A New Testing Concept for Chip Design Li Jintie and Liu Yang, Shanghai Branch of Advantest (Suzhou Co., Ltd.) Abstract: The development of SoC chips has made integrated circuit testing increasingly important, and traditional testing concepts are no longer applicable to current and future integrated circuit testing needs. This article will analyze this issue in detail, list the problems faced in integrated circuit testing, introduce a new testing concept for chip design, and introduce a series of new solutions based on this concept, corresponding to the needs of rapid response to the market and the needs of improving the quality of new products. Keywords: Testing for chip design, EDA-Linkage, rapid response to the market, improving the quality of new products
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