2SA1774 datasheet, PDF - EEWORLD Datasheet

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2SA1774: DescriptionPNP transistor; CategoryDiscrete semiconductor; File Size1MB，2 Pages; ManufacturerJCET; Websitehttp://www.cj-elec.com/; Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

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2SA1774 Overview

PNP transistor

Features

Product Name: PNP Transistor

Product model: 2SA1774

Product parameters:

Pcm (maximum dissipated power): 150mW

Ic (collector current): 150mA

BVcbo (Collector-Base Breakdown Voltage): 60V

BVceo (Collector-Emitter Breakdown Voltage): 50V

BVebo (emitter-base breakdown voltage): 6V

hFE (current gain): Min: 120, Max: 560

VCE (sat) saturation voltage drop: 0.5V

fT (transition frequency): 140+MHz

Package: SOT-523

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JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD

SOT-523 Plastic-Encapsulate Transistors

2SA1774

TRANSISTOR (PNP)

SOT-523

FEATURES

Reduces Board Space

High h

：

120–560

Low V

CE(sat)

< 0.5V

1. BASE

2. EMTTER

3. COLLECTOR

MAXIMUM RATINGS (T

=25℃ unless otherwise noted)

Symbol

Parameter

Value

-60

-50

-6

-150

150

-55-150

Unit

℃

CBO

CEO

EBO

stg

Collector-Base Voltage

Collector-Emitter Voltage

Emitter-Base Voltage

Collector Current -Continuous

Collector Power Dissipation

Junction Temperature

Storage Temperature

ELECTRICAL CHARACTERISTICS (T

=25℃ unless otherwise specified)

Parameter

Collector-base breakdown voltage

Collector-emitter breakdown voltage

Emitter-base breakdown voltage

Collector cut-off current

Emitter cut-off current

DC current gain

Collector-emitter saturation voltage

(1)

Base-emitter saturation voltage

(1)

Transition frequency

Collector output capacitance

(1)

Symbol

(BR)CBO

(BR)CEO

(BR)EBO

CBO

EBO

FE(1)

CE(sat)

BE(sat)

Test conditions

=-50uA, I

=-1.0mA, I

=-50μA, I

=-60V, I

=-6V, I

=-6.0V, I

=-1.0mA

=-50mA, I

=-5.0mA

=-50mA, I

=-5.0mA

=-12V, I

=-2.0mA,f=30MH

=-12V, I

=0, f=1MHz

Min

-60

-50

-6.0

Typ

Max

Unit

-0.1

120

560

-0.5

-1.2

140

3.5

μA

MHz

Pulse Test :Pulse Width

≤300us,D.C ≤

A,May,2011

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