Multilayer Ceramic Capacitors
Series/Type:
B37941
The following products presented in this data sheet are being withdrawn.
Ordering Code
B37931A0224K060
B37931A0224K070
B37941A0224K060
Substitute Product
Date of Withdrawal
2008-08-01
2008-08-01
2008-08-01
Deadline Last
Orders
2009-07-31
2009-07-31
2009-07-31
Last Shipments
2009-10-31
2009-10-31
2009-10-31
Ordering Code
B37941A0224K070
B37941A0474K060
B37941A0474K070
B37941A0105K062
B37941A0105K072
Substitute Product
Date of Withdrawal
2008-08-01
2008-08-01
2008-08-01
2008-08-01
2008-08-01
Deadline Last
Orders
2009-07-31
2009-07-31
2009-07-31
2009-07-31
2009-07-31
Last Shipments
2009-10-31
2009-10-31
2009-10-31
2009-10-31
2009-10-31
For further information please contact your nearest EPCOS sales office, which will also support you in selecting a
suitable substitute. The addresses of our worldwide sales network are presented at www.epcos.com/sales.
Multilayer ceramic capacitors
Advanced series
General
Criteria for high reliability
Chip
For both OEMs and component manufacturers, high reliability is assured by consistent process
control. If it is assumed that the component manufacturer supplies a defect-free product, then fur-
ther correct processing by the customer forms the basis for perfect operation of the components
and thus the entire application. So the precondition for high quality is not exclusively a particular
“intermediate product“ (such as the ceramic capacitor) but rather the process control along the
entire production chain up to its end point. This requires a high degree of mutual process under-
standing between the various partners (e.g. component manufacturer and placement operator) and
the formulation of joint quality guidelines.
AEC-Q200 is a standard for quality requirements on components in various technologies. In view
of its general character, AEC-Q200 does not apply to every component to the same extent and thus
defines a minimum requirement on quality. AEC-Q200 stipulates the observance of limits that can
be checked by means of a good/bad decision. It therefore permits a qualitative statement but not a
quantitative one. However, it is precisely the latter that is important if we wish to approach “zero
defects”. So process control moves to center stage and becomes the decisive element for ensuring
and continuously improving the maximum possible reliability.
EPCOS has implemented this paradigm change and thus laid the foundation for a zero defect strat-
egy. This concept is integrated in the “ppb level assurance system“ and is particularly realized and
continuously developed further in the Advanced series.
The requirements made on the Advanced series exceed those of AEC-Q200. The criteria are clearly
oriented to the aim of achieving “zero defects”. An important precondition for high component reli-
ability is the production of the ceramic powder at our own plant. Only by knowing all the inter-
relationships and effects from the raw material to the completed component can the self-imposed
quality criteria actually be implemented in all production steps. EPCOS has been developing and
manufacturing its own ceramic powder for ceramic capacitors for many years so that the component
quality can be assured from the first step of manufacture.
ppb level assurance system
The precondition for reliability at ppb level is, apart from process knowledge, a high degree of pro-
cess control. To achieve this, the entire production process is subdivided systematically into sub-
processes that are continuously checked with static methods on the basis of quantifiable parame-
ters. These analysis methods are used by EPCOS within the scope of the Advanced series for all
production steps from ceramic powder production and component design up to the 100% electrical
testing.
Please read
Cautions and warnings
and
Important notes
at the end of this document.
2
10/06
Multilayer ceramic capacitors
Advanced series
In summary, the ppb level assurance system involves the following points:
Chip
■
Statistical methods for component design and process control
■
Use of the Weibull method for statistical data analysis
■
Introduction of quantifiable parameters (such as the failure time) to replace the previous “good”
■
■
■
■
■
■
or “bad” decisions
Dynamic test limits as a complement to fixed limits in the 100% electrical test
(capacitance C, loss factor tan
d
, insulation resistance R
ins
)
Periodic check of the solder-shock resistance at 360
°
C, followed by a burn-in test or HALT
Periodic check of the bending strength by the rigorous piezoelectric method (
D
I measurement)
for X7R
A more accurate characterization of the mechanical properties by eliminating impacting factors
by taking measurements on the sintered component
100% automatic optical inspection (AOI)
Ultrasound analysis allowing an internal defect in the ceramic capacitor to be detected in a non-
destructive way
High temperature application:
The listed Advanced series types can be used at 100% rated DC voltage up to 125 °C. Operation
of Advanced capacitors at temperatures >125 °C up to 150 °C is permissible if the applied voltage
is reduced according to the derating diagram below proceeding from a stress level of 100% rated
voltage at 125 °C.
Note:
To achieve highest reliability levels it is generally recommended not to operate ceramic capacitors
continuously at 100% rated voltage. Please see chapter “Reliability” for recommended operating
voltage and calculation of failure rates.
100
%
90
Maximum allowed DC voltage (V/V
R
)
KKE0433-M-E
C0G and X7R NME
80
X7R BME and HighCV
70
60
50
125
130
135
140
145
˚
C
T
150
Please read
Cautions and warnings
and
Important notes
at the end of this document.
3
10/06
Multilayer ceramic capacitors
Advanced series; C0G
Ordering code system
Chip
B37940
A
5
010
C
5
60
Packaging
60
62
70
72
^
^
^
^
cardboard tape, 180-mm reel
blister tape, 180-mm reel
cardboard tape, 330-mm reel
blister tape, 330-mm reel
Decimal place
for cap. values <10 pF, otherwise 0
Capacitance tolerance
C
R
<10 pF:
C
R
³10
pF:
C
^
±0.25
pF (standard for capacitance values
<10
pF)
J
^
±
5% (standard)
Capacitance,
coded
(example)
010
^
1 · 10
0
pF = 1 pF
100
^
10 · 10
0
pF = 10 pF
221
^
22 · 10
1
pF = 220 pF
50
5
100
1
Rated voltage
Rated voltage [VDC]
Code
Internal coding
“A” indicates Advanced series
Type and size
Chip size
(inch / mm)
0402
/ 1005
0603
/ 1608
0805
/ 2012
1206
/ 3216
Temperature characteristic
C0G
B37920
B37930
B37940
B37871
Please read
Cautions and warnings
and
Important notes
at the end of this document.
4
10/06
MCU
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