rar

Design of pipeline ADC for low noise CMOS image sensor and its imaging verification

  • 2013-09-22
  • 1.25MB
  • Points it Requires : 2

  In the research of low-noise CMOS image sensors, in addition to paying attention to its noise, digitalization is also an important research and design direction. A 12-bit, 10 Msps pipeline ADC that can be used for low-noise CMOS image sensors is designed and taped out based on the 0.5 μm standard CMOS process. Finally, the analog-to-digital conversion of the low-noise CMOS image sensor with analog output is realized on the PCB test board using the ADC designed in this paper, and imaging verification is carried out based on the independently developed imaging test system. The results show that the imaging picture is clear and the ADC can be used as a chip-level analog-to-digital converter for low-noise CMOS image sensors.

unfold

You Might Like

Uploader
sinceyoulove
 

Recommended ContentMore

Popular Components

Just Take a LookMore

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

About Us Customer Service Contact Information Datasheet Sitemap LatestNews


Room 1530, 15th Floor, Building B, No.18 Zhongguancun Street, Haidian District, Beijing, Postal Code: 100190 China Telephone: 008610 8235 0740

Copyright © 2005-2024 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号
×