FAST CMOS 16-BIT BUS TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
1
DIR
1
CLKAB
1
SAB
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Description
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
Max
–0.5 to 7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
1
OE
1
CLKBA
1
SBA
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
V
TERM
(2)
V
TERM
(3)
T
STG
I
OUT
GND
1
A
1
1
A
2
GND
1
B
1
1
B
2
V
CC
1
A
3
1
A
4
1
A
5
V
CC
1
B
3
1
B
4
1
B
5
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Output and I/O terminals for FCT162XXX.
GND
1
A
6
1
A
7
1
A
8
2
A
1
2
A
2
2
A
3
GND
1
B
6
1
B
7
1
B
8
2
B
1
2
B
2
2
B
3
CAPACITANCE
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
C
I/O
Parameter
(1)
Input Capacitance
I/O Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
3.5
Max.
6
8
Unit
pF
pF
NOTE:
1. This parameter is measured at characterization but not tested.
GND
2
A
4
2
A
5
2
A
6
GND
2
B
4
2
B
5
2
B
6
PIN DESCRIPTION
Pin Names
xAx
xBx
xCLKAB, xCLKBA
xSAB, xSBA
xDIR, xOE
Description
Data Register A Inputs
Data Register B Outputs
Data Register B Inputs
Data Register A Outputs
Clock Pulse Inputs
Output Data Source Select Inputs
Output Enable Inputs
V
CC
2
A
7
2
A
8
V
CC
2
B
7
2
B
8
GND
2
SAB
2
CLKAB
2
DIR
GND
2
SBA
2
CLKBA
2
OE
SSOP/ TSSOP/ TVSOP
TOP VIEW
FUNCTION TABLE
(2)
Inputs
xOE
H
H
L
L
L
L
xDIR
X
X
L
L
H
H
xCLKAB
H or L
↑
X
X
X
H or L
xCLKBA
H or L
↑
X
H or L
X
X
xSAB
X
X
X
X
L
H
xSBA
X
X
L
H
X
X
Input
Output
Output
Input
xAx
Input
Data I/O
(1)
xBx
Input
Operation or Function
Isolation
Store A and B Data
Real Time B Data to A Bus
Stored B Data to A Bus
Real Time A Data to B Bus
Stored A Data to B Bus
NOTES:
1. The data output functions may be enabled or disabled by various signals at the xOE or xDIR inputs. Data input functions are always enabled, i.e., data at the bus pins will
be stored on every LOW-to-HIGH transition on the clock inputs.
2. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
↑
= LOW-to-HIGH Transition
2
IDT74FCT162646AT/CT
FAST CMOS 16-BIT BUS TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
BUS
A
BUS
B
BUS
A
BUS
B
x
DIR
x
OE
x
CLKAB
x
CLKBA
x
SAB
x
SBA
x
DIR
x
OE
x
CLKAB
x
CLKBA
x
SAB
x
SBA
L
L
X
X
X
L
H
L
X
X
L
X
Real-Time Transfer Bus B to A
Real-Time Transfer Bus A to B
BUS
A
BUS
B
BUS
A
BUS
B
x
DIR
x
OE
x
CLKAB
x
CLKBA
x
SAB
x
SBA
H
L
X
L
L
H
↑
X
↑
x
DIR
(1)
x
OE
x
CLKAB
x
CLKBA
x
SAB
x
SBA
X
↑
↑
X
X
X
X
X
X
L
H
L
L
X
H or L
H or L
X
X
H
H
X
Storage From A and/or B
Transfer Stored Data to A and/or B
NOTE:
1. Cannot transfer data to A bus and B bus simultaneously.
3
IDT74FCT162646AT/CT
FAST CMOS 16-BIT BUS TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= –40°C to +85°C, V
CC
= 5.0V ±10%
Symbol
V
IH
V
IL
I
IH
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current (Input pins)
(4)
Input HIGH Current (I/O pins)
(4)
I
IL
Input LOW Current (Input pins)
(4)
Input LOW Current (I/O pins)
(4)
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
High Impedance Output Current
(3-State Output pins)
(4)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
V
I
= GND
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
Min.
2
—
—
—
—
—
—
—
—
–80
—
—
Typ.
(2)
—
—
—
—
—
—
—
—
–0.7
–140
100
5
Max.
—
0.8
±1
±1
±1
±1
±1
±1
–1.2
–250
—
500
V
mA
mV
µA
µA
Unit
V
V
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
I
ODL
I
ODH
V
OH
V
OL
Parameter
Output LOW Current
Output HIGH Current
Output HIGH Voltage
Output LOW Voltage
Test Conditions
(1)
V
CC
= 5V, V
IN =
V
IH
or V
IL,
V
O
= 1.5V
(3)
V
CC
= 5V, V
IN =
V
IH
or V
IL,
V
O
= 1.5V
(3)
V
CC
= Min.
I
OH
= –24mA
V
IN
= V
IH
or V
IL
V
CC
= Min.
I
OL
= 24mA
V
IN
= V
IH
or V
IL
Min.
60
–60
2.4
—
Typ.
(2)
115
–115
3.3
0.3
Max.
200
–200
—
0.55
Unit
mA
mA
V
V
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
A
= –55°C.
4
IDT74FCT162646AT/CT
FAST CMOS 16-BIT BUS TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol
∆I
CC
I
CCD
Parameter
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply
Current
(4)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max.
Outputs Open
xDIR = xOE = GND
One Input Togging
50% Duty Cycle
V
CC
= Max.
Outputs Open
f
CP
= 10MHz (xCLKBA)
50% Duty Cycle
xDIR = xOE = GND
One Bit Toggling
f
I
= 5MHz
50% Duty Cycle
V
CC
= Max.
Outputs Open
f
CP
= 10MHz (xCLKBA)
50% Duty Cycle
xDIR = xOE = GND
Sixteen Bits Toggling
f
i
= 2.5MHz
50% Duty Cycle
V
IN
= V
CC
V
IN
= GND
Test Conditions
(1)
Min.
—
—
Typ.
(2)
0.5
75
Max.
1.5
120
Unit
mA
µA/
MHz
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
—
0.8
1.7
mA
V
IN
= 3.4V
V
IN
= GND
—
1.3
3.2
V
IN
= V
CC
V
IN
= GND
—
3.8
6.5
(5)
V
IN
= 3.4V
V
IN
= GND
—
8.3
20
(5)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + fiNi)
I
CC
= Quiescent Current (I
CCL
, I
CCH
and I
CCZ
)
∆I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
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