Preliminary Data Sheet
MegaMOS
TM
FET
N-Channel Enhancement Mode
V
DSS
IXTH 30N45
IXTH 30N50
450 V
500 V
I
D25
30 A
30 A
R
DS(on)
0.16
Ω
0.17
Ω
TO-247 AD
Symbol
Test Conditions
30N45
30N50
30N45
30N50
Maximum Ratings
D (TAB)
V
DSS
V
DGR
V
GS
V
GSM
I
D25
I
DM
P
D
T
J
T
JM
T
stg
T
L
M
d
Weight
T
J
= 25°C to 150°C
T
J
= 25°C to 150°C; R
GS
= 1 MΩ
Continuous
Transient
T
C
= 25°C
T
C
= 25°C, pulse width limited by T
JM
T
C
= 25°C
450
500
450
500
±20
±30
30
120
360
-55 ... +150
150
-55 ... +150
V
V
V
V
V
V
A
A
W
°C
°C
°C
°C
TO-247 SMD
( ...S )
G
E
C (TAB)
G = Gate,
S = Source,
D = Drain,
TAB = Drain
*Add suffix letter "S" for TO-247 SMD
package option (EX:IXTH30N50S)
1.6 mm (0.063 in) from case for 10 s
Mounting torque
300
1.13/10 Nm/lb.in.
6
g
Features
•
International standard package
•
•
•
•
JEDEC TO-247 AD
Low R
DS (on)
HDMOS
TM
process
Rugged polysilicon gate cell structure
High commutating dv/dt rating
Fast switching times
Symbol
Test Conditions
Characteristic Values
(T
J
= 25°C, unless otherwise specified)
min. typ. max.
500
450
.087
2
-0.25
±100
T
J
= 25°C
T
J
= 125°C
200
3
0.17
0.16
4
V
V
%/k
V
%/k
nA
µA
mA
Ω
Ω
Applications
V
DSS
V
GS
= 0 V, I
D
= 5 mA
BV
DSS
30N50
30N45
temperature coefficient
•
Switch-mode and resonant-mode
•
•
•
power supplies
Motor control
Uninterruptible Power Supplies (UPS)
DC choppers
V
GS(th)
I
GSS
I
DSS
R
DS(on)
V
DS
= V
GS
, I
D
= 250µA
V
GS(th)
temperature coefficient
V
GS
=
±20
V
DC
, V
DS
= 0
V
DS
= 0.8 • V
DSS
V
GS
= 0 V
V
GS
= 10 V, I
D
= 0.5 I
D25
Advantages
30N50
30N45
Pulse test, t
≤
300
µs,
duty cycle d
≤
2 %
•
Easy to mount with 1 screw (TO-247)
•
•
(isolated mounting screw hole)
Space savings
High power density
© 1997 IXYS All rights reserved
94569D(5/97)
IXTH30N45
Symbol
Test Conditions
Characteristic Values
(T
J
= 25°C, unless otherwise specified)
min. typ. max.
18
28
5680
635
240
35
42
110
26
227
29
110
0.35
0.15
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
K/W
K/W
IXTH30N50
TO-247 AD Outline
g
fs
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Q
g(on)
Q
gs
Q
gd
R
thJC
R
thCK
V
DS
= 10 V; I
D
= 0.5 • I
D25
, pulse test
V
GS
= 0 V, V
DS
= 25 V, f = 1 MHz
∅
P
V
GS
= 10 V, V
DS
= 0.5 • V
DSS
, I
D
= 0.5 I
D25
R
G
= 1
Ω,
(External)
e
Dim.
V
GS
= 10 V, V
DS
= 0.5 • V
DSS
, I
D
= 0.5 I
D25
Source-Drain Diode
Symbol
I
S
I
SM
V
SD
t
rr
Test Conditions
V
GS
= 0
Characteristic Values
(T
J
= 25°C, unless otherwise specified)
min. typ. max.
30
120
1.5
850
A
A
V
ns
Millimeter
Min.
Max.
A
4.7
5.3
A
1
2.2
2.54
A
2
2.2
2.6
b
1.0
1.4
b
1
1.65
2.13
2.87
3.12
b
2
C
.4
.8
D
20.80 21.46
E
15.75 16.26
e
5.20
5.72
L
19.81 20.32
L1
4.50
∅P
3.55
3.65
Q
5.89
6.40
R
4.32
5.49
S
6.15 BSC
Inches
Min. Max.
.185 .209
.087 .102
.059 .098
.040 .055
.065 .084
.113 .123
.016 .031
.819 .845
.610 .640
0.205 0.225
.780 .800
.177
.140 .144
0.232 0.252
.170 .216
242 BSC
TO-247 SMD Outline
Repetitive; pulse width limited by T
JM
I
F
= I
S
, V
GS
= 0 V,
Pulse test, t
≤
300
µs,
duty cycle d
≤
2 %
I
F
= I
S
, -di/dt = 100 A/µs, V
R
= 100 V
1. Gate
2. Collector
Dim.
A
A1
A2
b
b1
C
D
E
e
L
L1
L2
L3
L4
ØP
Q
R
S
3. Emitter
4. Collector
Inches
Min. Max.
.190
.090
.075
.045
.075
.024
.819
.620
.215
.193
.106
.083
.00
.075
.140
.220
.170
.242
.205
.100
.085
.055
.084
.031
.840
.635
BSC
.201
.114
.091
.004
.083
.144
.244
.190
BSC
Millimeter
Min.
Max.
4.83
2.29
1.91
1.14
1.91
0.61
20.80
15.75
5.45
4.90
2.70
2.10
0.00
1.90
3.55
5.59
4.32
6.15
5.21
2.54
2.16
1.40
2.13
0.80
21.34
16.13
BSC
5.10
2.90
2.30
0.10
2.10
3.65
6.20
4.83
BSC
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETS and IGBTs are covered by one or more of the following U.S. patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,486,715
5,381,025