Under contract with Signetics, Mr. Thomas J. Chaney of WashingtonUniversity, St. Louis tested a set of nineteen 74F786 samples(packages) to determine the metastable state recovery statistics forthe circuits. The tests were conducted using a procedure describedin a paper entitled “Characterization and Scaling of MOS Flip-FlopPerformance”, (section IV), by T. Chaney and F. Rosenberger,
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