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BC640-16

Description
Transistor
CategoryDiscrete semiconductor    The transistor   
File Size340KB,1 Pages
ManufacturerJCET
Websitehttp://www.cj-elec.com/

Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); ​​QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

 

 

Download Datasheet Parametric View All

BC640-16 Overview

Transistor

BC640-16 Parametric

Parameter NameAttribute value
MakerJCET
package instruction,
Reach Compliance Codeunknown

BC640-16 Preview

Download Datasheet
JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD
TO-92 Plastic-Encapsulate Transistors
BC636,BC638,BC640
FEATURES
High current transistors
MAXIMUM RATINGS (T
a
=25℃ unless otherwise noted)
Symbol
V
CBO
Parameter
Collector-Base Voltage
BC636
BC638
BC640
V
CEO
Collector-Emitter Voltage
BC636
BC638
BC640
V
EBO
I
C
P
C
R
ӨJA
T
j
T
stg
Emitter-Base Voltage
Collector Current -Continuous
Collector Power Dissipation
Thermal Resistance, junction to Ambient
TRANSISTOR (PNP)
TO-92
1.
EMITTER
2.
COLLECTOR
3.
BASE
Value
-45
-60
-100
-45
-60
-80
-5
-1
0.83
150
150
-55-150
Unit
V
V
V
A
W
℃/W
Junction Temperature
Storage Temperature
ELECTRICAL CHARACTERISTICS (T
a
=25℃ unless otherwise specified)
Parameter
Symbol
Test
conditions
BC636
BC638
BC640
I
C
=-1mA,I
B
=0
Collector-emitter breakdown voltage
Emitter-base breakdown voltage
Collector cut-off current
Emitter cut-off current
DC current gain
Collector-emitter saturation voltage
Base-emitter voltage
Transition frequency
V
(BR)CEO
V
(BR)EBO
I
CBO
I
EBO
h
FE(1)
h
FE(2)
h
FE(3)
V
CE(sat)
V
BE
f
T
I
E
=-100μA,I
C
=0
V
CB
=-30V,I
E
=0
V
EB
= -5V,I
C
=0
V
CE
= -2V,I
C
=- 5mA
V
CE
= -2V,I
C
=- 150mA
V
CE
= -2V,I
C
=- 500mA
I
C
=- 500mA,I
B
= -50mA
V
CE
= -2V,I
C
= -500mA
V
CE
= -5V,I
C
=- 50mA,f=100MHz
100
40
63
25
-0.5
-1
V
V
MHz
250
BC636
BC638
BC640
Min
-45
-60
-100
-45
-60
-80
-5
-0.1
- 0.1
V
μA
μA
V
V
Typ
Max
Unit
I
C
=-100μA,I
E
=0
Collector-base breakdown voltage
V
(BR)CBO
CLASSIFICATION OF
Rank
Range
h
FE(2)
BC636-10
63-160
BC636-16, BC638-16, BC640-16
100-250
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