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Multifunctional Boundary Scan Controller Based on VXI Bus

2013-09-18
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According to the application requirements of system-level boundary scan test technology, the multifunctional boundary scan test controller based on VXI bus has three operation modes: IEEE1149.1 TAP mode, IEEE1149.5 master controller mode and slave controller mode. The host computer controls the module to be configured to the desired mode, and the TAP port controller on the module generates 1149.1 test signals and provides them to the JTAG port for boundary scan testing of the target board under test through the TDO/TDI scan chain. The IEEE1149.5 master controller can complete the communication with the slave controller to perform boundary scan testing on the testability module at the chassis or subsystem level. The automatic test vector generation software compatible with BSDL and EDIF file formats can realize a variety of scan test functions.

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