MMBTA28 datasheet, PDF - EEWORLD Datasheet

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MMBTA28: DescriptionTRANSISTOR (NPN) transistor; CategoryDiscrete semiconductor; File Size443KB，1 Pages; ManufacturerJCET; Websitehttp://www.cj-elec.com/; Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

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TRANSISTOR (NPN) transistor

Features

Product Name: TRANSISTOR (NPN) transistor

Product model: MMBTA28

Product Description:

Darlington Connection for a High hFE

High Input Impedance

parameter:

Polarity: NPN

PCM (collector maximum power consumption): 200mW

Ic (collector current): 500mA

BVcbo (collector-base breakdown voltage): 80V

BVceo (set-to-shoot breakdown voltage): 80V

BVebo (emitter-base breakdown voltage): 12V

hFE (DC current gain): 10K

VCE(sat) (collector-emitter saturation voltage): 1.2V

fT (transition frequency): 125MHz

Package: SOT-23

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JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD

SOT-23 Plastic-Encapsulate Transistors

MMBTA28

FEATURES



High Current Gain

MARKING: 3SS

1. BASE

2. EMITTER

TRANSISTOR (NPN)

SOT–23

MAXIMUM RATINGS (T

=25℃ unless otherwise noted)

Symbol

CBO

CEO

EBO

ΘJA

stg

Parameter

Collector-Base Voltage

Collector-Emitter Voltage

Emitter-Base Voltage

Collector Current

Collector Power Dissipation

Thermal Resistance From Junction To Ambient

Junction Temperature

Storage Temperature

Value

500

200

625

150

-55½+150

Unit

℃/W

℃

3. COLLECTOR

ELECTRICAL CHARACTERISTICS (T

=25℃ unless otherwise specified)

Parameter

Collector-base breakdown voltage

Collector-emitter sustain voltage

Emitter-base breakdown voltage

Collector cut-off current

Emitter cut-off current

DC current gain

Symbol

(BR)CBO

CEO(sus)

(BR)EBO

CBO

CES

EBO

FE(1)

FE(2)

CE(sat)1

CE(sat)2

Test conditions

=100µA, I

=100µA, V

=10µA, I

=60V, I

=60V, V

=10V, I

=5V, I

=10mA

=5V, I

=100mA

=10mA, I

=0.01mA

=100mA, I

=0.1mA

=5V, I

=100mA

=1V, I

=0, f=1MHz

=5V,I

=10mA,

f=100MHz

125

1.2

1.5

Min

0.1

0.5

0.1

Typ

Max

Unit

µA

MHz

Collector-emitter saturation voltage

Base-emitter voltage

Collector output capacitance

Transition frequency

*Pulse test: pulse width ≤300μs,duty cycle≤ 2.0%.

A,Oct,2010

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