20 ns
57C51C-55
55 ns
25 ns
57C51C-70
70 ns
30 ns
Return to Main Menu
2-47
WS57C51C
ABSOLUTE MAXIMUM RATINGS*
Storage Temperature............................–65° to + 150°C
Voltage on any Pin with
Respect to Ground ....................................–0.6V to +7V
V
PP
with Respect to Ground...................–0.6V to + 14V
ESD Protection ..................................................
>
2000V
MODE SELECTION
PINS
CS1/
MODE
Read
Output
Disable
Output
Disable
Output
Disable
Output
Disable
Program
Program
Verify
VPP CS2 CS3 CS4 V
CC
OUTPUTS
V
IL
V
IH
X
X
X
V
PP
V
IL
V
IL
X
V
IH
X
X
V
IH
V
IL
V
IH
X
X
V
IL
X
X
V
IH
V
IL
X
X
X
V
IH
X
V
IL
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
D
OUT
High Z
High Z
High Z
High Z
D
IN
D
OUT
*
NOTICE:
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of
time may affect device reliability.
OPERATING RANGE
RANGE
Commercial
Industrial
Military
TEMPERATURE
0°C to +70°C
–40°C to +85°C
–55°C to +125°C
V
CC
+5V ± 10%
+5V ± 10%
+5V ± 10%
DC READ CHARACTERISTICS
Over Operating Range. (See Above)
SYMBOL
V
IL
V
IH
V
OL
V
OH
PARAMETER
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
V
CC
Active Current
(CMOS)
(Note 3)
(Note 3)
I
OL
= 16 mA
I
OH
= –4 mA
V
CC
= 5.5 V, f = 0 MHz (Note 1),
Output Not Loaded
Add 4 mA/MHz for AC Operation
V
CC
= 5.5 V, f = 0 MHz (Note 2),
Output Not Loaded
Add 4 mA/MHz for AC Operation
V
IN
= 5.5V or Gnd
V
OUT
= 5.5 V or Gnd
Comm'l
Industrial
Military
Comm'l
Industrial
Military
–10
–10
2.4
30
35
35
50
60
60
10
10
TEST CONDITIONS
MIN
–0.1
2.0
MAX
0.8
V
CC
+ 0.3
0.4
UNITS
V
V
V
V
mA
mA
mA
mA
mA
mA
µA
µA
I
CC1
I
CC2
V
CC
Active Current
(TTL)
Input Leakage
Current
Output Leakage
Current
I
LI
I
LO
NOTES:
1. CMOS inputs: GND ± 0.3V or V
CC
± 0.3V.
2. TTL inputs: V
IL
≤
0.8V, V
IH
≥
2.0V.
3. These are absolute voltages with respect to device ground pin and include all overshoots due to system and/or tester noise.
Do not attempt to test these values without suitable equipment.
2-48
WS57C51C
AC READ CHARACTERISTICS
Over Operating Range. (See Above)
PARAMETER
SYMBOL
57C51C-35
MIN
MAX
57C51C-45
MIN
MAX
57C51C-55
MIN
MAX
57C51C-70
MIN
MAX
UNITS
Address to Output Delay
CS to Output Delay
Output Disable to
Output Float
*
Address to Output Hold
t
ACC
t
CS
t
DF
t
OH
0
35
20
20
0
45
20
20
0
55
25
25
0
70
30
25
ns
*
Sampled, Not 100% Tested.
AC READ TIMING DIAGRAM
ADDRESSES
VALID
t
ACC
t
OH
CSX, CS3
t
CS
OUTPUTS
VALID
t
DF
2-49
WS57C51C
CAPACITANCE
(4)
T
A
= 25°C, f = 1 MHz
SYMBOL
C
IN
C
OUT
C
VPP
PARAMETER
Input Capacitance
Output Capacitance
V
PP
Capacitance
CONDITIONS
V
IN
= 0V
V
OUT
= 0V
V
PP
= 0 V
TYP
(5)
4
8
18
MAX
6
12
25
UNITS
pF
pF
pF
NOTES:
4. This parameter is only sampled and is not 100% tested.
5.Typical values are for T
A
= 25°C and nominal supply voltages.
TEST LOAD
(High Impedance Test Systems)
A.C. TESTING INPUT/OUTPUT WAVEFORM
98
Ω
2.01 V
D.U.T.
3.0
1.5
30 pF
(INCLUDING SCOPE
AND JIG
CAPACITANCE)
0.0
TEST
POINTS
1.5
A.C. testing inputs are driven at 3.0 V for a logic "1" and 0.0 V
for a logic "0." Timing measurements are made at 1.5 V for
input and output transitions in both directions.
NOTE:
6. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.
A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between V
CC
and ground is recommended.
Inadequate decoupling may result in access time degradation or other transient performance failures.
2-50
WS57C51C
NORMALIZED SUPPLY CURRENT
vs.
SUPPLY VOLTAGE
1.60
40.0
35.0
1.40
30.0
NORMALIZED I
CC
DELTA T
aa
(ns)
1.20
25.0
20.0
15.0
10.0
5.0
0.60
4.0
4.5
5.0
5.5
6.0
SUPPLY VOLTAGE ( V )
0.0
TYPICAL ACCESS TIME CHANGE
vs.
OUTPUT LOADING
1.00
0.80
0.0
200
400
600
800
1000
CAPACITANCE ( pF )
NORMALIZED Taa
vs.
AMBIENT TEMPERATURE
1.6
1.2
NORMALIZED SUPPLY CURRENT
vs.
AMBIENT TEMPERATURE
1.4
1.1
NORMALIZED T
aa
1.2
NORMALIZED I
CC
1.0
1.0
0.9
0.8
0.6
-55 -35 -15
5
25
45
65
85
105 125
AMBIENT TEMPERATURE (°C )
0.8
-55 -35 -15
5
25
45
65
85
105 125
AMBIENT TEMPERATURE (°C)
2-51
Analogue and Mixed Signal
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