Tantalum Chip Capacitors
TCFG Series / TCFP Series
I
ntroduction
The Tantalum capacitors are manufactured with Rohm's unique technology that
provides a class of devices that are highly reliable. They are extremely compact
to allow for high density mounting on printed circuit boards.
The Tantalum capacitors are manufactured in a variety of forms, sizes, and
characteristics to satisfy our most demanding customers. All series of the Rohm
capacitors can be supplied on tapes for use in automated assembly lines.
P Type
(2012)
A Type
(3216)
TCFG series
standard series
Tantalum chip
capacitors
Chip style
TCFP series
High Reliability
B Type
(3528)
Rated Table
TCFG series
Capacitance code
P case
W5
A6
E6
J6
N6
S6
W6
A7
E7
J7
N7
S7
W7
A8
A B case
685
105
155
225
335
475
685
106
156
226
336
476
686
107
Capacitance
F
0.68
1.0
1.5
2.2
3.3
4.7
6.8
10
15
22
33
47
68
100
P
P
A
A
A
A,B
B
B
B
P
P
A
A
A
A,B
B
B
P
A
A
A
A,B
A,B
A,B
B
A
A
A
B
B
B
B
A
4
0G
Rated Voltage (V.DC)
6.3
0J
10
1A
16
1C
20
1D
TCFP series
Capacitance code
A B case
684
105
155
225
335
475
685
106
156
226
336
476
686
107
Capacitance
F
0.68
1.0
1.5
2.2
3.3
4.7
6.8
10
15
22
33
47
68
100
A
A
B
B
B
A
A
B
B
B
A
A
B
B
B
A
A
A
B
B
B
4
0G
Rated Voltage (V.DC)
6.3
0J
10
1A
16
1C
20
1D
Marking
P case
(2012)
Voltage code
Capacitance code
A case
(3216)
Voltage code
Capacitance code
B case
(3528)
Voltage code
Capacitance code
AA6
ZAA
C105
ZAA
10
6.3V
ZAA
note
P case (2012), A case (3216), B case (3528) means case code (package size).
1
Tantalum Chip Capacitors
TCFG Series / TCFP Series
Packaging Details
Rohm's tantalum chip capacitors are avaliable in the TCFG
the following packages :
Product
P (2012)
TCFG
TCFP
A (3216)
B (3528)
Plastic tape
Packaging Type
180mm (7 in.) reel
180mm (7 in.) reel
180mm (7 in.) reel
TCFP series of products. These capacitors are available in
Code
8R
1
8R
1
8R
1
No. pkg
2,000
2,000
2,000
Std or Semi
std pkg
std
std
std
note 1 : 8R package has capacitors mounted with positive pole on the right when viewed from the pull-direction of the tape on the reel.
The following illustration shows how these products are packaged.
(Unit : mm)
Case code
P (2012)
A (3216)
B (3528)
Tolerance
A
1.35
1.9
3.2
0.1
B
2.2
3.5
3.8
0.1
W
8.0
8.0
8.0
0.2
E
1.75
1.75
1.75
0.1
F
3.5
3.5
3.5
0.05
P
1
4.0
4.0
4.0
0.1
P
2
2.0
2.0
2.0
0.05
P
0
4.0
4.0
4.0
0.1
D
0
1.5
1.5
1.5
0.1
0
t
1
0.25
0.25
0.25
0.05
t
2
1.3
1.9
2.1
0.1
2
Performance and Test Methods for the TCFG / TCFP Series (Sheet 1 of 2)
Parameter
Operating temp. range
Rated voltage (V DC)
Derated voltage at
Surge voltage
125
4
2.5
5.2
6.3
4
8
Performance Characteristics
Test Condition
Voltage must be derated when temperature exceeds
85
55
10
6.3
13
125
16
10
20
20
16
26
(Withstanding voltage)
TCFG Series
Impedance
TCFP Series
P case : Max. 27.5
A case : Max. 20.0
B case : Max. 15.0
Refer to table 2
100kHz
Measure value using following circuit :
Leakage current
After 1 min of applying rated voltage,
leakage current is less than 0.01 cv or
0.5 A, whichever is greater
Capacitance tolerance
K
M
10
20
Frequency 120 12Hz
Voltage 0.5 Vrms at 1.5 2.0 V dc in a DC equalizing circuit
Dielectric loss tangent (tan
)
P case : 1 3.3 F Max. 8
A case :
1 F Max. 4
1.5 22 F Max. 6
B case : 3.3 47 F Max. 6
No mechanical damage
Capacitance remains within tolerance
Frequency 120 12Hz
Voltage 0.5 Vrms at 1.5 2.0 V dc in a DC equalizing circuit
Terminal strength
Apply a force that causes the capacitor to bend 1
Measure capacitance after removing force.
