Tektronix Launches Double Pulse Test Software to Speed ​​Up Power Device Testing

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Tektronix today announced a new software suite for its AFG31000 arbitrary/function generator that performs critical double pulse tests in less than a minute, saving significant time compared to other methods. With the

new Double Pulse Test software, engineers can quickly define pulse parameters from a single window on the AFG31000 display in less than a minute and then generate the pulses needed to perform the test. The application provides impedance adjustment of the pulse width and the time interval between each pulse (up to 30 pulses). Pulse widths range from 20 ns to 150 µs.

“Our AFG31000 makes it easy to set up a test system, quickly change parameters and run a series of test programs, and the new Double Pulse Test plug-in is a perfect example of this,” said Chris Bohn, Tektronix vice president and Keithley product line manager. “This means a huge productivity boost for power engineers, which can save a lot of money and reduce time to market.”

Researchers and design and test engineers in the power and semiconductor industries can use double pulse testing to measure and evaluate the switching parameters and dynamic performance of power devices, including a variety of wide bandgap materials such as silicon carbide and gallium nitride.

To perform double pulse testing, engineers need to accurately generate at least two voltage pulses with different pulse widths and timings to trigger MOSFET or IGBT power devices, using an oscilloscope such as the Tektronix 5 Series MSO for measurement. However, generating these pulses has been a challenge with today’s test equipment, forcing researchers and engineers to manually create waveforms using a PC or microcontroller, a time-consuming and error-prone approach.

AFG31000 Redefines Arbitrary/Function GeneratorsLaunched

last year, the AFG31000 redefined arbitrary/function generators with industry firsts in its class, including the largest touchscreen, a new user interface, patented InstaView™ technology features that automatically detect and compensate for impedance matching, programmable waveform sequencing, and the new ArbBuilder tool for easy creation and editing of arbitrary waveforms.The

AFG31000 series instruments feature a 9-inch touchscreen display, are available in 1 or 2 channel configurations, and offer 14-bit vertical resolution and sample rate performance of 250 MSa/s, 1 GSa/s, or 2 GSa/s.

Keywords:Tektronix Reference address:Tektronix Launches Double Pulse Test Software to Speed ​​Up Power Device Testing

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