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BAS20

Description
Reverse recovery time (trr): 50ns DC reverse withstand voltage (Vr): 200V Average rectified current (Io): 200mA Forward voltage drop (Vf): 1.25V @ 200mA 150V, 200mA, trr=50ns, VF=1.25 V@200mA,PD=200mW
CategoryDiscrete semiconductor    diode   
File Size823KB,4 Pages
ManufacturerJCET
Websitehttp://www.cj-elec.com/

Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); ​​QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

 

 

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BAS20 Overview

Reverse recovery time (trr): 50ns DC reverse withstand voltage (Vr): 200V Average rectified current (Io): 200mA Forward voltage drop (Vf): 1.25V @ 200mA 150V, 200mA, trr=50ns, VF=1.25 V@200mA,PD=200mW

BAS20 Parametric

Parameter NameAttribute value
MakerJCET
Reach Compliance Codeunknown

BAS20 Preview

Download Datasheet
JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD
SOT-23 Plastic-Encapsulate Diodes
BAS19/BAS20
SWITCHING DIODE
SOT-23
FEATURE
Fast Switching Speed
Surface Mount Package Ideally Suited for Automatic Insertion
For General Purpose Switching Applications
High Conductance
MARKING:
BAS19:JP
BAS20:JR
JP
JR
Solid dot = Green molding compound device,
if none,the normal device.
JP
JR
MAXIMUM RATINGS (
T
A
=25℃ unless otherwise noted)
Symbol
V
RRM
V
RWM
I
O
I
FSM
P
d
R
θJA
T
J
T
stg
Parameter
Repetitive Peak Reverse Voltage
Working Peak Reverse Voltage
Average Rectified Output Current
Non-Repetitive Peak Forward Surge Current @t=
8.3
ms
Power Dissipation
Thermal Resistance from Junction to Ambient
Junction temperature
Storage Temperature
BAS19
120
100
200
2.5
250
500
150
-55 ~ +150
BAS20
200
150
Unit
V
V
mA
A
mW
℃/W
ELECTRICAL CHARACTERISTICS
(T
A
= 25°C unless otherwise specified
)
Parameter
Reverse breakdown voltage
Reverse current
BAS19
BAS20
BAS19
BAS20
Forward voltage
Diodes capacitance
Reveres recovery time
Symbol
Test
I
R
=100μA
V
R
=100V
V
R
=150V
I
F
=100mA
I
F
=200mA
V
R
=0V, f=1MHz
I
F
=I
R
=30mA,I
rr
=0.1*I
R
Condition
Min
120
200
0.1
1
1.25
5
50
Typ
Max
Unit
V
μA
V
V
pF
ns
V
(BR)
I
R
V
F
C
D
t
rr
www.cj-elec.com
1
C,Mar,2016
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