DM74ALS14 Hex Inverter with Schmitt Trigger Inputs
March 1986
Revised February 2000
DM74ALS14
Hex Inverter with Schmitt Trigger Inputs
General Description
This device contains six independent gates, each of which
performs the logic INVERT function. Each input has hyster-
esis which increases the noise immunity and transforms a
slowly changing input signal to a fast changing, jitter-free
output.
Features
s
Input hysteresis
s
Low output noise generation
s
High input noise immunity
s
Switching specification at 50 pF
s
Switching specifications guaranteed over full tempera-
ture and V
CC
range
s
Advanced oxide-isolated, ion-implanted Schottky TTL
process
s
Functionally and pin-for-pin compatible with Schottky
and low power Schottky TTL counterparts
s
Improved AC performance over low power Schottky
counterpart
Ordering Code:
Order Number
DM74ALS14M
DM74ALS14SJ
DM74ALS14N
Package Number
M14A
M14D
N14A
Package Description
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Function Table
Y
=
A
Input
A
L
H
H
=
HIGH Logic Level
L
=
LOW Logic Level
Output
Y
H
L
© 2000 Fairchild Semiconductor Corporation
DS008773
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DM74ALS14
Absolute Maximum Ratings
(Note 1)
Supply Voltage
Input Voltage
Storage Temperature Range
Operating Free Air Temperature Range
Typical
θ
JA
N Package
M Package
78.5°C/W
109.0°C/W
7V
7V
−65°C
to
+150°C
0°C to
+70°C
Note 1:
The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Recommended Operating Conditions
Symbol
V
CC
V
T+
V
T−
HYS
I
OH
I
OL
T
A
Supply Voltage
Positive-Going Input
Threshold Voltage
Negative-Going Input
Threshold Voltage
Input Hysteresis
HIGH Level Output Current
LOW Level Output Current
Operating Free Air Temperature Range
0
V
CC
=
Min to Max
V
CC
=
5V
V
CC
=
Min to Max
V
CC
=
5V
V
CC
=
Min to Max
V
CC
=
5V
Parameter
Min
4.5
1.4
1.55
0.75
0.85
0.5
0.6
−0.4
8
70
Nom
5
Max
5.5
2
1.85
1.2
1.1
Units
V
V
V
V
mA
mA
°C
Electrical Characteristics
over recommended free air temperature range (unless otherwise noted)
Symbol
V
IK
V
OH
V
OL
I
T+
I
T−
I
I
I
IH
I
IL
I
O
I
CCH
I
CCL
V
OLP
V
OLV
V
IHD
V
ILD
Parameter
Input Clamp Voltage
HIGH Level Output Voltage
LOW Level Output Voltage
Input Current at Positive-Going Threshold Voltage
Input Current at Maximum Input Voltage
HIGH Level Input Current
LOW Level Input Current
Output Drive Current
Supply Current with Outputs HIGH
Supply Current with Outputs LOW
Quiet Output Maximum
Dynamic V
OL
Quiet Output Minimum
Dynamic V
OL
Minimum HIGH Level
Dynamic Input Voltage
Maximum LOW Level
Dynamic Input Voltage
Note 2:
Plastic DIP package.
Note 3:
n
=
number of device outputs, n
−
1 outputs switching, each driven 0V to 3V one output @ GND.
Note 4:
n
=
number of device outputs, n outputs switching, n
−
1 inputs switching 0V to 3V. Input under test switching 3V to threshold (V
ILD
); 0V to threshold
(V
IHD
); f
=
1 MHz.
Test Conditions
V
CC
=
Min, I
I
= −18
mA
V
CC
=
4.5V to 5.5V, I
OH
=
Max
V
CC
=
Min
I
OL
=
4 mA
I
OL
=
8 mA
V
CC
=
5V, V
I
=
V
T+
V
CC
=
Max, V
I
=
7V
V
CC
=
Max, V
I
=
2.7V
V
CC
=
Max, V
I
=
0.4V
V
CC
=
Max, V
O
=
2.25V
V
CC
=
Max
V
CC
=
Max
V
CC
=
5.0V, T
A
=
25°C
(Figures 1, 2); (Note 2)(Note 3)
V
CC
=
5.0V, T
A
=
25°C
(Figures 1, 2); (Note 2)(Note 3)
V
CC
=
5.0V, T
A
=
25°C
(Note 2)(Note 4)
V
CC
=
5.0V, T
A
=
25°C
(Note 2)(Note 4)
Min
V
CC
−
2
Typ
Max
−1.5
Units
V
V
V
V
µA
µA
µA
µA
µA
mA
mA
mA
V
V
V
V
0.25
0.35
0.4
0.5
20
−100
100
20
−100
Input Current at Negative-Going Threshold Voltage V
CC
=
5V, V
I
=
V
T−
−30
−112
12
12
0.16
−0.27
1.44
1.15
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2
DM74ALS14
Switching Characteristics
Symbol
t
PLH
t
PHL
Parameter
over recommended operating free air temperature range
Conditions
V
CC
=
4.5V to 5.5V
R
L
=
500Ω, C
L
=
50 pF
Min
2
2
Max
12
10
Units
ns
ns
Propagation Delay Time LOW-to-HIGH Level Output
Propagation Delay Time HIGH-to-LOW Level Output
ALS Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of ALS.
Equipment:
Word Generator
Printed Circuit Board Test Fixture
scope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500Ω.
2. Deskew the word generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. Swap
out the channels that have more than 150 ps of skew
until all channels being used are within 150 ps. It is
important to deskew the word generator channels
before testing. This will ensure that the outputs switch
simultaneously.
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
4. Set V
CC
to 5.0V.
5. Set the word generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and affect the results of the measure-
ment.
6. Set the word generator input levels at 0V LOW and 3V
HIGH. Verify levels with a digital volt meter.
V
OLP
/V
OLV
and V
OHP
/V
OHV
:
• Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50Ω coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
Dual Trace Oscillo-
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
ILD
and V
IHD
:
• Monitor one of the switching outputs using a 50Ω coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
• First increase the input LOW voltage level, V
IL
, until the
output begins to oscillate. Oscillation is defined as noise
on the output LOW level that exceeds V
IL
limits, or on
output HIGH levels that exceed V
IH
limits. The input
LOW voltage level at which oscillation occurs is defined
as V
ILD
.
• Next decrease the input HIGH voltage level on the word
generator, V
IH
until the output begins to oscillate. Oscil-
lation is defined as noise on the output LOW level that
exceeds V
IL
limits, or on output HIGH levels that exceed
V
IH
limits. The input HIGH voltage level at which oscilla-
tion occurs is defined as V
IHD
.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
OHV
and V
OHP
are measured with respect to V
OH
reference. V
OLV
and
V
OLP
are measured with respect to ground reference.
Input pulses have the following characteristics: f
=
1 MHz, t
r
=
3 ns, t
f
=
3 ns, skew
<
150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
FIGURE 2. Simultaneous Switching Test Circuit
3
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