MAX4172ExA
Rev. B
RELIABILITY REPORT
FOR
MAX4172ExA
PLASTIC ENCAPSULATED DEVICES
January 23, 2003
MAXIM INTEGRATED PRODUCTS
120 SAN GABRIEL DR.
SUNNYVALE, CA 94086
Written by
Reviewed by
Jim Pedicord
Quality Assurance
Reliability Lab Manager
Bryan J. Preeshl
Quality Assurance
Executive Director
Conclusion
The MAX4172 successfully meets the quality and reliability standards required of all Maxim products. In addition,
Maxim’s continuous reliability monitoring program ensures that all outgoing product will continue to meet Maxim’s quality
and reliability standards.
Table of Contents
I. ........Device Description
II. ........Manufacturing Information
III. .......Packaging Information
IV. .......Die Information
V. ........Quality Assurance Information
VI. .......Reliability Evaluation
......Attachments
I. Device Description
A. General
The MAX4172 is a low-cost, precision, high-side current-sense amplifier for portable PCs, telephones, and
other systems where battery/DC power-line monitoring is critical. High-side power-line monitoring is
especially useful in battery-powered systems, since it does not interfere with the battery charger’s ground
path. Wide bandwidth and ground-sensing capability make the MAX4172 suitable for closed-loop battery-
charger and general-purpose current-source applications. The 0V and 32V input common-mode range is
independent of the supply voltage, which ensures that current-sense feedback remains viable, even when
connected to a battery in deep discharge.
To provide a high level of flexibility, the MAX4172 functions with an external sense resistor to set the range of
load current to be monitored. It has a current output that can be converted to a ground-referred voltage with a
single resistor, accommodating a wide range of battery voltages and currents.
An open-collector power-good output (/PG) indicates when the supply voltage reaches an adequate level to
guarantee proper operation of the current-sense amplifier. The MAX4172 operates with a 3.0V to 32V supply
voltage.
B. Absolute Maximum Ratings
Item
V+, RS+, RS-, /PG
OUT
Differential Input Voltage, V
RS+
-V
RS
Current into Any Pin
Storage Temp.
Lead Temp. (10 sec.)
Continuous Power Dissipation (TA = +70°C)
8-Lead µMAX
8-Lead NSO
Derate above +70°C
8-Lead µMAX
8-Lead NSO
Rating
-0.3V to +36V
-0.3V to (V+ + 0.3V)
±700mV
±50mA
-65°C to +150°C
+300°C
330mW
471mW
4.10mW/°C
5.88mW/°C
II. Manufacturing Information
A. Description/Function:
B. Process:
C. Number of Device Transistors:
D. Fabrication Location:
E. Assembly Location:
F. Date of Initial Production:
Low-Cost, Precision, High-Side Current-Sense Amplifier
SG3 - Standard 3 micron silicon gate CMOS
177
Oregon, USA
Malaysia, Philippines or Thailand
December, 1996
III. Packaging Information
A. Package Type:
B. Lead Frame:
C. Lead Finish:
D. Die Attach:
E. Bondwire:
F. Mold Material:
G. Assembly Diagram:
H. Flammability Rating:
8 Lead
µMAX
Copper
Solder Plate
Silver-filled Epoxy
Gold (1.3 mil dia.)
Epoxy with silica filler
Buildsheet # 05-3001-0063
Class UL94-V0
8-Lead NSO
Copper
Solder Plate
Silver-filled Epoxy
Gold (1.3 mil dia.)
Epoxy with silica filler
Buildsheet # 05-3001-0062
Class UL94-V0
I. Classification of Moisture Sensitivity
per JEDEC standard JESD22-A112: Level 1
Level 1
IV. Die Information
A. Dimensions:
B. Passivation:
C. Interconnect:
D. Backside Metallization:
E. Minimum Metal Width:
F. Minimum Metal Spacing:
G. Bondpad Dimensions:
H. Isolation Dielectric:
I. Die Separation Method:
84 x 58 mils
Si
3
N
4
/SiO
2
(Silicon nitride/ Silicon dioxide)
Aluminum/Si (Si = 1%)
None
3 microns (as drawn)
3 microns (as drawn)
5 mil. Sq.
SiO
2
Wafer Saw
V. Quality Assurance Information
A. Quality Assurance Contacts: Jim Pedicord (Reliability Lab Manager)
Bryan Preeshl (Executive Director of QA)
Kenneth Huening (Vice President)
B. Outgoing Inspection Level:
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135°C biased (static) life test are shown in
Table 1.
Using these results, the Failure
Rate (λ) is calculated as follows:
λ
=
1
=
MTTF
1.83
(Chi square value for MTTF upper limit)
192 x 4389 x 160 x 2
Temperature Acceleration factor assuming an activation energy of 0.8eV
λ
= 6.79 x 10
-9
λ
= 6.79 F.I.T. (60% confidence level @ 25°C)
This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.
Maxim also performs weekly Burn-In on samples from production to assure reliability of its processes. The
reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates
to 3 failures in an 80 piece sample. Maxim performs failure analysis on rejects from lots exceeding this level. The
Burn-In Schematic 06-5243 shows the static circuit used for this test. Maxim also performs 1000 hour life test
monitors quarterly for each process. This data is published in the Product Reliability Report (RR-1M) located on
the Maxim website at http://www.maxim-ic.com .
B. Moisture Resistance Tests
Maxim evaluates pressure pot stress from every assembly process during qualification of each new design.
Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard 85°C/85%RH or
HAST tests are performed quarterly per device/package family.
C. E.S.D. and Latch-Up Testing
The OP11 die type has been found to have all pins able to withstand a transient pulse of
±400V,
per Mil-
Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device
withstands a current of
±250mA
and/or
±20V.
Table 1
Reliability Evaluation Test Results
MAX4172ExA
TEST ITEM
TEST CONDITION
FAILURE
IDENTIFICATION
PACKAGE
SAMPLE
SIZE
NUMBER OF
FAILURES
Static Life Test
(Note 1)
Ta = 135°C
Biased
Time = 192 hrs.
Moisture Testing
(Note 2)
Pressure Pot
Ta = 121°C
P = 15 psi.
RH= 100%
Time = 168hrs.
Ta = 85°C
RH = 85%
Biased
Time = 1000hrs.
DC Parameters
& functionality
160
0
DC Parameters
& functionality
uMax
NSO
77
77
0
0
85/85
DC Parameters
& functionality
77
0
Mechanical Stress
(Note 2)
Temperature
Cycle
-65°C/150°C
1000 Cycles
Method 1010
DC Parameters
& functionality
77
0
Note 1: Life Test Data may represent plastic D.I.P. qualification lots.
Note 2: Generic Process/Package Data
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