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BC327

Description
PNP transistor
CategoryDiscrete semiconductor   
File Size209KB,2 Pages
ManufacturerJCET
Websitehttp://www.cj-elec.com/

Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); ​​QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

 

 

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BC327 Overview

PNP transistor

Features

Product Name: PNP Transistor


Product model: BC327



Product parameters:


Pcm (maximum power dissipation): 625mW


Ic (collector current): 800mA


BVcbo (Collector-Base Breakdown Voltage): 50V


BVceo (Collector-Emitter Breakdown Voltage): 45V


BVebo (emitter-base breakdown voltage): 5V


hFE (current gain): Min: 100, Max: 630


VCE (sat) saturation voltage drop: 0.7V


fT (transition frequency): 260MHz



Package: TO-92

BC327 Preview

Download Datasheet
JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD
TO-92 Plastic-Encapsulate Transistors
BC327/ BC328
FEATURES
Power dissipation
MAXIMUM RATINGS (T
a
=25℃ unless otherwise noted)
Symbol
V
CBO
V
CEO
V
EBO
I
C
P
C
T
j
T
stg
Parameter
Collector-Base Voltage
Collector-Emitter Voltage
Emitter-Base Voltage
Collector Current -Continuous
Collector Power Dissipation
Junction Temperature
Storage Temperature
BC327
BC328
BC327
BC328
Value
-50
-30
-45
-25
-5
-800
625
150
-55-150
Unit
V
V
V
mA
mW
TRANSISTOR (PNP)
TO-92
1. COLLECTOR
2.BASE
3. EMITTER
ELECTRICAL CHARACTERISTICS (T
a
=25℃ unless otherwise specified)
Parameter
Collector-base breakdown voltage
BC327
BC328
Collector-emitter breakdown voltage
BC327
BC328
Emitter-base breakdown voltage
Collector cut-off current
BC327
BC328
Collector cut-off current
BC327
BC328
Emitter cut-off current
DC current gain
Collector-emitter saturation voltage
Base-emitter saturation voltage
Base-emitter voltage
Transition frequency
Collector Output Capacitance
I
CEO
I
EBO
h
FE(1)
h
FE(2)
V
CE(sat)
V
BE(sat)
V
BE
V
CE
= -40 V , I
B
=0
V
CE
= -20 V , I
B
=0
V
EB
= -4 V ,
V
CE
=-1 V,
V
CE
=-1 V,
I
C
=0
I
C
= -100mA
I
C
= -300mA
100
40
-0.7
-1.2
-1.2
260
12
V
V
V
MHz
pF
-0.2
-0.2
-0.1
630
uA
uA
I
CBO
V
CB
= -45 V , I
E
=0
V
CB
= -25V , I
E
=0
-0.1
-0.1
uA
Symbol
V
CBO
I
C
= -10mA ,
V
CEO
V
EBO
I
E
= -10uA, I
C
=0
I
B
=0
-45
-25
-5
V
V
Test
conditions
Min
-50
-30
Typ
Max
Unit
V
I
C
= -100uA, I
E
=0
I
C
=-500mA, I
B
= -50mA
I
C
= -500mA, I
B
=-50mA
V
CE
=-1 V, I
C
= -300mA
V
CE
= -5V, I
C
= -10mA
f =
100MHz
V
CB
=-10V,I
E
=0
f=1MHZ
f
T
Cob
CLASSIFICATION
OF
h
FE
Rank
Range
16
100-250
25
160-400
40
250-630
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