1 Introduction
Digital signal processing technology provides engineers with great flexibility in developing special analog and mixed-signal applications. However, this increased flexibility also increases the possibility that engineers will have defects that are not easy to find when developing test programs, thereby reducing test performance.
2 Make sampling technology consistent with test frequency requirements
When performing analog DSP tests, engineers rely on complex correlated sampling techniques to ensure that the sampling and test frequencies are consistent. To achieve correlated sampling, the optimal solution that meets the following formula is required:
Where: M is the number of cycles in the sampling window; N is the number of sampling points; Ft is the test frequency; Fs is the sampling frequency.
To meet this formula, the test program writer must consider various restrictions: the ratio of M/N must be a prime number, and N must be an integer power of 2 to ensure correlation using fast Fourier transform technology. At the same time, N must be large enough to provide the required resolution, but not too large otherwise the test time will be too long. In addition, the correct solution must also address the physical limitations of the test equipment, such as special restrictions on sampling frequency or upper limits on resolution. The test frequency must take into account various possibilities, such as multi-harmonic testing. In addition, the choice of test frequency must take into account the FFT method, and different test frequency selections will make the results very complicated.
In the past, test engineers relied on spreadsheets or manual calculations to determine sampling parameters. This manual labor actually forced engineers to focus on parameter selection issues. And this manual method becomes very difficult when the test criteria include undersampling or oversampling methods. Even in simpler cases, this trial-and-error method makes engineers consider whether there are better parameter settings that can test more efficiently.
3 Use new software tools to determine sampling frequency and high-speed instrument settings
The unique frequency calculation tool (FCT) provided by leading ATE suppliers (such as Credence) is an interactive software tool that can help test program developers determine the sampling frequency in analog tests (Figure 1). FCT is a program development software tool in Credence's OctetTM system. The tool can calculate different solutions to avoid N values that are too large or too small within the test system's capabilities. Therefore, FCT can find the best combination of parameter settings based on the test system configuration and specific application. With these parameter settings, test engineers can simply drag and drop parameter values into Octet's Analog Waveform Tool (AWT) to generate waveforms.
In addition, Credence's Instrument Setup Tool (IST) simplifies test program development and high-speed instrument setup. In traditional systems, engineers need to understand the detailed commands of each instrument configured in the test system to develop test programs. IST eliminates this tedious work. Since IST stores information about the limitations and capabilities of the system instruments, the tool can provide a simple interactive method for generating C program code. During test program development, test engineers fill out a table in IST to describe the expected waveform. The parameter setting, signal capture and analysis required to generate the waveform are completed by IST. Test program developers no longer need to master the commands and programming mechanisms of different instruments, and can focus on higher-level test applications and optimize test methods .
4 Conclusion
Through automatic analysis methods, new software tools such as FCT can help test engineers save manual labor and get better test results. In addition to tools such as FCT and IST, leading ATE companies such as Credence are constantly strengthening the capabilities of test software to improve test productivity and quality.
Reference address:The Feature Frequency Computation Tool (FCT) simplifies test program development
Digital signal processing technology provides engineers with great flexibility in developing special analog and mixed-signal applications. However, this increased flexibility also increases the possibility that engineers will have defects that are not easy to find when developing test programs, thereby reducing test performance.
2 Make sampling technology consistent with test frequency requirements
When performing analog DSP tests, engineers rely on complex correlated sampling techniques to ensure that the sampling and test frequencies are consistent. To achieve correlated sampling, the optimal solution that meets the following formula is required:
Where: M is the number of cycles in the sampling window; N is the number of sampling points; Ft is the test frequency; Fs is the sampling frequency.
To meet this formula, the test program writer must consider various restrictions: the ratio of M/N must be a prime number, and N must be an integer power of 2 to ensure correlation using fast Fourier transform technology. At the same time, N must be large enough to provide the required resolution, but not too large otherwise the test time will be too long. In addition, the correct solution must also address the physical limitations of the test equipment, such as special restrictions on sampling frequency or upper limits on resolution. The test frequency must take into account various possibilities, such as multi-harmonic testing. In addition, the choice of test frequency must take into account the FFT method, and different test frequency selections will make the results very complicated.
In the past, test engineers relied on spreadsheets or manual calculations to determine sampling parameters. This manual labor actually forced engineers to focus on parameter selection issues. And this manual method becomes very difficult when the test criteria include undersampling or oversampling methods. Even in simpler cases, this trial-and-error method makes engineers consider whether there are better parameter settings that can test more efficiently.
