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BSM35GB120DN2

Description
IGBT Power Module (Half-bridge Including fast free-wheeling diodes Doubled diode area)
CategoryDiscrete semiconductor    The transistor   
File Size113KB,9 Pages
ManufacturerSIEMENS
Websitehttp://www.infineon.com/
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BSM35GB120DN2 Overview

IGBT Power Module (Half-bridge Including fast free-wheeling diodes Doubled diode area)

BSM35GB120DN2 Parametric

Parameter NameAttribute value
package instructionFLANGE MOUNT, R-CUFM-X7
Reach Compliance Codeunknow
Shell connectionISOLATED
Maximum collector current (IC)50 A
Collector-emitter maximum voltage1200 V
ConfigurationSERIES CONNECTED, CENTER TAP, 2 ELEMENTS WITH BUILT-IN DIODE
Maximum landing time (tf)75 ns
Gate emitter threshold voltage maximum6.5 V
Gate-emitter maximum voltage20 V
JESD-30 codeR-CUFM-X7
Number of components2
Number of terminals7
Maximum operating temperature150 °C
Package body materialCERAMIC, METAL-SEALED COFIRED
Package shapeRECTANGULAR
Package formFLANGE MOUNT
Polarity/channel typeN-CHANNEL
Maximum power consumption environment560 W
Certification statusNot Qualified
Maximum rise time (tr)120 ns
surface mountNO
Terminal formUNSPECIFIED
Terminal locationUPPER
Transistor component materialsSILICON
Maximum off time (toff)600 ns
Nominal off time (toff)400 ns
Maximum opening time (tons)120 ns
Nominal on time (ton)60 ns
VCEsat-Max3.2 V
Base Number Matches1
BSM 35 GB 120 DN2
IGBT Power Module
Preliminary data
• Half-bridge
• Including fast free-wheeling diodes
• Doubled diode area
• Package with insulated metal base plate
Type
BSM 35 GB 120 DN2
Maximum Ratings
Parameter
Collector-emitter voltage
Collector-gate voltage
Symbol
Values
1200
1200
Unit
V
V
CE
I
C
Package
HALF-BRIDGE 1
Ordering Code
C67070-A2111-A70
1200V 50A
V
CE
V
CGR
V
GE
I
C
R
GE
= 20 kΩ
Gate-emitter voltage
DC collector current
± 20
A
50
35
T
C
= 25 °C
T
C
= 80 °C
Pulsed collector current,
t
p
= 1 ms
I
Cpuls
100
70
T
C
= 25 °C
T
C
= 80 °C
Power dissipation per IGBT
P
tot
280
W
+ 150
-55 ... + 150
0.44
0.8
2500
20
11
F
55 / 150 / 56
-
Vac
mm
K/W
°C
T
C
= 25 °C
Chip temperature
Storage temperature
Thermal resistance, chip case
Diode thermal resistance, chip case
Insulation test voltage,
t
= 1min.
Creepage distance
Clearance
DIN humidity category, DIN 40 040
IEC climatic category, DIN IEC 68-1
T
j
T
stg
R
thJC
R
thJCD
V
is
-
-
-
-
Semiconductor Group
1
Mar-28-1996

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