T497D685M020BT datasheet, PDF - EEWORLD Datasheet

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T497D685M020BT: CategoryPassive components; File Size1MB，19 Pages; ManufacturerKEMET; Websitehttp://www.kemet.com

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T497D685M020BT Parametric

Parameter Name	Attribute value
Product Category	Tantalum Capacitors - Solid SMD
Manufacturer	KEMET
Mfr Case Code	D Case
Product	Tantalum Solid Standard Grade - Other Various
Termination Style	SMD/SMT

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Tantalum Surface Mount Capacitors – High Reliability

T497 Commercial Off-The-Shelf (COTS)

MnO

(CWR09/19/29 Style)

Overview

The KEMET T497 is designed for the COTS (Commercial

Off-The-Shelf) requirements of military, medical, and

aerospace applications. This product is a COTS version

of CWR09,19, and 29 products. The T497 Series is a

surface mount product offering various lead-frame plating

options, Weibull grading options, X-ray inspection, surge

current testing, F-Tech (an improved anode manufacturing

process) and Simulated Breakdown Voltage (SBDV)

screening options to improve long term reliability.

KEMET’s F-Tech eliminates hidden defects in the dielectric,

which continue to grow in the field, causing capacitor

failures. Based on the fundamental understanding of

degradation mechanisms in tantalum and niobium

capacitors, F-Tech incorporates multiple process

methodologies. Some minimize the oxygen and carbon

content in the anodes, which become contaminants

and can lead to the crystallization of the anodic oxide

dielectric. This process methodology reduces the

contaminants, improving quality of the dielectric. An

additional technology provides a stronger mechanical

connection point between the tantalum lead wire and

tantalum anode, enhancing robustness and product

reliability. The benefit of F-Tech is illustrated by a 2,000

hour, 85°C, 1.32 X rated voltage accelerated life test. The

F-Tech parts see no degradation while standard tantalums

have 1.5 orders of magnitude degradation in leakage

current. F-Tech is currently available for T493 (select D

and X case capacitance values in 25 V and higher rated

voltage) and T497 (select H case capacitance values in

25 V and higher rated voltage). Please contact KEMET for

details on ordering other part types with these capabilities.

KEMET’s patented Simulated Breakdown Screening (SBDS)

is a nondestructive testing technique that simulates the

breakdown voltage (BDV) of a capacitor without damage to

its dielectric or to the general population of capacitors. This

screening identifies hidden defects in the dielectric, providing

the highest level of dielectric testing. SBDS is based on the

simulation of breakdown voltage (BDV), the ultimate test of

the dielectric in a capacitor.

Low BDV indicates defects in the dielectric, and therefore, a

higher probability of failure in the field. High BDV indicates

a stronger dielectric and high-reliability performance in the

field. This new screening method allows KEMET to identify

the breakdown voltage of each individual capacitor and

provides only the strongest capacitors from each lot.

SBDS is currently available on select part types in the T493

and T497 series. Please contact KEMET for details on

ordering other part types with these capabilities.

KEMET offers these technologies per the following options:

• F-Tech only

• SBDS only

• Combination of both F-Tech and SBDS for the ultimate

protection

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One world. One KEMET

T2011_T497 • 7/25/2017

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