EEWORLDEEWORLDEEWORLD

Part Number

Search

PACDN044M

Description
UNIDIRECTIONAL, 6 ELEMENT, SILICON, TVS DIODE
Categorysemiconductor    Discrete semiconductor   
File Size84KB,2 Pages
ManufacturerCALMIRCO
Websitehttp://www.calmicro.com/
Download Datasheet View All

PACDN044M Overview

UNIDIRECTIONAL, 6 ELEMENT, SILICON, TVS DIODE

CALIFORNIA MICRO DEVICES
PACDN042/043/
044/045/046
TRANSIENT VOLTAGE SUPPRESSOR ARRAYS
Features
• 2, 3, 4, 5, or 6 transient voltage suppressors in a single
surface-mount package.
• Compact SMT packages save board space and ease
layout in space critical applications compared to
discrete solutions.
• In-system ESD protection to 20kV contact discharge
per IEC 61000-4-2 International Standard.
Product Description
The PACDN042, PACDN043, PACDN044, PACDN045, and PACDN046 are transient voltage suppressor arrays that provide a very
high level of protection for sensitive electronic components that may be subjected to electrostatic discharge (ESD). The devices
are designed and characterized to safely dissipate ESD strikes at levels well beyond the maximum requirements set forth in the
IEC 61000-4-2 International Standard (Level 4, 8kV contact discharge). All pins are rated at 20kV ESD using the IEC 61000-4-
2 contact discharge method.
Using the MIL-STD-883D (Method 3015) specification for Human Body Model (HBM) ESD, all pins are protected for contact
discharges to greater than 30kV.
Schematic Configurations
Applications
• ESD protection of PC ports, e.g. USB port.
• Protection of interface ports or IC pins
which are exposed to high levels of ESD.
Parameter
Reverse Stand-off Voltage, I = 10uA
Signal Clamp Voltage:
Positive Clamp, 10mA
Negative Clamp, 10mA
In-system ESD withstand voltage*:
Human Body Model (MIL-STD-883D, method 3015)
IEC 61000-4-2, contact discharge method
Clamping voltage during ESD discharge
Positive
MIL-STD-883D (Method 3015), 8kV
Negative
Capacitance @ 2.5V dc, 1 MHz
Temperature Range:
Operating
Storage
Package Power Rating: SOT23, SOT23-5, SOT-143
TSSOP, MSOP
STANDARD SPECIFICATIONS
Min.
5.5
5.6
-1.2
±30
±20
Typ.
Max.
Unit
V
V
V
kV
kV
V
V
pF
6.8
-0.8
8.0
-0.4
12
-8
30
-40
-65
85
150
0.225
0.5
°C
W
W
* ESD applied between channel pin and ground, one at a time. All other channels are open. All GND pins grounded.
This parameter is guaranteed by design and characterization..
Note: ‘GND’ in this document refers to the lower supply voltage.
© 2000 California Micro Devices Corp. All rights reserved.
8/25/2000
C1470800
215 Topaz Street, Milpitas, California 95035
Tel: (408) 263-3214
Fax: (408) 263-7846
www.calmicro.com
1
I would like to ask, how is the transformer in a single-tube transformer-coupled amplifier magnetically reset?
As shown in the figure, this single-tube power amplifier is coupled through a transformer, and the transformer works in the first quadrant. How is it magnetically reset? If Vi is a square wave with a ...
xztl Analog electronics
A brief description of the stack structure in the ZigBee standard
The ZigBee standard defines a stack protocol that ensures interoperability of wireless devices in low-cost, low-power, and low-data-rate networks. This article briefly describes the ZigBee stack struc...
灞波儿奔 RF/Wirelessly
Guess: What is the origin of the code name of the open source "Wanli" Raspberry Pi car that went viral yesterday?
When I came to the forum yesterday, I found that @lb8820265 , who had not appeared in the arena for a long time, had a burst of updates, 12 updates, screen-sweeping style~Each title has the "Wanli" Ra...
nmg DIY/Open Source Hardware
[Silicon Labs Development Kit Review] +Si7021 Temperature and Humidity Sensor Detection
[i=s]This post was last edited by yin_wu_qing on 2021-9-6 09:50[/i]As mentioned in the previous post, the development board integrates the Si7021 temperature and humidity sensor, which uses the IIC in...
yin_wu_qing Development Kits Review Area
RISC-V RVB2601 first experience--Section 3--IO simulation serial port completed
RVB 2601 IO emulation serial port is done. 1. PA4 as TX, PA7 as RXThese two IOs are only used to drive LEDs on the board. In addition, any IO of this chip can be set to have no external interrupt func...
qq4988 XuanTie RISC-V Activity Zone
Talk to a VICOR engineer about your design and how to improve your AT equipment throughput and uptime.
Factories’ demand for more efficient testing capabilities continues to increaseSemiconductor manufacturers are placing greater demands on automatic test equipment (ATE) companies to quickly and reliab...
eric_wang Test/Measurement

Technical ResourceMore

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2024 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号