TLP3547 Evaluation Board Review - Part 1: Unboxing

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TLP3547 Evaluation Board Evaluation Report - Part 1: Unboxing

I received the evaluation board a few days ago and have been busy with work. Today I finally found time to test it. Let's start with the unboxing part. The sample is packaged in a plastic sample box. On the front is the English introduction of the test evaluation board, which mainly introduces some features. In addition, there is a paper document of the Toshiba photorelay evaluation board, including the chip size, the pin definition of the evaluation board, the test voltage and other parameters Close-up of the English introduction on the front of the sample box. Open the sample box, the test evaluation board is wrapped in foam, anyway, it was damaged by collision during transportation, After removing the foam packaging, the true appearance of the evaluation board is revealed. The photorelay package that can pass 5A is very small, similar to the plug-in DIP8 we usually use. The evaluation board prints out the control pins and relay contact pins, and the space between the two pins of the contact is deliberately left larger, which is convenient for wiring testing. The design is very nice. A resistor is soldered on the back. The board was originally a patch board, and later it was probably changed to a plug-in to be compatible with higher voltage control signals, so that the power will be higher. . Comparison between the evaluation board and a 1-yuan coin from the Great China Empire. This makes it more vivid, and shows how small the chip is. . . The evaluation board and the 1-yuan coin are stacked together for comparison. It is just the same size as the 1-yuan coin. In general, judging from the unboxing design and the size of the chip, Toshiba's design is very thoughtful, including the pin processing of the evaluation board, the use of plug-in resistors on the back of the resistors, etc., which shows that it pays great attention to details. Next, we will test the performance. It is estimated that this will not be bad. Look forward to the test article. . .