2
0
fmm for 5s
Shear force
A specimen is soldered onto an
No mechanical damage to capacitor
alumina substrate and a force
No peeling or sign of peeling on
of 500 gf (5 N) is applied for
terminals. Capacitance remains within 10 s as shown :
tolerance and dF is within specification
Appearance
Capacitance change
No mechanical damage
P case
:
A B case :
10 or less
5 or less
TCF series 5 cycles, TCFP series 100 cycles as follows :
55 3 for 30 3 min
Step 1
Step 2 room temp for 3 min
125 2 for 30 3 min
Step 3
Step 4 room temp for 3 min
Thermal cycling
tan
P case : Satisfied 150 initial speci-
fied tolerance
A B case : Satisfied initial specified
tolerance
Leakage current
Satisfies initial specified tolerance
3
Tantalum Chip Capacitors
TCFG Series / TCFP Series
Performance and Test Methods for the TCFG / TCFP Series (Sheet 2 of 2)
Parameter
Capacitance change
tan
Leakage current
Capacitance change
Temparature
stability
tan
Leakage current
Capacitance change
tan
Leakage current
Performance Characteristics
Test Condition
Thermal equilibrium at
55
0
3
P case :
0
15
A B case :
0
12
For less than 1 F : 0.06 or less
For 1.5 F 47 F : 0.08 or less
Satisfies initial specified tolerance
P case :
15
0
A B case :
0
12
(thermal equilibrium defined as when electrostatic capacity
does not change between two measurements made 15 min
apart)
For less than 1 F : 0.04 or less
For 1.5 F 47 F : 0.06 or less
10 times or less of initial specified
tolerance
P case :
20
0
A B case :
0
12
Thermal equilibrium at
85
3
0
For less than 1 F : 0.06 or less
For 1.5 F 47 F : 0.08 or less
12.5 times or less of initial specified
tolerance
75
Thermal equilibrium at
125
3
0
of the surface of both terminals is covered evenly in new solder with no breaks in the surface
Appearance
Capacitance change
tan
Leakage current
Appearance
Capacitance change
Solderability :
Resistance to
solder heat
tan
Leakage current
Appearance
Capacitance change
tan
Leakage current
No mechanical damage
5
or less
Method 1 (Solder iron)
Solder temp : 300 5
Immersion time : 3 0.5 s
Solder iron output : 30W,
Capacitance measured after 1 2 hr at room temperature
Satisfies initial specified tolerance
Satisfies initial specified tolerance
No mechanical damage
P case
:
A B case :
10
5
or less
or less
Satisfies initial specified tolerance
Satisfies initial specified tolerance
No mechanical damage
3
or less
Method 2 (Dip in solder bath)
Solder temp : 260 5
Immersion time : TCF series 5 0.5 s
: TCFP series 10 0.5 s
Repetition : 1,
Capacitance measured after 1 2 hr at room temperature
Satisfies initial specified tolerance
Satisfies initial specified tolerance
Method 3 (Reflow method)
Solder temp : 230 240
Time : 5 10 s
Capacitance measured after 1 2 hr at room temperature
4
Parameter
Appearance
Capacitance change
Humidity
resistance
Performance Characteristics
Test Condition
No mechanical damage
P case
:
A B case :
20
10
or less
or less
tan
P case : Satisfied 150 initial speci-
fied tolerance
A B case : Satisfied initial specified
tolerance
Satisfies initial specified tolerance
Temperature : 60 2
Relative humidity : 80 95
Applied voltage : Rated voltage
Test time : 500
12
hr,
0
Capacitance measured after 1 2 hr at room temperature
Leakage current
Appearance
High
temperature
life test
Capacitance change
tan
Leakage current
Appearance
Capacitance change
Surge voltage
resistance
I
No mechanical damage
10
or less
Temperature : 85 2
Applied voltage : Rated voltage by way of 3 serial resistor
or less
72
Test time : 2000
0
hr,
Capacitance measured after 1 2 hr at room temperature
Satisfies initial specified tolerance
Satisfies initial specified tolerance
No mechanical damage
P case
:
A B case :
10
5
or less
or less
Apply surge voltage every 5 0.5 min for 30 5 s 1000 times
to capacitor at 85 in circuit :
tan
P case : Satisfied 150 initial speci-
fied tolerance
A B case : Satisfied initial specified
tolerance
Satisfies initial specified tolerance
Resistance of power
source is 1 or less
Leakage current
Appearance
Capacitance change
Surge voltage
resistance
II
No mechanical damage
5
or less
TCFP series 1000 cycles as follows:
5A, 1.3 Rated voltage
resister less than 1
TCFP series is not guaranteed
tan
P case : Satisfied 150 initial speci-
fied tolerance
A B case : Satisfied initial specified
tolerance
Leakage current
Satisfies initial specified tolerance
5
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