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Overview of VLSI Testing

  • 2013-09-19
  • 338.59KB
  • Points it Requires : 2

Based on the review of basic VLSI test methods and testability design technology, this paper briefly introduces the testability design and test methods of core-based system-on-chip. Finally, by analyzing the impact of the development of integrated circuit design and manufacturing technology on testing, the development direction of VLSI/SOC test technology is prospected.

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