H7N0602LD, H7N0602LS, H7N0602LM
Silicon N Channel MOS FET
High Speed Power Switching
REJ03G1130-0600
Rev.6.00
Oct 16, 2006
Features
•
Low on-resistance
R
DS (on)
= 4.1 mΩ typ.
•
4.5 V gate drive devices
•
High Speed Switching
Outline
RENESAS Package code: PRSS0004AE-A
(Package name: LDPAK (L) )
4
4
1. Gate
2. Drain
3. Source
4. Drain
1
1
2
3
2
3
RENESAS Package code: PRSS0004AE-B
(Package name: LDPAK (S)-(1) )
H7N0602LD
H7N0602LS
RENESAS Package code: PRSS0004AE-C
(Package name: LDPAK (S)-(2) )
4
G
D
1
2
3
S
H7N0602LM
Rev.6.00 Oct 16, 2006 page 1 of 8
H7N0602LD, H7N0602LS, H7N0602LM
Absolute Maximum Ratings
(Ta = 25°C)
Item
Drain to source voltage
Gate to source voltage
Drain current
Drain peak current
Body to drain diode reverse drain current
Avalanche current
Avalanche energy
Channel dissipation
Channel temperature
Storage temperature
Notes: 1. PW
≤
10
µs,
duty cycle
≤
1%
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg
≥
50
Ω
Symbol
V
DSS
V
GSS
I
D
I
D (pulse) Note 1
I
DR
I
AP Note 3
E
AR Note 3
Pch
Note 2
Tch
Tstg
Value
60
±20
85
340
85
65
362
100
150
–55 to +150
Unit
V
V
A
A
A
A
mJ
W
°C
°C
Electrical Characteristics
(Ta = 25°C)
Item
Drain to source breakdown voltage
Gate to source breakdown voltage
Zero gate voltage drain current
Gate to source leak current
Gate to source cutoff voltage
Forward transfer admittance
Static drain to source on state
resistance
Input capacitance
Output capacitance
Reverse transfer capacitance
Total gate charge
Gate to source charge
Gate to drain charge
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Body to drain diode forward voltage
Body to drain diode reverse recovery
time
Note:
4. Pulse test
Symbol
V
(BR) DSS
V
(BR) GSS
I
DSS
I
GSS
V
GS (off)
|y
fs
|
R
DS (on)
Ciss
Coss
Crss
Qg
Qgs
Qgd
t
d (on)
t
r
t
d (off)
t
f
V
DF
t
rr
Min
60
±20
—
—
1.5
70
—
—
—
—
—
—
—
—
—
—
—
—
—
—
Typ
—
—
—
—
—
120
4.1
6.2
9000
1000
470
140
30
30
55
290
140
50
0.95
45
Max
—
—
10
±10
2.5
—
5.2
9.0
—
—
—
—
—
—
—
—
—
—
—
—
Unit
V
V
µA
µA
V
S
mΩ
mΩ
pF
pF
pF
nC
nC
nC
ns
ns
ns
ns
V
ns
Test Conditions
I
D
= 10 mA, V
GS
= 0
I
G
=
±100 µA,
V
DS
= 0
V
DS
= 60 V, V
GS
= 0
V
GS
=
±16
V, V
DS
= 0
V
DS
= 10 V, I
D
= 1 mA
Note 4
I
D
= 45 A, V
DS
= 10 V
Note 4
I
D
= 45 A, V
GS
= 10 V
Note 4
I
D
= 45 A, V
GS
= 4.5 V
Note 4
V
DS
= 10 V
V
GS
= 0
f = 1 MHz
V
DD
= 25 V
V
GS
= 10 V
I
D
= 85 A
V
GS
= 10 V
I
D
= 45 A
R
L
= 0.67
Ω
Rg = 4.7
Ω
I
F
= 85 A, V
GS
= 0
I
F
= 85 A, V
GS
= 0
di
F
/dt = 100 A/µs
Rev.6.00 Oct 16, 2006 page 2 of 8
H7N0602LD, H7N0602LS, H7N0602LM
Main Characteristics
Power vs. Temperature Derating
160
1000
300
10
0
10
µ
s
µ
s
Maximum Safe Operation Area
Pch (W)
I
D
(A)
120
100
30
10
3
DC Operation
(Tc = 25°C)
1m
s
Channel Dissipation
80
Drain Current
40
Operation in
this area is
1 limited by R
DS(on)
0.3
PW = 10 ms
(1shot)
3
10
30
100
0
0
50
100
150
200
Ta = 25°C
0.1
0.1 0.3
1
Case Temperature
Tc (°C)
Drain to Source Voltage
V
DS
(V)
Typical Output Characteristics
200
10 V
6V
Pulse Test
200
Typical Transfer Characteristics
V
DS
= 10 V
Pulse Test
I
D
(A)
I
D
(A)
Drain Current
160
4.5 V
160
120
Drain Current
4V
120
80
3.5 V
40
V
GS
= 3 V
0
0
2
4
6
8
10
80
40
Tc = 75°C
25°C
–25°C
0
1
2
3
4
5
0
Drain to Source Voltage
V
DS
(V)
Gate to Source Voltage
V
GS
(V)
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
Drain to Source on State Resistance
R
DS(on)
(mΩ)
Drain to Source Saturation Voltage
V
DS(on)
(mV)
500
Pulse Test
400
Static Drain to Source on State Resistance
vs. Drain Current
100
Pulse Test
30
300
I
D
= 50 A
10
V
GS
= 4.5 V
200
100
20 A
10 A
3
10 V
0
0
4
8
12
16
20
1
1
3
10
30
100
300
1000
Gate to Source Voltage V
GS
(V)
Drain Current I
D
(A)
Rev.6.00 Oct 16, 2006 page 3 of 8
H7N0602LD, H7N0602LS, H7N0602LM
Static Drain to Source on State Resistance
vs. Temperature
Forward Transfer Admittance vs.
