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Semiconductor reliability test data (including environmental test items and concepts) Free

  • 2013-09-29
  • 1.02MB
  • Points it Requires : 2

              Reliability5_Testing_MBRELIABILITY TESTING OF SEMICONDUCTOR DEVICESV. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES1. WHAT IS RELIABILITY TESTING? 2. RELIABILITY TEST METHODS 3. ACCELERATED LIFE TEST 4. ANALYSIS OF TEST RESULTS4.1 HOW TO USE WEIBULL PROBABILITY PAPER 3. 3. 3. 3. 3. 4.1.1 APPLICATION OF WEIBULL PROBABILITY PAPER 4.1.2 FORMAT OF WEIBULL PROBABILITY PAPER 4.1.3 PRINCIPLE 4.1.4 PROCEDURE FOR USE 4.1.5 INTERPRETATIONS OF WEIBULL PLOTTING 4.2 HOW TO USE CUMULATIVE HAZARD PAPER 3. 3. 3. 3. 4.2.1 APPLICATION OF CUMULATIVE HAZARD PAPER 4.2.2 FORMAT OF WEIBULL TYPE CUMULATIVE HAZARD PAPER 4.2.3 PRINCIPLE 4.2.4 PROCEDURE FOR USE 4.3 PROCEDURE FOR FAILURE RATE PREDICTION 3. WITH 60% CONFIDENCE LEVELRELIABILITY TESTING OF SEMICONDUCTOR DEVICESV. RELIABILITY TESTING OF SEMICONDUCTOR DEVICES1. WHAT IS……             

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