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BAT46W

Description
DC reverse withstand voltage (Vr): 100V Average rectified current (Io): 150mA Forward voltage drop (Vf): 1V @ 250mA 100V, 0.15A, VF=1V@250mA
CategoryDiscrete semiconductor    diode   
File Size658KB,4 Pages
ManufacturerJCET
Websitehttp://www.cj-elec.com/

Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); ​​QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

 

 

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BAT46W Overview

DC reverse withstand voltage (Vr): 100V Average rectified current (Io): 150mA Forward voltage drop (Vf): 1V @ 250mA 100V, 0.15A, VF=1V@250mA

BAT46W Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerJCET
Reach Compliance Codeunknown
Is SamacsysN
ConfigurationSINGLE
Diode typeRECTIFIER DIODE
Maximum forward voltage (VF)0.25 V
JESD-609 codee0
Maximum non-repetitive peak forward current0.75 A
Number of components1
Maximum operating temperature125 °C
Maximum output current0.075 A
Maximum repetitive peak reverse voltage100 V
surface mountYES
technologySCHOTTKY
Terminal surfaceTin/Lead (Sn/Pb)
Base Number Matches1

BAT46W Preview

Download Datasheet
JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD
SOD-123 Plastic-Encapsulate Diodes
BA T46W
SCHOTTKY
BARRIER
DIODE
SOD-123
FEATURES
High breakdown voltage
Low turn-on voltage
Guard ring construction for transient protection
+
MARKING: S9
The marking bar indicates the cathode
Solid dot = Green molding compound device,if none,
the normal device.
Maximum Ratings @T
a
=25℃
Parameter
Peak repetitive peak reverse voltage
Working peak reverse voltage
DC blocking voltage
Forward continuous current
Repetitive
peak forward current
(Note 1) @ tp < 1.0s, Duty Cycle < 50%
Non-repetitive Peak
Forward
surge current
@ t =
8.3ms
Power
dissipation
Thermal
resistance junction
to
ambient
air
Junction temperature
Storage temperature
Symbol
V
RRM
V
RWM
V
F
I
R
I
FRM
I
FSM
P
D
R
θJA
T
j
T
STG
Limit
100
150
350
750
500
200
125
-55~+150
Unit
V
mA
mA
mA
mW
℃/W
ELECTRICAL CHARACTERISTICS (Ta=25℃ unless otherwise specified)
Parameter
Reverse breakdown voltage(Note 2)
Symbol
V
R
Test
Conditions
Min
100
0.3
0.5
1
2
0.25
0.45
1
20
12
pF
V
µA
Typ
Max
Unit
V
I
R
= 100µA
V
R1
=1.5V
V
R2
=10V
V
R3
=50V
V
R4
=75V
I
F1
=0.1mA
I
F2
=10mA
I
F3
=250mA
V
R
=0, f=1MHz
V
R
=1V, f=1MHz
Reverse voltage leakage current
I
R
Forward voltage(Note 2)
V
F
Diode capacitance
C
T
Notes: 1. Part mounted on FR-4 board with recommended pad layout.
2. Short duration pulse test used to minimize self-heating effect.
www.cj-elec.com
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