MJD3055 datasheet, PDF - EEWORLD Datasheet

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MJD3055: DescriptionNPN transistor; CategoryDiscrete semiconductor; File Size383KB，1 Pages; ManufacturerJCET; Websitehttp://www.cj-elec.com/; Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

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MJD3055 Overview

NPN transistor

Features

Product Name: NPN Transistor

Product model: MJD3055

Product parameters:

Pcm (maximum power dissipation): 1250mW

Ic (collector current): 10000mA

BVcbo (Collector-Base Breakdown Voltage): 70V

BVceo (Collector-Emitter Breakdown Voltage): 60V

BVebo (emitter-base breakdown voltage): 5V

hFE (current gain): Min: 20, Max: 100

VCE (sat) saturation voltage drop: 8V

fT (transition frequency): 2MHz

Package: TO-251-3L

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JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD

TO-251-3L Plastic-Encapsulate Transistors

MJD3055

FEATURES

Designed for General Purpose Amplifier and Low Speed

Switching

Applications

Electrically Simiar to MJE3055

DC Current Gain Specified to10 Amperes

1.BASE

2.COLLECTOR

3.EMITTER

TRANSISTOR

(NPN)

TO-251-3L

MAXIMUM RATINGS (T

=25℃ unless otherwise noted)

Symbol

CBO

CEO

EBO

stg

Parameter

Collector-Base Voltage

Collector-Emitter Voltage

Emitter-Base Voltage

Collector Current -Continuous

Collector Power Dissipation

Junction Temperature

Storage Temperature

Value

1.25

150

-55-150

Unit

℃

ELECTRICAL CHARACTERISTICS (T

=25℃ unless otherwise specified)

Parameter

Collector-base breakdown voltage

Collector-emitter breakdown voltage

Emitter-base breakdown voltage

Symbol

(BR)CBO

(BR)CEO

(BR)EBO

CBO

Collector cut-off current

CEO

Emitter cut-off current

EBO

FE(1)

DC current gain

FE(2)

CE(sat)(1)

Collector-emitter saturation voltage

CE(sat)(2)

Base-emitter voltage

Transition frequency

=10A, I

=3.3A

=4V, I

=4A

=10V,I

=0.5A,f=500KH

1.8

MHz

=4V,I

=10A

=4A, I

=0.4A

1.1

=30V,I

=5V,I

=4V,I

=4A

0.5

100

µA

Test

conditions

Min

0.02

Typ

Max

Unit

Ic=1mA,I

Ic=200 mA,I

=1mA,I

=70V,I

A,Jun,2011

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