As a manufacturer of thermal analysis instruments, the transient planar heat source method thermal conductivity meter is a common analytical instrument. It mainly uses the thermal conductivity tester developed by transient planar heat source technology (TPS), which can be used for various types of materials. Testing of thermal conductivity properties. It is widely used, mainly used in metals, ceramics, alloys, ores, polymers, composite materials, paper, fabrics, foam plastics (insulation materials with flat surfaces, boards), mineral wool, cement walls, glass reinforced composite panels CRC , cement polystyrene board, sandwich concrete, fiberglass panel composite board and other materials and substances detection.
What is the transient plane heat source method? In fact, the transient plane heat source method is a simple, convenient and fast method to study thermal conductivity performance. It is a new technology that can quickly and accurately measure thermal conductivity when studying materials. The test method is also relatively simple, using thermal resistive material to make a flat probe, which simultaneously serves as a heat source and temperature sensor. The relationship between the thermal resistance coefficient of the alloy, temperature and resistance is linear. That is, the heat loss can be known by understanding the change in resistance, which reflects the thermal conductivity of the sample.
DZDR-S Transient Planar Heat Source Method Thermal Conductivity Meter
There are many models of transient planar heat source method thermal conductivity meters in the current market. So, how to choose? Factors such as the instrument’s testing methods, performance characteristics, and budget costs must be comprehensively considered. List the performance advantages of a DZDR-S transient planar heat source method thermal conductivity meter.
1. The test time is short. The test time can be set from about 5 to 160 seconds, which can quickly and accurately measure the thermal conductivity, saving a lot of time.
2. There are no special requirements for samples. No special sample preparation is required, and there are no special requirements for the sample shape. The bulk solid only needs a relatively smooth sample surface and the length and width are at least twice the diameter of the probe.
3. The probe is designed with a double helix structure, combined with a proprietary mathematical model, and uses core algorithms to analyze and calculate the data collected on the probe.
4. The host's control system uses an ARM microprocessor, which has a faster computing speed than a traditional microprocessor, improves the system's analysis and processing capabilities, and makes the calculation results more accurate.
5. Data collection uses imported data collection chips. The high resolution of this chip can make the test results more accurate and reliable.
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