3 Use new software tools to determine sampling frequency and high-speed instrument settings
The unique frequency calculation tool (FCT) provided by leading ATE suppliers (such as Credence) is an interactive software tool that can help test program developers determine the sampling frequency in analog tests (Figure 1). FCT is a program development software tool in Credence's OctetTM system. The tool can calculate different solutions to avoid N values that are too large or too small within the test system's capabilities. Therefore, FCT can find the best combination of parameter settings based on the test system configuration and specific application. With these parameter settings, test engineers can simply drag and drop parameter values into Octet's Analog Waveform Tool (AWT) to generate waveforms.
|
In addition, Credence's Instrument Setup Tool (IST) simplifies test program development and high-speed instrument setup. In traditional systems, engineers need to understand the detailed commands of each instrument configured in the test system to develop test programs. IST eliminates this tedious work. Since IST stores information about the limitations and capabilities of the system instruments, the tool can provide a simple interactive method for generating C program code. During test program development, test engineers fill out a table in IST to describe the expected waveform. The parameter setting, signal capture and analysis required to generate the waveform are completed by IST. Test program developers no longer need to master the commands and programming mechanisms of different instruments, and can focus on higher-level test applications and optimize test methods .
4 Conclusion
Through automatic analysis methods, new software tools such as FCT can help test engineers save manual labor and get better test results. In addition to tools such as FCT and IST, leading ATE companies such as Credence are constantly strengthening the capabilities of test software to improve test productivity and quality.
Previous article:Digital waveform generator for measuring changes in resonant frequency of a resistive sensor
Next article:Application of AD7677 in DC Measurement System of Transmitter Calibration Device
Recommended Content
Latest Test Measurement Articles
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- From probes to power supplies, Tektronix is leading the way in comprehensive innovation in power electronics testing
- Seizing the Opportunities in the Chinese Application Market: NI's Challenges and Answers
- Tektronix Launches Breakthrough Power Measurement Tools to Accelerate Innovation as Global Electrification Accelerates
- Not all oscilloscopes are created equal: Why ADCs and low noise floor matter
- Enable TekHSI high-speed interface function to accelerate the remote transmission of waveform data
- How to measure the quality of soft start thyristor
- How to use a multimeter to judge whether a soft starter is good or bad
- What are the advantages and disadvantages of non-contact temperature sensors?
MoreSelected Circuit Diagrams
MorePopular Articles
- Innolux's intelligent steer-by-wire solution makes cars smarter and safer
- 8051 MCU - Parity Check
- How to efficiently balance the sensitivity of tactile sensing interfaces
- What should I do if the servo motor shakes? What causes the servo motor to shake quickly?
- 【Brushless Motor】Analysis of three-phase BLDC motor and sharing of two popular development boards
- Midea Industrial Technology's subsidiaries Clou Electronics and Hekang New Energy jointly appeared at the Munich Battery Energy Storage Exhibition and Solar Energy Exhibition
- Guoxin Sichen | Application of ferroelectric memory PB85RS2MC in power battery management, with a capacity of 2M
- Analysis of common faults of frequency converter
- In a head-on competition with Qualcomm, what kind of cockpit products has Intel come up with?
- Dalian Rongke's all-vanadium liquid flow battery energy storage equipment industrialization project has entered the sprint stage before production
MoreDaily News
- Allegro MicroSystems Introduces Advanced Magnetic and Inductive Position Sensing Solutions at Electronica 2024
- Car key in the left hand, liveness detection radar in the right hand, UWB is imperative for cars!
- After a decade of rapid development, domestic CIS has entered the market
- Aegis Dagger Battery + Thor EM-i Super Hybrid, Geely New Energy has thrown out two "king bombs"
- A brief discussion on functional safety - fault, error, and failure
- In the smart car 2.0 cycle, these core industry chains are facing major opportunities!
- The United States and Japan are developing new batteries. CATL faces challenges? How should China's new energy battery industry respond?
- Murata launches high-precision 6-axis inertial sensor for automobiles
- Ford patents pre-charge alarm to help save costs and respond to emergencies
- New real-time microcontroller system from Texas Instruments enables smarter processing in automotive and industrial applications
Guess you like
- Application of BTB connector and the role of high current spring micro-needle module
- This week's highlights
- GD32E230C Test 3: Is the MCU running memory insufficient in this case?
- Two classic circuit examples of serial port power supply
- EEWORLD University Hall----Live Replay: How to use Infineon IGBT7 to design high-performance servo drives
- Can cc2530 turn off NV?
- 【TGF4042 Signal Generator】+ Bandwidth Test
- [ATmega4809 Curiosity Nano Review] Using the printf function
- [Raspberry Pi Pico Review] ADC Acquisition
- Help, find a foreign literature