Drain Current
Forward Transfer Admittance |yfs| (S)
Drain to Source on State Resistance
R
DS(on)
(mΩ)
20
Pulse Test
16
1000
300
100
25°C
30
75°C
10
3
1
1
3
10
30
100
300
1000
Tc = –25°C
12
I
D
= 10, 20 A
8
V
GS
= 4.5 V
50 A
4
10 V
0
–50
0
50
10, 20, 50 A
V
DS
= 10 V
Pulse Test
100
150
200
Case Temperature
Tc (°C)
Drain Current I
D
(A)
Typical Capacitance vs.
Drain to Source Voltage
100000
30000
10000
3000
1000
Coss
300
100
V
GS
= 0
f = 1 MHz
0
10
20
30
Ciss
Body to Drain Diode Reverse
Recovery Time
Reverse Recovery Time trr (ns)
1000
300
100
30
10
3
1
0.1
di / dt = 100 A /
µ
s
V
GS
= 0, Ta = 25°C
Capacitance C (pF)
Crss
40
50
0.3
1
3
10
30
100
Reverse Drain Current
I
DR
(A)
Drain to Source Voltage V
DS
(V)
Dynamic Input Characteristics
Switching Characteristics
V
DS
(V)
I
D
= 85 A
80
V
DD
= 50 V
25 V
10 V
V
GS
16
V
GS
(V)
100
20
1000
tf
300
100
30
10
3
V
GS
= 10 V, V
DD
= 30 V
PW = 5
µs,
duty
≤
1 %
Rg = 4.7
Ω
0.3
1
3
10
30
100
td(on)
tr
tf
tr
td(off)
Drain to Source Voltage
60 V
DS
40
12
8
20
0
0
40
80
V
DD
= 50 V
25 V
10 V
120
160
4
0
200
Gate to Source Voltage
Switching Time t (ns)
1
0.1
Gate Charge Qg (nc)
Drain Current
I
D
(A)
Rev.6.00 Oct 16, 2006 page 4 of 8
H7N0602LD, H7N0602LS, H7N0602LM
Reverse Drain Current vs.
Source to Drain Voltage
Repetitive Avalanche Energy E
AR
(mJ)
(A)
200
10 V
500
I
AP
= 65 A
V
DD
= 25 V
duty < 0.1 %
Rg
≥
50
Ω
Maximum Avalanche Energy vs.
Channel Temperature Derating
I
DR
160
400
Reverse Drain Current
120
300
80
5V
V
GS
= 0, –5 V
Pulse Test
0
0.4
0.8
1.2
1.6
2.0
200
40
100
0
0
25
50
75
100
125
150
Source to Drain Voltage
V
SD
(V)
Channel Temperature Tch (°C)
Normalized Transient Thermal Impedance vs. Pulse Width
Normalized Transient Thermal Impedance
γ
s (t)
3
Tc = 25°C
1
D=1
0.5
0.3
0.2
θ
ch – c (t) =
γ
s (t) •
θ
ch – c
0.1
0.1
θ
ch – c = 1.25
°
C/W, Tc = 25
°
C
P
DM
PW
T
1m
10 m
100 m
1
10
0.05
0.03
0.02
D=
PW
T
1
0.0
pulse
t
ho
1s
0.01
10
µ
100
µ
Pulse Width PW (S)
Avalanche Test Circuit
Avalanche Waveform
1
• L • I
AP2
•
2
V
DSS
V
DSS
– V
DD
V
(BR)DSS
I
AP
V
DD
I
D
V
DS
V
DS
Monitor
L
I
AP
Monitor
E
AR
=
Rg
D.U.T
Vin
15 V
50
Ω
V
DD
0
Rev.6.00 Oct 16, 2006 page 5 of 8