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SST27SF256-70-3C-NH

Description
Flash, 32KX8, 70ns, PQCC32, PLASTIC, MO-016AE, LCC-32
Categorystorage    storage   
File Size276KB,28 Pages
ManufacturerSilicon Laboratories Inc
Download Datasheet Parametric View All

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SST27SF256-70-3C-NH Overview

Flash, 32KX8, 70ns, PQCC32, PLASTIC, MO-016AE, LCC-32

SST27SF256-70-3C-NH Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerSilicon Laboratories Inc
Parts packaging codeQFJ
package instructionQCCJ, LDCC32,.5X.6
Contacts32
Reach Compliance Codeunknown
ECCN codeEAR99
Maximum access time70 ns
command user interfaceNO
Data pollingNO
JESD-30 codeR-PQCC-J32
JESD-609 codee0
length13.97 mm
memory density262144 bit
Memory IC TypeFLASH
memory width8
Number of functions1
Number of terminals32
word count32768 words
character code32000
Operating modeASYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize32KX8
Package body materialPLASTIC/EPOXY
encapsulated codeQCCJ
Encapsulate equivalent codeLDCC32,.5X.6
Package shapeRECTANGULAR
Package formCHIP CARRIER
Parallel/SerialPARALLEL
power supply5 V
Programming voltage12 V
Certification statusNot Qualified
Maximum seat height3.556 mm
Maximum standby current0.0001 A
Maximum slew rate0.03 mA
Maximum supply voltage (Vsup)5.5 V
Minimum supply voltage (Vsup)4.5 V
Nominal supply voltage (Vsup)5 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal surfaceTin/Lead (Sn/Pb)
Terminal formJ BEND
Terminal pitch1.27 mm
Terminal locationQUAD
switch bitNO
width11.43 mm
256 Kbit / 512 Kbit / 1 Mbit / 2 Mbit (x8)
Many-Time Programmable Flash
SST27SF256 / SST27SF512 / SST27SF010 / SST27SF020
SST27SF256 / 512 / 010 / 0205.0V-Read 256Kb / 512Kb / 1Mb / 2Mb (x8) MTP flash memories
Data Sheet
FEATURES:
• Organized as 32K x8 / 64K x8 / 128K x8 / 256K x8
• 4.5-5.5V Read Operation
• Superior Reliability
– Endurance: At least 1000 Cycles
– Greater than 100 years Data Retention
• Low Power Consumption
– Active Current: 20 mA (typical)
– Standby Current: 10 µA (typical)
• Fast Read Access Time
– 70 ns
– 90 ns
• Fast Byte-Program Operation
– Byte-Program Time: 20 µs (typical)
– Chip Program Time:
0.7 seconds (typical) for SST27SF256
1.4 seconds (typical) for SST27SF512
2.8 seconds (typical) for SST27SF010
5.6 seconds (typical) for SST27SF020
• Electrical Erase Using Programmer
– Does not require UV source
– Chip-Erase Time: 100 ms (typical)
• TTL I/O Compatibility
• JEDEC Standard Byte-wide EPROM Pinouts
• Packages Available
– 32-lead PLCC
– 32-lead TSOP (8mm x 14mm)
– 28-pin PDIP for SST27SF256/512
– 32-pin PDIP for SST27SF010/020
PRODUCT DESCRIPTION
The SST27SF256/512/010/020 are a 32K x8 / 64K x8 /
128K x8 / 256K x8 CMOS, Many-Time Programmable
(MTP) low cost flash, manufactured with SST’s proprietary,
high performance SuperFlash technology. The split-gate
cell design and thick oxide tunneling injector attain better
reliability and manufacturability compared with alternate
approaches. These MTP devices can be electrically erased
and programmed at least 1000 times using an external pro-
grammer with a 12 volt power supply. They have to be
erased prior to programming. These devices conform to
JEDEC standard pinouts for byte-wide memories.
Featuring high performance Byte-Program, the
SST27SF256/512/010/020 provide a Byte-Program time of
20 µs. Designed, manufactured, and tested for a wide
spectrum of applications, these devices are offered with an
endurance of at least 1000 cycles. Data retention is rated at
greater than 100 years.
The SST27SF256/512/010/020 are suited for applications
that require infrequent writes and low power nonvolatile
storage. These devices will improve flexibility, efficiency,
and performance while matching the low cost in nonvolatile
applications that currently use UV-EPROMs, OTPs, and
mask ROMs.
To meet surface mount and conventional through hole
requirements, the SST27SF256/512 are offered in 32-lead
PLCC, 32-lead TSOP and 28-pin PDIP packages. The
,
SST27SF010/020 are offered in 32-pin PDIP 32-lead
,
PLCC, and 32-lead TSOP packages. See Figures 1, 2, and
3 for pin assignments.
©2002 Silicon Storage Technology, Inc.
S71152-04-000 7/02
502
1
Device Operation
The SST27SF256/512/010/020 are a low cost flash
solution that can be used to replace existing UV-
EPROM, OTP, and mask ROM sockets. These devices
are functionally (read and program) and pin compatible
with industry standard EPROM products. In addition to
EPROM functionality, these devices also support elec-
trical Erase operation via an external programmer. They
do not require a UV source to erase, and therefore the
packages do not have a window.
Read
The Read operation of the SST27SF256/512/010/020 is
controlled by CE# and OE#. Both CE# and OE# have to be
low for the system to obtain data from the outputs. Once
the address is stable, the address access time is equal to
the delay from CE# to output (T
CE
). Data is available at the
output after a delay of T
OE
from the falling edge of OE#,
assuming that CE# pin has been low and the addresses
have been stable for at least T
CE
-T
OE
. When the CE# pin is
high, the chip is deselected and a typical standby current of
10 µA is consumed. OE# is the output control and is used
to gate data from the output pins. The data bus is in high
impedance state when either CE# or OE# is high.
The SST logo and SuperFlash are registered trademarks of Silicon Storage Technology, Inc.
Many-Time Programmable and MTP are trademarks of Silicon Storage Technology, Inc.
These specifications are subject to change without notice.

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