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Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers
will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor
product management systems do not have the ability to manage part nomenclature that utilizes an underscore
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device numbers. The most current and up-to-date ordering information can be found at
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Please
email any questions regarding the system integration to
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Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
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MMBF4391 / MMBF4392 / MMBF4393 — N-Channel Switch
January 2015
MMBF4391 / MMBF4392 / MMBF4393
N-Channel Switch
Description
G
This device is designed for low level analog switch-
ing, sample and hold circuits and chopper stabalized
amplifiers. Sourced from process 51. See J111 for
characteristics.
S
SOT-23
D
Note: Source & Drain
are interchangeable
Ordering Information
Part Number
MMBF4391
MMBF4392
MMBF4393
Top Mark
6J
6K
6G
Package
SOT-23 3L
SOT-23 3L
SOT-23 3L
Packing Method
Tape and Reel
Tape and Reel
Tape and Reel
Absolute Maximum Ratings
(1), (2)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera-
ble above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi-
tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The
absolute maximum ratings are stress ratings only. Values are at T
A
= 25°C unless otherwise noted.
Symbol
V
DG
V
GS
I
GF
T
J
, T
STG
Drain-Gate Voltage
Gate-Source Voltage
Forward Gate Current
Parameter
Value
30
-30
50
-55 to 150
Unit
V
V
mA
°C
Operating and Storage Junction Temperature Range
Notes:
1. These ratings are based on a maximum junction temperature of 150°C.
2. These are steady-state limits. Fairchild Semiconductor should be consulted on applications involving pulsed or
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