zip

Research on Dimension Measurement Based on Linear CCD

  • 2014-03-05
  • 521.99KB
  • Points it Requires : 2

In today\'s domestic industry, the measurement of dimensions is mostly carried out by backward contact methods such as micrometers, which are not only inefficient but also inaccurate. This paper discusses the very effective non-contact detection technology of linear array CCD for dimension measurement. This measurement system is composed of chips such as 89C2051, TCD1206UD and ICL7135, and completes the processes from lighting, imaging, data processing to display. This design is stable and reliable, with high measurement accuracy, and is suitable for various high-sensitivity and high-precision detection. In addition, this system includes an LED display, which is not only cheap, but also convenient and visible for measurement results, increasing the practicality of this design.

unfold

You Might Like

Uploader
jasionla
 

Recommended ContentMore

Popular Components

Just Take a LookMore

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

About Us Customer Service Contact Information Datasheet Sitemap LatestNews


Room 1530, 15th Floor, Building B, No.18 Zhongguancun Street, Haidian District, Beijing, Postal Code: 100190 China Telephone: 008610 8235 0740

Copyright © 2005-2024 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号
×