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HS9-4080AEH/PROTO

Description
Door driver RADIATION HARDENED FULL BRIDGE DRIVER, PROTOTYPE, FP
Categorysemiconductor    Power management IC    Gate driver   
File Size322KB,8 Pages
ManufacturerRenesas Electronics Corporation
Websitehttps://www.renesas.com/
Environmental Compliance
Download Datasheet Parametric View All

HS9-4080AEH/PROTO Overview

Door driver RADIATION HARDENED FULL BRIDGE DRIVER, PROTOTYPE, FP

HS9-4080AEH/PROTO Parametric

Parameter NameAttribute value
MakerRenesas Electronics Corporation
Product Categorygate driver
Shipping restrictionsThis product may require additional documentation for export from the United States.
Installation styleSMD/SMT
Package/boxFlatpack-20
productMOSFET Gate Drivers
Number of exciters1 Driver
Rise Time50 ns
Fall time50 ns
Supply voltage - max.18 V
Supply voltage - min.12 V
Minimum operating temperature- 55 C
Maximum operating temperature+ 125 C
typeHigh Side, Low Side
seriesHS-4080
EncapsulationTray
Number of outputs1 Output
technologySi
logical typeTTL
Factory packaging quantity100
DATASHEET
HS-4080AEH
Radiation Hardened Full Bridge N-Channel FET Driver
The
HS-4080AEH
is a monolithic, high frequency, medium
voltage Full Bridge N-Channel FET Driver IC. The device
includes a TTL-level input comparator, which can be used to
facilitate the “hysteresis” and PWM modes of operation. Its
HEN (High Enable) lead can force current to freewheel in the
bottom two external power MOSFETs, maintaining the upper
power MOSFETs off. The HS-4080AEH is well suited for use in
distributed DC power supplies and DC/DC converters, since it
can switch at high frequencies.
This device can also drive medium voltage motors and two
HS-4080AEHs can be used to drive high performance stepper
motors, since the short minimum “on-time” can provide fine
micro-stepping capability.
Short propagation delays maximize control loop crossover
frequencies and dead times, which can be adjusted to near
zero to minimize distortion, resulting in precise control of the
driven load.
Constructed with the Intersil dielectrically isolated radiation
hardened Silicon Gate (RSG) process, this device is immune to
single event latch-up and has been specifically designed to
provide highly reliable performance in harsh radiation
environments. Complete your design with radiation hardened
MOSFETs from Intersil.
Detailed Electrical Specifications for these devices are
contained in SMD
5962-99617.
FN4563
Rev 6.00
May 27, 2015
Features
• Electrically screened to SMD #
5962-99617
• QML qualified per MIL-PRF-38535 requirements
• Radiation environment
- Gamma dose . . . . . . . . . . . . . . . . . . . . . 300kRAD(Si) (max)
- Latch-up immune RSG DI process
• Drives N-Channel FET full bridge including high-side chop
capability
• Bootstrap supply max voltage to 95V
DC
• TTL comparator input levels
• Drives 1000pF load with rise and fall times of 50ns
• User-programmable dead time
• Charge-pump and bootstrap maintain upper bias supplies
• DIS (Disable) pin pulls gates low
• Operates from single supply . . . . . . . . . . . . . . . . . . 12V to 18V
• Low power consumption
• Undervoltage protection
Applications
• Full bridge power supplies
• PWM motion control
Application Block Diagram
80V
12V
BHO
BHS
HEN
DIS
BLO
LOAD
HS-4080AEH
IN+
IN-
ALO
AHS
AHO
GND
GND
FIGURE 1. APPLICATION BLOCK DIAGRAM
FN4563 Rev 6.00
May 27, 2015
Page 1 of 7
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