RN2902(TE85LF) datasheet, PDF - EEWORLD Datasheet

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RN2902(TE85LF): DescriptionSmall Signal Bipolar Transistor; CategoryDiscrete semiconductor The transistor; File Size576KB，7 Pages; ManufacturerToshiba Semiconductor; Websitehttp://toshiba-semicon-storage.com/

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RN2902(TE85LF) Overview

Small Signal Bipolar Transistor

RN2902(TE85LF) Parametric

Parameter Name	Attribute value
Maker	Toshiba Semiconductor
package instruction	,
Reach Compliance Code	unknown

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RN2901~RN2906

TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor Built-in Transistor)

RN2901, RN2902, RN2903

RN2904, RN2905, RN2906

Unit : mm

Switching, Inverter Circuit, Interface Circuit

and Driver Circuit Applications

Including two devices in US6 (ultra super mini type with 6 leads)

With built-in bias resistors

Simplify circuit design

Reduce a quantity of parts and manufacturing process

Complementary to RN1901 to RN1906

Equivalent Circuit and Bias Resistor Values

Type No.

RN2901

RN2902

RN2903

RN2904

RN2905

RN2906

R1 (kΩ)

4.7

2.2

4.7

R2 (kΩ)

4.7

US6

―

JEDEC

―

JEITA

2-2J1A

TOSHIBA

Weight: 6.8 mg (typ.)

Absolute Maximum Ratings

(Ta = 25°C) (Q1, Q2 Common)

Characteristic

Collector-base voltage

Collector-emitter voltage

Emitter-base voltage

Collector current

Collector power dissipation

Junction temperature

Storage temperature range

RN2901 to 2906

RN2901 to 2904

RN2905, 2906

Symbol

CBO

CEO

EBO

stg

Rating

−50

−10

−5

−100

200

150

−55

to 150

Unit

°C

Equivalent Circuit

(Top View)

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even

if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum

ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

*: Total rating

Start of commercial production

1990-12

2014-03-01

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