This product complies with the RoHS Directive (EU 2002/95/EC).
Transistors
2SD2185
Silicon NPN epitaxial planar type
For low-frequency output amplification
Complementary to 2SB1440
■
Features
Unit: mm
4.5
±0.1
1.6
±0.2
1.5
±0.1
M
ain
Di
sc te
on na
tin nc
ue e/
d
•
Low collector-emitter saturation voltage V
CE(sat)
•
Mini Power type package, allowing downsizing of the equipment
and automatic insertion through the tape packing and the maga-
zine packing
1
0.4
±0.08
1.5
±0.1
3˚
4.0
+0.25
–0.20
2.5
±0.1
3˚
0.4
±0.04
■
Absolute Maximum Ratings
T
a
=
25°C
Parameter
Symbol
V
CBO
V
CEO
I
C
V
EBO
I
CP
P
C
T
j
Collector-base voltage (Emitter open)
Collector-emitter voltage (Base open)
Emitter-base voltage (Collector open)
Collector current
Peak collector current
Collector power dissipation
*
Junction temperature
Storage temperature
T
stg
Note) *: Printed circuit board: Copper foil area of 1 cm
2
or more, and the
board thickness of 1.7 mm for the collector portion
Parameter
tin
Symbol
V
CBO
V
CEO
V
EBO
I
CBO
h
FE2
ue
■
Electrical Characteristics
T
a
=
25°C
±
3°C
isc
Collector-base voltage (Emitter open)
/D
Collector-emitter voltage (Base open)
an
ce
Emitter-base voltage (Collector open)
Collector-base cutoff current (Emitter open)
Forward current transfer ratio
h
FE1 *
Collector-emitter saturation voltage
Base-emitter saturation voltage
Transition frequency
Collector output capacitance
(Common base, input open circuited)
V
CE(sat)
V
BE(sat)
f
T
C
ob
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. *: Rank classification
Rank
h
FE1
R
120 to 240
S
170 to 340
d
pla inc
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.
45˚
1.0
+0.1
–0.2
3
2
0.5
±0.08
Rating
50
50
5
3
4
1
Unit
V
V
V
A
A
3.0
±0.15
1: Base
2: Collector
3: Emitter
MiniP3-F1 Package
W
Marking Symbol: 1H
150
°C
−55
to
+150
°C
Conditions
Min
50
Typ
Max
Unit
V
on
I
C
=
10
µA,
I
E
=
0
I
C
=
1 mA, I
B
=
0
I
E
=
10
µA,
I
C
=
0
50
5
V
V
V
CB
=
20 V, I
E
=
0
0.1
µA
V
V
Ma
int
en
V
CE
= 2 V, I
C
= 200 mA
V
CE
= 2 V, I
C
= 1.0 A
I
C
=
1 A, I
B
=
50 mA
I
C
=
1 A, I
B
=
50 mA
120
80
340
0.15
0.85
120
20
0.30
1.20
35
V
CB
=
10 V, I
E
= −50
mA, f
=
200 MHz
V
CB
=
10 V, I
E
=
0, f
=
1 MHz
MHz
pF
0.4 max.
2.6
±0.1
Publication date: December 2002
SJC00246CED
1
This product complies with the RoHS Directive (EU 2002/95/EC).
2SD2185
P
C
T
a
1.2
Copper plate at the collector
is more than 1 cm
2
in area,
1.7 mm in thickness
120
I
C
V
CE
T
a
=
25°C
V
CE(sat)
I
C
Collector-emitter saturation voltage V
CE(sat)
(V)
10
I
C
/ I
B
=
50
Collector power dissipation P
C
(W)
1.0
100
Collector current I
C
(mA)
I
B
=
400
µA
80
350
µA
300
µA
60
250
µA
200
µA
150
µA
100
µA
50
µA
10
1
T
a
=
75°C
25°C
−25°C
0.8
0.6
0.1
0
0
20
40
60
80 100 120 140 160
Ambient temperature T
a
(
°C
)
V
BE(sat)
I
C
100
Base-emitter saturation voltage V
BE(sat)
(V)
I
C
/ I
B
=
50
10
25°C
1
T
a
= −25°C
100°C
0.1
Collector output capacitance
C (pF)
(Common base, input open circuited)
ob
50
40
30
20
10
0
1
Ma
int
en
10
an
ce
60
I
E
=
0
f
=
1 MHz
T
a
=
25°C
Collector-base voltage V
CB
(V)
2
/D
C
ob
V
CB
isc
on
100
tin
Collector current I
C
(A)
ue
0.01
0.01
0.1
1
10
d
pla inc
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ct
e
life
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cy
on es
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.
0
0
2
4
6
8
12
0.001
0.01
0.1
1
M
ain
Di
sc te
on na
tin nc
ue e/
d
0.4
40
0.01
0.2
20
10
Collector-emitter voltage V
CE
(V)
Collector current I
C
(A)
h
FE
I
C
f
T
I
E
300
V
CE
=
2 V
240
V
CB
=
10 V
T
a
=
25°C
Forward current transfer ratio h
FE
T
a
=
75°C
200
Transition frequency f
T
(MHz)
250
200
160
25°C
150
120
−25°C
100
80
50
40
0
0.01
0.1
1
10
0
−1
−10
−100
Collector current I
C
(A)
Emitter current I
E
(mA)
SJC00246CED
Request for your special attention and precautions in using the technical information and
semiconductors described in this book
(1)
If any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and
regulations of the exporting country, especially, those with regard to security export control, must be observed.
(2) The technical information described in this book is intended only to show the main characteristics and application circuit examples
of the products, and no license is granted under any intellectual property right or other right owned by our company or any other
company. Therefore, no responsibility is assumed by our company as to the infringement upon any such right owned by any other
company which may arise as a result of the use of technical information described in this book.
(3) The products described in this book are intended to be used for standard applications or general electronic equipment (such as office
equipment, communications equipment, measuring instruments and household appliances).
Consult our sales staff in advance for information on the following applications:
–
Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment, combustion equipment, life support
systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the prod-
ucts may directly jeopardize life or harm the human body.
–
Any applications other than the standard applications intended.
(4) The products and product specifications described in this book are subject to change without notice for modification and/or im-
provement. At the final stage of your design, purchasing, or use of the products, therefore, ask for the most up-to-date Product
Standards in advance to make sure that the latest specifications satisfy your requirements.
(5) When designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating conditions
(operating power supply voltage and operating environment etc.). Especially, please be careful not to exceed the range of absolute
maximum rating on the transient state, such as power-on, power-off and mode-switching. Otherwise, we will not be liable for any
defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure
mode, possible to occur to semiconductor products. Measures on the systems such as redundant design, arresting the spread of fire
or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products.
(6) Comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors (ESD, EOS,
thermal stress and mechanical stress) at the time of handling, mounting or at customer's process. When using products for which
damp-proof packing is required, satisfy the conditions, such as shelf life and the elapsed time since first opening the packages.
(7) This book may be not reprinted or reproduced whether wholly or partially, without the prior written permission of Matsushita
Electric Industrial Co., Ltd.
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ct
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an ut e
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as lat
cy
on es
cle
ic. t in
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co fo
ge
.jp rm
.
/en at
/ ion
.
Ma
int
en
an
ce
M
ain
Di
sc te
on na
tin nc
ue e/
d
/D
isc
on
tin
ue
di